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Patent # Description
2016/0216327 FLEXIBLE INTERFACE
A system and method are provided on one or more companion chips having a plurality of cores. Each core has core circuitry and a test interface for carrying out...
2016/0216326 SEMICONDUCTOR APPARATUS AND METHOD OF OPERATING THE SAME
A semiconductor apparatus includes a debugging processor that performs a debugging operation related to at least one selected intellectual property (IP) block...
2016/0216325 TEST MODE CIRCUIT AND SEMICONDUCTOR DEVICE INCLUDING THE SAME
A test mode circuit of a semiconductor device includes a test mode activating signal generation unit suitable for generating a test mode activating signal in...
2016/0216324 IMPLEMENTING ENHANCED SCAN CHAIN DIAGNOSTICS VIA BYPASS MULTIPLEXING STRUCTURE
A method and system for implementing enhanced scan chain diagnostics via a bypass multiplexing structure. A full scan chain structure is partitioned into a...
2016/0216323 IMPLEMENTING ENHANCED SCAN CHAIN DIAGNOSTICS VIA BYPASS MULTIPLEXING STRUCTURE
A method and system for implementing enhanced scan chain diagnostics via a bypass multiplexing structure. A full scan chain structure is partitioned into a...
2016/0216322 HIGH THROUGHPUT TEST HANDLER SYSTEM
A test handler comprises a main rotary turret and a loading station operative to convey electronic components to functional modules of the main rotary turret....
2016/0216321 PRESSURE SENSING AND CONTROL FOR SEMICONDUCTOR WAFER PROBING
A wafer probing system includes a probe card assembly having a plurality of individual probe structures configured make contact with a semiconductor wafer...
2016/0216320 BROWSER PROBE
A browser probe has a probe body including a signal line, a nose of electrical insulating material integral with and projecting from the probe body, a pin...
2016/0216319 INTEGRATED CIRCUIT AND STORAGE DEVICE INCLUDING INTEGRATED CIRCUIT
An integrated circuit including first pads and second pads, a first receiver circuit and a first driver circuit respectively connected to the first pad, a...
2016/0216318 CIRCUIT FOR MONITORING METAL DEGRADATION ON INTEGRATED CIRCUIT
An integrated circuit (IC) having a heat-generating element, such as a power MOSFET, a current-carrying conductor coupled to the heat-generating element, a...
2016/0216317 BUILT-IN TEST STRUCTURE FOR A RECEIVER
In one embodiment, a method for operating a receiver having a first receiver input and a second receiver input is described herein. The method comprises...
2016/0216316 METHOD OF PERFORMING STATIC TIMING ANALYSIS FOR AN INTEGRATED CIRCUIT
A method of performing a static timing analysis on an integrated circuit includes loading a library that includes local random variation information of the...
2016/0216315 DEGRADATION DETECTION CIRCUIT AND DEGRADATION ADJUSTMENT APPARATUS INCLUDING THE SAME
A degradation detection circuit may include a degradation unit including multiple delay elements driven by a high voltage for degradation. The high voltage for...
2016/0216314 APPARATUS AND METHOD FOR COMBINED MICRO-SCALE AND NANO-SCALE C-V, Q-V, AND I-V TESTING OF SEMICONDUCTOR MATERIALS
Current Voltage and Capacitance Voltage (IV and CV) measurements are critical in measurement of properties of electronic materials especially semiconductors. A...
2016/0216313 TRANSISTOR TESTING CIRCUIT AND METHOD THEREOF, SEMICONDUCTOR MEMORY APPARATUS AND SEMICONDUCTOR APPARATUS
A transistor testing circuit for measuring a breakdown voltage of a transistor included in a semiconductor apparatus with high accuracy for each chip is...
2016/0216312 TEST DEVICE AND TEST SYSTEM OF SEMICONDUCTOR DEVICE AND TEST METHOD FOR TESTING SEMICONDUCTOR DEVICE
A test device of a semiconductor device for testing semiconductor device including a plurality of interface pads includes a plurality of coupling units each...
2016/0216311 METHOD FOR IDENTIFYING A FAULTED DC POWER TRANSMISSION MEDIUM IN A MULTI-TERMINAL DC ELECTRICAL NETWORK
A method for identifying a faulted DC power transmission medium in a multi-terminal DC electrical network is provided. The DC electrical network includes...
2016/0216310 FAULT LOCATION USING TRAVELING WAVES
The present disclosure relates to calculating a fault location in an electric power transmission system based on traveling waves. In one embodiment, a system...
2016/0216309 Partial-Discharge Measurement Method and High-Voltage Device Inspected Using Same
The present invention provides a partial-discharge measurement method in which a partial-discharge defect signal and noise are separated, a partial-discharge...
2016/0216308 DIAGNOSIS AND POSITION IDENTIFICATION FOR REMOTE CAPACITOR BANKS
A method of evaluating one or more capacitor banks in an electrical power system includes: (a) acquiring data representing a signal of interest of the power...
2016/0216307 DETECTION CIRCUIT
Provided is a detection circuit configured to avoid erroneous detection that may occur immediately after a detection circuit is powered on. The detection...
2016/0216306 AUTOMATIC CURRENT TRANSFORMER POLARITY CORRECTION
A method of processing current transformer data, performed by an electronic trip unit, includes obtaining first current data based on a first current signal...
2016/0216305 SYSTEMS AND METHODS FOR ARC DETECTION
An arc fault detection system includes a first current sensor, a second current sensor, a band-pass filter, and a comparator module. The first current sensor,...
2016/0216304 RAPID HIGH-RESOLUTION MAGNETIC FIELD MEASUREMENTS FOR POWER LINE INSPECTION
Methods and configurations are disclosed for DNV application in rapid and cost-effective inspection of power transmission and power distribution lines.
2016/0216303 AUDIO PLUG DETECTION STRUCTURE AND METHOD THEREOF
An audio plug detection structure is disclosed, which is adapted for an audio jack corresponding to an audio plug and includes a first and second connection...
2016/0216302 DETERMINING THE CURRENT RETURN PATH INTEGRITY IN AN ELECTRIC DEVICE CONNECTED OR CONNECTABLE TO A FURTHER DEVICE
A method for determining current return path integrity in an electric device with a plurality of signal lines and supply lines. A library with at least one...
2016/0216301 METHOD AND APPARATUS FOR TUNING A RESISTANCE AND REACTANCE OF A WIRELESS POWER TRANSMITTER TESTING UNIT
An apparatus for testing an impedance range of a wireless power transmitter is provided. The apparatus comprises an adjustable impedance circuit configurable...
2016/0216300 APPARATUS AND METHOD FOR DETECTING PHASE LOCK IN AN ELECTRONIC DEVICE
The present disclosure provides a method and a phase lock detection apparatus for detecting whether a phase of an output signal is locked to the phase of a...
2016/0216299 LOCAL TRANSFORMER LEVEL GRID MANAGEMENT SYSTEMS AND METHODS
A remotely readable apparatus for metering of a plurality of electricity consumer lines, comprising: (a) a meter head that measures electricity usage for each...
2016/0216298 ELECTRICAL POWER MEASUREMENT SYSTEM AND METHOD
A method of measuring electrical power including the steps of measuring a first electrical input variable at an input to a power conditioner connected to an...
2016/0216297 APPARATUS FOR DETECTING NOISE IN POWER SUPPLY OF PLC ANALOGUE INPUT AND OUTPUT MODULE
An apparatus for detecting noise in a power supply of a PLC analog input/output module is provided. The apparatus may include a capacitor configured to extract...
2016/0216296 HALL ELEMENT DRIVING CIRCUIT, SENSOR CIRCUIT, AND CURRENT MEASURING APPARATUS
A Hall element driving circuit includes: a signal switching unit which is disposed between a power supply, which outputs a current, and a Hall element having...
2016/0216295 CALIBRATION FOR TEST AND MEASUREMENT INSTRUMENT INCLUDING ASYNCHRONOUS TIME-INTERLEAVED DIGITIZER USING...
A test and measurement instrument includes a coefficient storage facility coupled to a programmable filter. The coefficient storage facility is configured to...
2016/0216294 Electrical Spring Probe with Stabilization
An improved spring probe for a connector assembly includes an elongated electrically conductive contact and an elongated helical compression spring disposed...
2016/0216293 SCANNING PROBE MICROSCOPE AND CONTROL METHOD THEREOF
A scanning probe microscope includes a cantilever having a probe at a free end thereof; a scanner to three-dimensionally relatively move the probe and a...
2016/0216292 Hot Wire Anemometer
A hot wire anemometer circuit has a calibrate subcircuit and an operate subcircuit which are selectively invoked via a user-activate mode switch. The calibrate...
2016/0216291 METHOD AND APPARATUS FOR SUPPORTING ACCELEROMETER BASED CONTROLS IN A MOBILE ENVIRONMENT
A method of processing signals from an accelerometer/gyroscopic-based input device includes providing the input device within a vehicle. An ...
2016/0216290 MEMS DEVICE WITH OVER-TRAVEL STOP STRUCTURE AND METHOD OF FABRICATION
A MEMS device comprises a substrate, a proof mass spaced apart from a surface of the substrate, and an over-travel stop structure. The over-travel stop...
2016/0216289 METHOD TO PERFORM A MEASUREMENT OF AN ANALYTE IN A SAMPLE USING AN AUTOMATIC ANALYZER
A method of performing a measurement of an analyte in a sample using an automatic analyzer is provided. The automatic analyzer comprises: a cartridge for...
2016/0216288 DEVICES AND METHODS FOR ANALYZING GRANULAR SAMPLES
In some aspects, a device for apportioning granular samples includes a sample feeder defining a conduit, the conduit including a first opening to receive the...
2016/0216287 SYSTEMS AND METHODS FOR MULTI-ANALYSIS
Systems and methods are provided for sample processing. A device may be provided, capable of receiving the sample, and performing one or more of a sample...
2016/0216286 SYSTEMS AND METHODS FOR MULTI-ANALYSIS
Systems and methods are provided for sample processing. A device may be provided, capable of receiving the sample, and performing one or more of a sample...
2016/0216285 TEST STRIP PICKUP MECHANISM, TEST STRIP MOVING APPARATUS, LIQUID SAMPLE ANALYZER, AND TEST STRIP PICKUP METHOD
Disclosed is a test strip pickup mechanism configured to pick up test strips for liquid sample analysis one by one from a test strip bottle, the test strip...
2016/0216284 CARTRIDGES, ANALYZERS, AND SYSTEMS FOR ANALYZING SAMPLES
A cartridge, analyzer for use therewith, and system including the cartridge and analyzer. The cartridge is configured to receive a biological fluid to be...
2016/0216283 SYSTEMS, COMPOSITIONS, AND METHODS OF LIPID PANEL TEST CONTROLS UTILIZING PARTICLES THAT MIMIC HEMATOCRIT
A calibration sample includes serum/plasma having a known level of a first analyte and a plurality of particles that mimic the characteristics of red blood cells.
2016/0216282 SYSTEMS AND METHODS FOR DISTINGUISHING COTININE FROM ANABASINE IN A POINT-OF-CARE TESTING DEVICE
A system for determining a level of Cotinine and Anabasine in a sample includes a test strip configured to receive a sample; and a meter configured to receive...
2016/0216281 SOLUBLE VEGFR-1 VARIANTS AND ASSAYS AND METHODS OF USE THEREOF FOR DIAGNOSIS
Novel splice variants, amino acid sequences and nucleotide sequences thereof, and methods of using same.
2016/0216280 POINT OF CARE SICKLE CELL TEST
The disclosure provides methods, kits, and devices for determining an amount of hemoglobin S and/or an amount of total hemoglobin, and optionally, expressing...
2016/0216279 Therapeutic and Diagnostic Method for Ataxia-Telangiectasia
ATM kinase is shown to regulate proteasome-mediated protein turnover through suppression of the expression of the ubiquitin-like protein ISG15 (Interferon...
2016/0216278 KIDNEY DISEASE BIOMARKER
The present invention provides methods and solid state devices for detecting and staging chronic kidney disease in a patient, where the levels of biomarkers in...
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