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Patent # Description
2016/0124059 SUBJECT-LOADED HELICAL-ANTENNA RADIO-FREQUENCY COIL FOR MAGNETIC RESONANCE IMAGING
Example devices and methods of MRI scanning are disclosed herein. In an example, an MRI scanning system may include a structure defining a bore within which a...
2016/0124058 RF ASSEMBLY FOR AN MRD DEVICE COMPRISING A SURFACE AND A VOLUME COIL
A magnetic resonance imaging device (MRD) comprising an RF assembly which has both a volume coil and a surface coil. The coils are simultaneously operable, so...
2016/0124057 MAGNETIC DETECTOR
A probe for detecting magnetic particles. In one embodiment, the probe includes: a cylindrical probe core having a first end and a second end, the cylindrical...
2016/0124056 SENSING DEVICE AND METHOD FOR MANUFACTURING SENSING DEVICE
A sensor module includes a magnetic field sensor that includes a sensor main body including a magnetic field sensing element and a plurality of lead wires led...
2016/0124055 BIAS CIRCUIT FOR STACKED HALL DEVICES
Embodiments relate to stacks of Hall effect structures, in which the potential at the contacts of each Hall effect structure throughout a stack of Hall effect...
2016/0124054 Magnetic Field Sensor and Electronic Circuit That Pass Amplifier Current Through a Magnetoresistance Element
Electronic circuits used in magnetic field sensors use transistors for passing a current through the transistors and also through a magnetoresistance element.
2016/0124053 BATTERY DEGRADATION DETECTION DEVICE
Provided is a battery degradation detection device that detects the degradation state of a battery installed on a vehicle. The battery degradation detection...
2016/0124052 BATTERY SYSTEM PACK LIFE ESTIMATION SYSTEMS AND METHODS
System and methods for estimating a life of a battery pack are presented. In certain embodiments, a method for estimating a life of a battery pack may include...
2016/0124051 BATTERY FUEL GAUGE
A system includes a battery; an analog-to-digital converter coupled to the battery and capable of measuring an output voltage of the battery; a processor,...
2016/0124050 STORAGE BATTERY TYPE VEHICLE, CHARGE MANAGEMENT SYSTEM, AND CHARGE MANAGEMENT METHOD
A storage battery type vehicle configured to charge a storage battery mounted on a vehicle via a charging cable connecting the vehicle to a stationary battery...
2016/0124049 SYSTEM AND METHOD OF ELECTRIC MOTOR FAULT DETECTION
A system for detecting faults in a motor includes a drive circuit, a detection circuit, and a controller. The drive circuit is configured to apply a drive...
2016/0124048 PORTABLE DIAGNOSTIC APPARATUS FOR TESTING CIRCUIT BREAKERS
A portable diagnostic apparatus for performing diagnostic testing on a circuit breaker includes a number of sensor devices structured to generate a number of...
2016/0124047 INTELLIGENT CALIBRATION SYSTEM FOR BACKUP-POWER AUTOMATIC SWITCHING DEVICE
The present invention provides an intelligent calibration system for backup-power automatic switching devices, including a power supply module, a control...
2016/0124046 METHOD FOR DETECTING INTERLOCK FAILURE OF CONNECTOR IN ECO-FRIENDLY VECHICLE
A method includes: detecting, by a motor controller, an interlock failure of a connector for connecting between a gate driver and the motor controller, the...
2016/0124045 MEASUREMENTS CIRCUITRY AND METHOD FOR GENERATING AN OSCILLATING OUTPUT SIGNAL USED TO DERIVE TIMING INFORMATION
A measurement circuit and method is provided for generating an oscillating output signal used to derive timing information. The measurement circuit includes a...
2016/0124044 FAILURE DIAGNOSIS SYSTEM, FAILURE DIAGNOSIS METHOD, AND FAILURE DIAGNOSIS PROGRAM
This present invention is to obtain the appropriate number of fails by optimizing test conditions for a delay failure diagnosis. In a failure diagnosis system...
2016/0124043 CIRCUIT TECHNIQUES FOR EFFICIENT SCAN HOLD PATH DESIGN
In one embodiment, a method for signal delay in a scan path comprises, in a scan mode, delaying a scan signal in the scan path by propagating the scan signal...
2016/0124042 ADAPTOR STRUCTURE AND APPARATUS FOR TESTING A SEMICONDUCTOR PACKAGE INCLUDING THE SAME
An adaptor structure includes a main adaptor, a first sub-adaptor, a second sub-adaptor and a first driving mechanism. The main adaptor is over a socket. The...
2016/0124041 ULTRA-SENSITIVE, ULTRA-LOW POWER RF FIELD SENSOR
A sensor includes a hollow enclosure, an antenna disposed external to the hollow enclosure and configured to collect emission of electromagnetic energy, a...
2016/0124040 DEVICE AND METHOD FOR MONITORING A POWER SEMICONDUCTOR SWITCH
A device for monitoring a power semiconductor switch includes a circuit section for applying to the power semiconductor switch an HF voltage having a frequency...
2016/0124039 Edge Damage Inspection
A power semiconductor device includes a semiconductor body. The semiconductor body includes an active semiconductor region and a perimeter semiconductor region...
2016/0124038 LEAKAGE CURRENT CALCULATION DEVICE AND METHOD FOR CALCULATING LEAKAGE CURRENT
Provided is a leakage current calculation device capable of calculating an accurate leakage current value in which the effect of noise has been suppressed. The...
2016/0124037 SHORT-CIRCUIT DETECTION CIRCUITS, SYSTEM, AND METHOD
Systems, circuits, and methods for detecting short circuit events during operation of an Insulated-Gate Bipolar Transistor (IGBT) from are provided. A...
2016/0124036 Real-Time Insulation Detector for Feeding High-Frequency Low-Voltage Signal of Power System
A real-time insulation detector for feeding a high-frequency low-voltage signal is electrically connected with a power system, and the power system includes a...
2016/0124035 CONDUCTOR ASSEMBLY
Conductor assembly (1) for a power network, comprising an inner conductor (5), an insulating layer (10) arranged concentrically around the inner conductor (5),...
2016/0124034 ACTIVE CABLE TESTING
Embodiments of the present disclosure provide configurations for testing arrangements for testing multi-lane active cables. In one embodiment, a testing...
2016/0124033 ELECTRICAL DRAIN TEST SYSTEM AND METHOD
Electrical drain test systems and methods are disclosed. An example electrical drain test device includes a battery interface design with electrical cables to...
2016/0124032 DATA MEASUREMENTS AND METHODS
Systems and methods of measuring and determining noise parameters. An exemplary method measures noise data and determines element values of a device noise...
2016/0124031 SMART MULTI-PURPOSE MONITORING SYSTEM USING WAVELET DESIGN AND MACHINE LEARNING FOR SMART GRID APPLICATIONS
A new voltage-based index is formulated in the time-frequency domain (using wavelets) and the energy of the wavelet coefficients associated with the change in...
2016/0124030 HIGH-CURRENT SENSING SCHEME USING DRAIN-SOURCE VOLTAGE
In one embodiment, a method for measuring current is described herein. The method comprises shorting first and second inputs of an amplifying circuit to...
2016/0124029 DETECTION CIRCUIT FOR AN ACTIVE DISCHARGE CIRCUIT OF AN X-CAPACITOR, RELATED ACTIVE DISCHARGE CIRCUIT,...
An active discharge circuit discharges an X. The detection circuit includes a sensor circuit that generates a sensor signal indicative of an AC oscillation...
2016/0124028 METHOD FOR CHECKING THE ABSENCE OF VOLTAGE ON A POWER ELECTRONIC COMPONENT OF A MOTOR VEHICLE
A method is disclosed for checking the absence of voltage on a power electronic component connected to a high-voltage battery and to an electrical machine in a...
2016/0124027 HIGH SPEED TRACKING DUAL DIRECTION CURRENT SENSE SYSTEM
A tracking current sense system is described that includes a first current tracking system, a second current tracking system, and a pre-biasing device. The...
2016/0124026 ASSESSMENT AND CALIBRATION OF A HIGH ENERGY BEAM
A high energy beam verification, calibration, and profiling system includes a conductive base plate, supports extending from the base plate, a plurality of...
2016/0124025 CURRENT SENSOR ARRANGEMENT WITH MEASURING COILS
The invention relates to a current sensor arrangement having a measuring inductance (103), said measuring inductance having the following characteristics: a...
2016/0124024 SELF-CORRECTING CURRENT TRANSFORMER SYSTEM
A self-correcting current transformer 100 combines a current transformer 113 and self-calibration electronics 115 into one device. The current transformer has...
2016/0124023 SHUNT RESISTANCE TYPE CURRENT SENSOR
A shunt resistance type current sensor includes a bus bar, a circuit board, voltage detection terminals and a voltage detector for detecting a magnitude of...
2016/0124022 SIGNAL PROCESSING SYSTEM, SIGNAL PROCESSING METHOD, AND SIGNAL PROCESSING PROGRAM
A signal processing system includes a data detection part that detects analog data of a current and a voltage supplied to a plurality of electrical devices, a...
2016/0124021 Reduced Cost Package Device Simulator, Manufacturing Method and Method of Use
An improved package device simulator for the testing of testing sockets, the package device simulator being formed of a first layer of non-conductive rigid...
2016/0124020 SEMICONDUCTOR TESTING FIXTURE AND FABRICATION METHOD THEREOF
A semiconductor testing fixture is provided. The semiconductor testing fixture comprises a substrate having a surface; a plurality of testing probes formed on...
2016/0124019 SEMICONDUCTOR TESTING FIXTURE AND FABRICATION METHOD THEREOF
A semiconductor testing fixture is provided. The semiconductor testing fixture includes a substrate having a plurality of testing regions; and a plurality of...
2016/0124018 TESTING PROBE, SEMICONDUCTOR TESTING FIXTURE AND FABRICATION METHOD THEREOF
A testing probe is provided. The testing probe includes a first testing tip; an insulation layer formed on a side surface of the first testing tip; and a...
2016/0124017 TESTING PROBE AND SEMICONDUCTOR TESTING FIXTURE, AND FABRICATION METHODS THEREOF
Testing probe and semiconductor testing fixture, and their fabrication methods are provided. A plurality of first testing pins is formed on the substrate, each...
2016/0124016 TESTING PROBE AND SEMICONDUCTOR TESTING FIXTURE, AND FABRICATION METHODS THEREOF
Testing probe and semiconductor testing fixture, and their fabrication methods are provided. A testing probe may configure a chamber through an insulating...
2016/0124015 SOLDERLESS PIM TEST FIXTURE
A solderless test fixture, including a conductive base, a clamp, and a connector is described. The conductive base has at least one cable groove with a cable...
2016/0124014 Force Detection for Microscopy Based on Direct Tip Trajectory Observation
With example embodiments described herein, a probe tip of a scanning probe microscope (such as an atomic force microscope (AFM)) is directly detected as it...
2016/0124013 ACCELEROMETER
An accelerometer device (100) comprises a former (118) and an optical fiber (120) wound around the former. The winding of optical fiber (120) has a sensing...
2016/0124012 ACCELERATION SENSOR
An acceleration sensor includes an outer frame body, a heating element, a first temperature sensing element for temperature measurement and a second...
2016/0124011 method for determining an average segment time of an encoder wheel of an internal combustion engine
A method for determining an average segment time of an encoder wheel of an internal combustion engine, the encoder wheel being connected in rotationally fixed...
2016/0124010 AUTOMATIC ANALYZER
An automatic analyzer with high processing capacity is capable of immediately measuring an emergency specimen rack. The automatic analyzer includes a conveying...
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