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Patent # Description
2016/0181094 Focused Radiation Beam Induced Thin Film Deposition
A method of depositing a material on a surface is disclosed. The method includes focusing a radiation beam on the surface and introducing a precursor gas near...
2016/0181093 III-N EPITAXY ON MULTILAYER BUFFER WITH PROTECTIVE TOP LAYER
A method of growing III-N material on a silicon substrate including the steps of epitaxially growing a buffer layer of REO material on a silicon substrate,...
2016/0181092 NITRIDE SPACER FOR PROTECTING A FIN-SHAPED FIELD EFFECT TRANSISTOR (FINFET) DEVICE
Approaches for protecting a semiconductor device (e.g., a fin field effect transistor device (FinFET)) using a nitride spacer are provided. Specifically, a...
2016/0181091 Methods for Forming Ferroelectric Phases in Materials and Devices Utilizing the Same
Embodiments provided herein describe systems and methods for forming ferroelectric materials. A trench body may be provided. A trench may be formed in the...
2016/0181090 Decreasing the Critical Dimensions in Integrated Circuits
A method for lithographic patterning of a substrate is described. The method comprises obtaining a substrate to be patterned. It further comprises subsequently...
2016/0181089 FCVD LINE BENDING RESOLUTION BY DEPOSITION MODULATION
A method of reducing line bending and surface roughness of a substrate with pillars includes forming a treated surface by treating a pillar-containing...
2016/0181088 PROCESS KIT FOR A HIGH THROUGHPUT PROCESSING CHAMBER
A processing chamber for processing a substrate is disclosed herein. In one embodiment, the processing chamber includes a liner assembly disposed within an...
2016/0181087 Particle removal with minimal etching of silicon-germanium
Particle-clean formulations and methods for semiconductor substrates use aqueous solutions of tetraethylammonium hydroxide ("TEAH," C.sub.8H.sub.21NO) with or...
2016/0181086 SYSTEMS AND METHODS FOR RINSING AND DRYING SUBSTRATES
In some embodiments, a system is provided that includes (1) a loading position; (2) a drying position; (3) a movable tank configured to (a) hold at least one...
2016/0181085 INTEGRATION OF III-V DEVICES ON SI WAFERS
An insulating layer is conformally deposited on a plurality of mesa structures in a trench on a substrate. The insulating layer fills a space outside the mesa...
2016/0181084 Varying Frequency during a Quadrupole Scan for Improved Resolution and Mass Range
Techniques are provided for scanning frequency and voltages of a multipole mass filter while maintaining substantially the same number of AC cycles per mass...
2016/0181083 ICR Cell Operating with a Duplexer
An ICR cell (01) operates with a duplexer (08), which is an integral part of a transmission and receiving device (09) of an FT-ICR mass spectrometry device....
2016/0181082 Enhanced Spray Formation for Liquid Samples
Methods and systems for generating ions from a liquid sample for mass spectrometry are provided herein. In various aspects, the methods and systems can enhance...
2016/0181081 MULTI-ELEMENT ISOTOPIC MEASUREMENT BY DIRECT COUPLING OF A MULTI-CYCLE ISOTACHOPHORESIS TECHNIQUE AND A MASS...
A method for separating electrically charged species contained in a solution by an isotachophoresis method applied in an electrophoresis device, the...
2016/0181080 MULTIPOLE ION GUIDES UTILIZING SEGMENTED AND HELICAL ELECTRODES, AND RELATED SYSTEMS AND METHODS
An ion guide generates a multipole radio frequency (RF) field to radially confine ions to an ion beam along a guide axis as the ions are transmitted through...
2016/0181079 MASS SPECTROMETER INLET WITH REDUCED AVERAGE FLOW
An interface configured to transfer ions produced at or near atmospheric pressure conditions into a mass spectrometer for mass analysis is provided. The...
2016/0181078 Bubble Removal from Liquid Flow into a Mass Spectrometer Source
Methods and systems for delivering a liquid sample to an ion source are provided herein. In various aspects, the methods and systems can improve the stability...
2016/0181077 SAMPLE QUANTITATION WITH A MINIATURE MASS SPECTROMETER
The invention generally relates to sample analysis with a miniature mass spectrometer. In certain embodiments, the invention provides methods that involve...
2016/0181076 Tuning a Mass Spectrometer Using Optimization
Systems, methods, and apparatuses are provided for tuning a mass spectrometer. An optimization process can be performed to determine optimal parameters for...
2016/0181075 Two-Dimensional Separation and Imaging Technique for the Rapid Analysis of Biological Samples
A method of ion mapping is disclosed comprising depositing a sample onto a target surface and separating the sample on the target surface according to a first...
2016/0181074 CHARGE REMOVAL FROM ELECTRODES IN UNIPOLAR SPUTTERING SYSTEM
This disclosure describes a non-dissipative snubber circuit configured to boost a voltage applied to a load after the load's impedance rises rapidly. The...
2016/0181073 Low Contamination Chamber for Surface Activation
An embodiment low contamination chamber includes a gas inlet, an adjustable top electrode, and an adjustable bottom electrode. The low contamination chamber is...
2016/0181072 PLASMA GENERATING DEVICE WITH MOVING CAROUSEL AND METHOD OF USE
One possible embodiment of the invention could be a plasma reactor chamber and method of operating same wherein the plasma reactor chamber comprises a set of...
2016/0181071 GAS SUPPLY SYSTEM
A gas supply system is provided. The system includes a plurality of component gas supply pipes, a plurality of flow rate control mechanisms for controlling...
2016/0181070 DEVICE FOR ION IMPLANTATION
In an ion implantation device and a method for the ion implantation of a substrate, plasma having an ion density of at least 10.sup.10 cm.sup.-3, is generated...
2016/0181069 System and Method for Plasma Treatment Using Directional Dielectric Barrier Discharge Energy System
A system including a directional dielectric barrier discharge (DBD) energy system, including a first electrode assembly configured to generate energy,...
2016/0181068 RADICAL GENERATOR AND MOLECULAR BEAM EPITAXY APPARATUS
[Object] To provide a radical generator which can produce radicals at higher density. [Means for Solution] The radical generator includes a supply tube 10 made ...
2016/0181067 DYNAMIC ION RADICAL SIEVE AND ION RADICAL APERTURE FOR AN INDUCTIVELY COUPLED PLASMA (ICP) REACTOR
Embodiments described herein provide apparatus and methods of etching a substrate using an ion etch chamber having a movable aperture. The ion etch chamber has...
2016/0181066 LAMINATED MATERIALS, METHODS AND APPARATUS FOR MAKING SAME, AND USES THEREOF
Systems and methods using PVD for producing materials, for example nitrides, are disclosed. The present application also relates to use of the materials for...
2016/0181065 CHARGED PARTICLE BEAM DRAWING APPARATUS AND CHARGED PARTICLE BEAM DRAWING METHOD
A charged particle beam drawing apparatus has a drawing unit including a charged particle source, a deflector and a stage on which a target object is placed,...
2016/0181063 COMPACT, CONFIGURABLE POWER SUPPLY FOR ENERGIZING OZONE-PRODUCING CELLS
Improvements in the supply of high-frequency electrical power to ozone-producing cells can be accomplished using the systems and techniques described herein....
2016/0181062 MULTI CHARGED PARTICLE BEAM WRITING APPARATUS, AND MULTI CHARGED PARTICLE BEAM WRITING METHOD
A multi charged particle beam writing apparatus includes a modulation rate data calculation processing circuitry to calculate, for each pixel being a unit...
2016/0181061 IMAGE CREATING METHOD AND IMAGING SYSTEM FOR PERFORMING THE SAME
A spatial image having 2D spatial information is obtained from a surface of a sample by an image creating method. The surface of the sample is milled to obtain...
2016/0181060 FIDUCIAL-BASED CORRELATIVE MICROSCOPY
A method is provided for preparing a sample for correlative optical and electron imaging and correcting aberrations in the imaging process due to sample...
2016/0181059 SPECIMEN HOLDER FOR A CHARGED PARTICLE MICROSCOPE
A specimen holder for a Charged Particle Microscope, comprising: A support structure; An elongated member, a first end of which is connected to said support...
2016/0181058 METHOD FOR PROCESSING AND/OR FOR OBSERVING AN OBJECT, AND PARTICLE BEAM DEVICE FOR CARRYING OUT THE METHOD
A method is provided for processing and/or observing an object using at least one particle beam that is scanned over the object. A scan region on the object is...
2016/0181057 HIGH RESOLUTION CHARGED PARTICLE BEAM DEVICE AND METHOD OF OPERATING THE SAME
A charged particle beam device is provided which includes a primary beam source device adapted for generating a primary charged particle beam, a mirror...
2016/0181056 ELECTRON BEAM WINDOW TILE HAVING NON-UNIFORM CROSS-SECTIONS TECHNICAL FIELD
Window tiles for electron beam systems are provided. The window tiles can comprise a first surface and a second surface, and one or more features extending...
2016/0181055 Method of Adjusting a Stigmator in a Particle Beam Apparatus and a Particle Beam System
A method of adjusting a stigmator in a particle beam apparatus comprises directing a particle beam onto a sample wherein the particle beam traverses a...
2016/0181054 OBJECTIVE LENS ARRANGEMENT USABLE IN PARTICLE-OPTICAL SYSTEMS
An objective lens arrangement includes a first, second and third pole pieces, each being substantially rotationally symmetric. The first, second and third pole...
2016/0181053 X-RAY IMAGING SYSTEMS AND DEVICES
An x-ray imaging system, such as a mobile radiography unit, includes a plurality of stationary carbon nanotube based x-ray sources to be selectively energized....
2016/0181052 DEVICE FOR PRODUCING AN ELECTRON BEAM
A device for the production of an electron beam with high surface strengths. The device has a cathode component with a convex cathode face with a predetermined...
2016/0181051 Nanoparticle-Templated Lithographic Patterning of Nanoscale Electronic Components
Some embodiments of vacuum electronics call for nanoscale field-enhancing geometries. Methods and apparatus for using nanoparticles to fabricate nanoscale...
2016/0181050 INTEGRATED PHOTOEMISSION SOURCES AND SCALABLE PHOTOEMISSION STRUCTURES
A scalable, integrated multi-level photoemitter device of tapered design and method of manufacture using conventional CMOS manufacturing techniques. The...
2016/0181049 ELECTROMAGNETIC ACTUATOR AND METHOD OF USE
An electromagnetic actuator includes a plunger, an armature, and a coil. The plunger is moveable between a first position and a second position. The armature...
2016/0181048 BREAK AWAY DOOR, TRIP UNIT AND CIRCUIT BREAKER ASSEMBLY INCLUDING SAME
A hinge assembly includes a first portion having first and second receptacles and a second portion having first and second cylindrical members extending in...
2016/0181047 GROUND FAULT CIRCUIT INTERRUPTER (GFCI) SYSTEM AND METHOD
A wiring device including a face contact; one or more line contact arms; one or more load contact arms; and a fault detection circuit. The one or more line...
2016/0181046 MOLDED CASE CIRCUIT BREAKERS WITH RECESSED SWITCHES
Molded case circuit breakers (MCCBs) have an MCCB body with at least one switch printed circuit board (PCB) holding between 1-4 recessed switches. The switch...
2016/0181045 CIRCUIT BREAKERS WITH COMMON TRIP CAMS AND RELATED TRIP CAMS
Circuit breakers with handles have common trip cams with an integrated spring and trip cam base. The integrated spring directly contacts the armature in lieu...
2016/0181044 CONTACT ARMS FOR USE IN ELECTRICAL SWITCHGEAR AND METHODS OF FABRICATING SAME
A contact arm for use in a circuit breaker is provided. The contact arm includes a tubular body that includes a conductive tube and defines a central...
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