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Patent # Description
2011/0298533 SEMICONDUCTOR DEVICE HAVING A BIAS RESISTOR CIRCUIT
According to one embodiment, a semiconductor device provided with an input terminal and a resistor circuit is presented. The resistor circuit is provided with...
2011/0298532 INTEGRATED CIRCUIT, INTEGRATED CIRCUIT DESIGN DEVICE AND INTEGRATED CIRCUIT DESIGN METHOD
The disclosed integrated circuit includes a first and a second power supply wirings, a flip-flop circuit, and a switch element. The first and the second power...
2011/0298531 CHARGE STORAGE CIRCUIT FOR A PIXEL, AND A DISPLAY
A charge storage circuit for a pixel comprises a charge storage node. First and second series-connected transistors (8,10) are provided for selectively...
2011/0298530 REMOTE TESTING SYSTEM
An apparatus is provided that comprises a test circuit; a first receiver unit arranged to receive test commands and to provide the test commands to the test...
2011/0298529 Temperature independent reference circuit
A temperature independent reference circuit includes first and second bipolar transistors with commonly coupled bases. First and second resistors are coupled in...
2011/0298528 POWER SEMICONDUCTOR SYSTEM
According to one embodiment, a power semiconductor system includes; a first power semiconductor element, a driver IC, a first temperature detection element, a...
2011/0298527 REAL TIME DYNAMIC OPTIMIZATION OF DEADTIME
A deadtime optimization apparatus and method may determine when it is safe to turn a switch ON, eliminating the need to have a switch controller purposely...
2011/0298526 APPARATUS AND METHOD FOR DISABLING WELL BIAS
Apparatuses and methods for disabling well bias are disclosed. In one embodiment, an apparatus includes a complimentary metal oxide semiconductor (CMOS) switch...
2011/0298525 High-Speed Current Switching
A method and circuit for high-speed current switching includes altering the operating voltage of the Current Source using a resistor in non-transmission mode,...
2011/0298524 POWER SWITCH CIRCUIT
A power switch circuit providing voltage to an output port is provided. The switch circuit includes a single power supply, a switch unit, a controlling unit,...
2011/0298523 APPARATUS AND METHOD FOR WELL BUFFERING
Apparatuses and methods for well buffering are disclosed. In one embodiment, an apparatus includes a complimentary metal oxide semiconductor (CMOS) switch...
2011/0298522 OUTPUT APPARATUS AND TEST APPARATUS
Provided is an output apparatus that outputs an output signal corresponding to an input signal, comprising a plurality of drivers that each output an...
2011/0298521 POLYPHASE HARMONIC REJECTION MIXER
A polyphase harmonic rejection mixer, comprising a plurality of stages following each other; wherein a first stage is arranged to perform at least frequency...
2011/0298520 INTEGRATOR CIRCUIT WITH MULTIPLE TIME WINDOW FUNCTIONS
An integrator circuit with multiple time window functions for carrying out a plurality of integration operations in parallel, each integration operation being...
2011/0298519 LEVEL SHIFTER
The present invention provides a level shifter. In an embodiment, the level shifter includes first to sixth transistors. The first and second transistors have...
2011/0298518 PHASE INTERPOLATION CIRCUIT SUITABLE FOR WIDE RANGE FREQUENCY INPUT AND OUTPUT CHARACTERISTICS STABILIZING...
A phase interpolation circuit includes a waveform shaping unit and a phase interpolator. The waveform shaping unit adaptively waveform-shapes first or second...
2011/0298517 Master-slave flip-flop circuit
A master-slave flip-flop circuit comprises a master stage for retaining a master signal, a slave stage for retaining a slave signal and a retention stage....
2011/0298516 Clock state independent retention master-slave flip-flop
A master-slave flip-flop circuit is provided with a retention capability to support operation in both a normal mode and a retention mode. During the retention...
2011/0298515 SYSTEM RESET CIRCUIT AND METHOD
A system reset circuit and a method for resetting a system automatically according to an operation state of the system are provided. The system reset circuit...
2011/0298514 PWM SIGNAL GENERATOR FOR DIGITAL CONTROLLED POWER SUPPLY
A forward converter circuit includes a transformer having a primary winding and a secondary winding. A first transistor is coupled in series with the primary...
2011/0298513 DUTY CORRECTING CIRCUIT, DELAY-LOCKED LOOP CIRCUIT AND METHOD OF CORRECTING DUTY
The duty correcting circuit includes a duty cycle corrector, a duty detector and a duty correction code generator. The duty cycle corrector corrects a duty...
2011/0298512 CIRCUIT, SYSTEM AND METHOD FOR CONTROLLING READ LATENCY
A read latency control circuit is described having a clock synchronization circuit and a read latency control circuit. The clock synchronization circuit...
2011/0298511 STROBE SIGNAL MANAGEMENT TO CLOCK DATA INTO A SYSTEM
A method of communicating with a source synchronous device can include determining an expected number of pulses of a strobe signal to be received in response to...
2011/0298510 VOLTAGE-CONTROLLED DELAY LINES, DELAY-LOCKED LOOP CIRCUITS INCLUDING THE VOLTAGE-CONTROLLED DELAY LINES, AND...
A delay-locked loop circuit includes a voltage-controlled delay line configured to generate a plurality of delayed clock signals based on an input clock signal,...
2011/0298509 TIME-SHARED LATENCY LOCKED LOOP CIRCUIT FOR DRIVING A BUFFER CIRCUIT
In an embodiment, a device includes a buffer circuit with first and second buffer outputs and a latency locked loop (LLL) circuit. The LLL circuit includes...
2011/0298508 DATA INTERFACE WITH DELAY LOCKED LOOP FOR HIGH SPEED DIGITAL TO ANALOG CONVERTERS AND ANALOG TO DIGITAL CONVERTERS
A system comprises a first circuit includes a data transmitter circuit that transmits digital data based on a first clock signal. A sync generator outputs a...
2011/0298507 SYSTEM AND METHOD FOR CALIBRATING OUTPUT FREQUENCY IN PHASE LOCKED LOOP
A Digital Calibration System for a Phase Locked Loop includes a Tuning Voltage Controller configured to set the tuning voltage to a value; a Phase Difference...
2011/0298506 INTEGRATED CIRCUIT COMPRISING FREQUENCY GENERATION CIRCUITRY FOR CONTROLLING A FREQUENCY SOURCE
An integrated circuit comprises frequency generation circuitry for controlling a frequency source for use in an automotive radar system. The frequency...
2011/0298505 LATENCY LOCKED LOOP CIRCUIT FOR DRIVING A BUFFER CIRCUIT
In an embodiment, a circuit includes a buffer circuit including a buffer input and an output terminal and a latency locked loop (LLL) circuit. The LLL circuit...
2011/0298504 CLOCK GENERATOR AND METHODS USING CLOSED LOOP DUTY CYCLE CORRECTION
Closed-loop duty-cycle correctors (DCCs), clock generators, memory devices, systems, and methods for generating an output clock signal having a particular duty...
2011/0298503 Dynamic voltage-controlled oscillator calibration and selection
A method and apparatus is disclosed for voltage-controlled oscillator selection in a multi-mode system having multiple voltage-controlled oscillators. Part of...
2011/0298502 Switching Clock Sources
A clock-switching circuit having at least two inputs for receiving at least two different clock sources, an output for providing a selected one of the clock...
2011/0298501 Methods and Apparatuses for Delay-Locked Loops and Phase-Locked Loops
A low power delay-locked loop (DLL) is presented. In one embodiment, the DLL includes a phase detector which includes a reference input and a feedback input to...
2011/0298500 SINGLE CLOCK DYNAMIC COMPARE CIRCUIT
A compare circuit for comparing a first data word with a second data word includes a plurality of sub-circuits, each having a two-bit static compare stage and a...
2011/0298499 INTERNAL VOLTAGE GENERATOR AND INTEGRATED CIRCUIT DEVICE INCLUDING THE SAME
An internal voltage generator includes a comparison unit, a driving circuit and a bias unit. The comparison unit compares a reference voltage and an internal...
2011/0298498 CORNER DETECTOR
A corner detector comprises a PMOS threshold voltage detector and an NMOS threshold voltage detector, the PMOS threshold voltage detector is composed of a first...
2011/0298497 COMPARATOR CIRCUIT
A comparator circuit can achieve a reduction in current consumption with a simple configuration, and can suppress an increase in current consumption...
2011/0298496 SRAM SENSE AMPLIIFER
A sense amplifier for use in a memory array having a plurality of memory cells is provided. The sense amplifier provides low power dissipation, rapid sensing...
2011/0298495 ONE PHASE LOGIC
Circuits comprising asynchronous linear pipelines and one-phase pipelines, and methods of forming asynchronous linear pipeline circuits and converting them to...
2011/0298494 METHODS, DEVICES, AND SYSTEMS FOR A HIGH VOLTAGE TOLERANT BUFFER
Methods, devices, and systems are disclosed, including those for a buffer having pre-driver circuitry that provide voltages to thin-gate dielectric transistors....
2011/0298493 VOLTAGE LEVEL SHIFT CIRCUIT AND SEMICONDUCTOR DEVICE
A voltage level shift circuit in which a difference in response characteristic depending on the signal level of an input signal is suppressed. The voltage level...
2011/0298492 Adjustable Interface Buffer Circuit Between A Programmable Logic Device And A Dedicated Device
An integrated circuit includes a programmable logic device, a dedicated device, and an interface circuit between the two. The interface circuit can be easily...
2011/0298491 Dual-Edge Register and the Monitoring Thereof on the Basis of a Clock
Sequential electronic circuit (10) reacting on a rising edge and a falling edge of a clock signal (CK), comprising a first (1) and a second (2) D-type...
2011/0298490 ASYMMETRICAL AGING CONTROL SYSTEM
An asymmetrical aging control system is described. This system actively varies associated dedicated circuits in a manner that minimizes power consumption, while...
2011/0298489 ANALOG PROCESSOR COMPRISING QUANTUM DEVICES
Analog processors for solving various computational problems are provided. Such analog processors comprise a plurality of quantum devices, arranged in a...
2011/0298488 THROUGH CARRIER DUAL SIDE LOOP-BACK TESTING OF TSV DIE AFTER DIE ATTACH TO SUBSTRATE
A method of testing electronic assemblies including singulated TSV die attached to a ML package substrate, on a substrate carrier. The substrate carrier...
2011/0298487 SEMICONDUCTOR TESTING APPARATUS AND TESTING METHOD
An apparatus for testing electric characteristics of a semiconductor device having a plurality of hemispherical electrode terminals on one surface thereof,...
2011/0298486 Parking Structure Memory-Module Tester that Moves Test Motherboards Along a Highway for Remote Loading/Unloading
A parking-structure test system has motherboards that test memory modules. The motherboards are not stationary but are placed inside movable trays that move...
2011/0298485 SEMICONDUCTOR DEVICE TEST METHOD AND APPARATUS, AND SEMICONDUCTOR DEVICE
A method of testing a semiconductor device includes a conductive foreign matter test step of measuring the resistance value between the first and second...
2011/0298484 ELECTRONIC CIRCUIT AND ELECTRONIC DEVICE
An electronic circuit of at least one embodiment of the present invention includes: a plurality of electronic parts, of the plurality of electronic parts, at...
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