Easy To Use Patents Search & Patent Lawyer Directory

At Patents you can conduct a Patent Search, File a Patent Application, find a Patent Attorney, or search available technology through our Patent Exchange. Patents are available using simple keyword or date criteria. If you are looking to hire a patent attorney, you've come to the right place. Protect your idea and hire a patent lawyer.

Searching:





Search by keyword, patent number, inventor, assignee, city or state:




Patent # Description
2016/0268134 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
A method for manufacturing a semiconductor device includes forming, on a substrate, a first conductivity type nitride semiconductor layer in which gallium...
2016/0268133 REDUCING OR ELIMINATING PRE-AMORPHIZATION IN TRANSISTOR MANUFACTURE
A method for fabricating field effect transistors using carbon doped silicon layers to substantially reduce the diffusion of a doped screen layer formed below...
2016/0268132 USE OF TOPOGRAPHY TO DIRECT ASSEMBLY OF BLOCK COPOLYMERS IN GRAPHO-EPITAXIAL APPLICATIONS
A method is provided for forming a patterned topography on a substrate. The substrate is provided with features formed atop that constitute an existing...
2016/0268131 LOW TEMPERATURE NANOWIRE GROWTH ON ARBITRARY SUBSTRATES
The present invention provides a method to manufacture nanowires. In various embodiments, a method is provided for producing an oxidized metal layer as a...
2016/0268130 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
According to one embodiment, a manufacturing method of a semiconductor device, comprising: forming a first nitride semiconductor layer on a substrate using a...
2016/0268129 METHOD FOR PRODUCING GROUP III NITRIDE CRYSTAL, GROUP III NITRIDE CRYSTAL, SEMICONDUCTOR DEVICE AND APPARATUS...
The present invention is intended to provide a method of producing a Group III nitride crystal that prevents a halogen-containing by-product from adversely...
2016/0268128 SELECTIVE EPITAXY USING EPITAXY-PREVENTION LAYERS
A method for forming an epitaxial structure includes providing a two-dimensional material on a crystal semiconductor material and opening up portions of the...
2016/0268127 Oxide and Manufacturing Method Thereof
An oxide with high crystallinity or an oxide having a crystal structure with few defects is provided. A method for manufacturing an oxide with a sputtering...
2016/0268126 DOUBLE ASPECT RATIO TRAPPING
A semiconductor structure is provided by a process in which two aspect ratio trapping processes are employed. The structure includes a semiconductor substrate...
2016/0268125 SEMICONDUCTOR PROCESS
A semiconductor process includes the following steps. A dielectric layer is formed on a substrate, where the dielectric layer has at least a dishing from a...
2016/0268124 Low Interface State Device and Method for Manufacturing the Same
A method for manufacturing a low interface state device includes performing a remote plasma surface process on a III-Nitride layer on a substrate; transferring...
2016/0268123 LOW DEFECT III-V SEMICONDUCTOR TEMPLATE ON POROUS SILICON
A method of forming a semiconductor on a porous semiconductor structure. The method may include forming a stack, the stack includes (from bottom to top) a...
2016/0268122 SURFACE PASSIVATION ON INDIUM-BASED MATERIALS
The present disclosure provides a semiconductor structure in accordance with some embodiments. The semiconductor structure includes a semiconductor feature, a...
2016/0268121 VAPOR DEPOSITION OF METAL OXIDES, SILICATES AND PHOSPHATES, AND SILICON DIOXIDE
Metal silicates or phosphates are deposited on a heated substrate by the reaction of vapors of alkoxysilanols or alkylphosphates along with reactive metal...
2016/0268120 Continuous-Wave Laser-Sustained Plasma Illumination Source
An optical system for generating broadband light via light-sustained plasma formation includes a chamber, an illumination source, a set of focusing optics, and...
2016/0268119 Electron Spectrometer and Measurement Method
An electron spectrometer includes: an energy analyzer section that energy-analyzes electrons emitted from a specimen; a micro-channel plate that amplifies the...
2016/0268118 ION DETECTION
A mass analyser in which ions form packets that oscillate with a period has an ion detector comprising: a detection arrangement; and compensation circuitry....
2016/0268117 MICROSCALE MASS SPECTROMETRY SYSTEMS, DEVICES AND RELATED METHODS
Mass spectrometry systems or assemblies therefore include an ionizer that includes at least one planar conductor, a mass analyzer with a planar electrode...
2016/0268116 CONCENTRIC APCI SURFACE IONIZATION ION SOURCE, ION GUIDE, AND METHOD OF USE
A concentric APCI surface ionization probe, supersonic sampling tube, and method for use of the concentric APCI surface ionization probe and supersonic...
2016/0268115 ION SOURCE SYSTEM FOR ATMOSPHERIC PRESSURE INTERFACE, AND MASS SPECTROMETER
Provided is an ion source system for an atmospheric pressure interface, comprising an atmospheric pressure ion source (1), wherein the atmospheric pressure ion...
2016/0268114 Ion Trap Mass Spectrometers
A method of mass spectrometry or ion mobility spectrometry is disclosed comprising: providing ions towards an ion storage region; selecting a target maximum...
2016/0268113 Charge-Stripping of Multiply-Charged Ions
A method of mass spectrometry or ion mobility spectrometry is disclosed wherein a sample is ionised by an electrified sprayer so as to produce multiply charged...
2016/0268112 Methods for Data-Dependent Mass Spectrometry of Mixed Biomolecular Analytes
A method for mass spectral analysis of a sample containing a plurality of biomolecule species comprises: (a) mass analyzing a plurality of first-generation ion...
2016/0268111 Systems and Methods for Identifying Precursor ions from Product Ions Using Arbitrary Transmission Windowing
A transmission window that has a constant rate of precursor ion transmission for each precursor ion is stepped across a mass range, producing a series of...
2016/0268110 LINEAR SCANNING SPUTTERING SYSTEM AND METHOD
A sputtering system having a processing chamber with an inlet port and an outlet port, and a sputtering target positioned on a wall of the processing chamber....
2016/0268109 SPUTTER DEPOSITION SOURCE, APPARATUS FOR SPUTTER DEPOSITION AND METHOD OF ASSEMBLING THEREOF
A sputter deposition source for sputter deposition in a vacuum chamber is described. The source includes a wall portion of the vacuum chamber; a target...
2016/0268108 METHOD AND APPARATUS FOR THE DETECTION OF ARC EVENTS DURING THE PLASMA PROCESSING OF A WAFER, SURFACE OF SUBSTRATE
A method for monitoring at least one process parameter of a plasma process being performed on a semiconductor wafer, surface or surface and determine arc...
2016/0268107 MULTI-ZONE REACTOR, SYSTEM INCLUDING THE REACTOR, AND METHOD OF USING THE SAME
Multi-zone reactors, systems including a multi-zone reactor, and methods of using the systems and reactors are disclosed. Exemplary multi-zone reactors include...
2016/0268106 Methods for Removing Particles from Etching Chamber
A method includes forming a coating layer in a dry etching chamber, placing a wafer into the dry etching chamber, etching a metal-containing layer of the...
2016/0268105 PLASMA PROCESSING DEVICE AND OPERATION METHOD
An operation method of a plasma processing device, includes performing a plasma process on a workpiece by supplying first high frequency power of a...
2016/0268104 Plasma Source Device and Methods
This disclosure describes a remote plasma source, a gas input manifold, and related methods of making and using. In some examples, a remote plasma source is...
2016/0268103 REMOTE PLASMA SOURCE FOR CONTROLLING PLASMA SKEW
A plasma source is provided including a core element extending from a first end to a second end along a first axis. The plasma source further includes one or...
2016/0268102 CROSS-FLOW REACTOR AND METHOD
Gas-phase reactors and systems are disclosed. Exemplary reactors include a reaction chamber having a tapered height. Tapering the height of the reactor is...
2016/0268101 MICROWAVE AUTOMATIC MATCHER AND PLASMA PROCESSING APPARATUS
A microwave automatic matcher includes a movable body, a driving unit, a matching control unit, a reflection coefficient measuring unit, and a setting unit....
2016/0268100 METHODS AND APPARATUS FOR SYNCHRONIZING RF PULSES IN A PLASMA PROCESSING SYSTEM
A synchronized pulsing arrangement for providing at least two synchronized pulsing RF signals to a plasma processing chamber of a plasma processing system is...
2016/0268099 Individual beam pattern placement verification in multiple beam lithography
Methods and systems for verification of a mark written on a target surface during a multiple beam lithography process, and for verifying beam position of...
2016/0268098 SCANNING ELECTRON MICROSCOPE CAPABLE OF CONTROLLING BEAM SPOT AND MEASUREMENT METHOD USING THE SAME
A scanning electron microscope capable of controlling the spot of an electron beam and a measurement method using the same. The scanning electron microscope...
2016/0268097 SYSTEM AND METHOD FOR FORMING A SEALED CHAMBER
Chamber elements defining an internal chamber to be utilized during a substrate related stage selected from the group consisting of substrate manufacturing...
2016/0268096 Apparatus of Plural Charged-Particle Beams
A multi-beam apparatus for observing a sample with high resolution and high throughput is proposed. In the apparatus, a source-conversion unit changes a single...
2016/0268095 X-RAY TUBE HAVING MAGNETIC QUADRUPOLES FOR FOCUSING AND MAGNETIC DIPOLES FOR STEERING
An X-ray tube can include: a cathode including an electron emitter; an anode configured to receive the emitted electrons; a first magnetic quadrupole between...
2016/0268094 X-ray sources using linear accumulation
A compact source for high brightness x-ray generation is disclosed. The higher brightness is achieved through electron beam bombardment of multiple regions...
2016/0268093 DEVICE FOR PROTECTING AGAINST OVERCURRENTS IN ELECTRIC CIRCUITS AND USES OF SAID DEVICE IN A FUSE LINK AND IN A...
An overcurrent protection device comprises a current input terminal; a central terminal for output of current overshoots; and a terminal for output of...
2016/0268092 FUSE HOLDER
A fuse holder (10) for a high-voltage system for accommodating an electric fuse link (13), comprising a bottom part (11) and a cover (12), which, when...
2016/0268091 IN-LINE FUSE ASSEMBLY
An embodiment of an in-line fuse holder has been disclosed. The fuse holder includes a first terminal and a second terminal configured to cooperate with the...
2016/0268090 COMPACT FUSE SUPPORT
Method and apparatus for mounting fuses in switchgear and similar electrical isolation equipment provide a nonconductive fuse support that allows the fuses to...
2016/0268089 HIGH-CURRENT FUSE WITH ENDBELL ASSEMBLY
A fuse including a fuse body defining an inner cavity and having at least one fuse body aperture formed therethrough, a fuse element including a first terminal...
2016/0268088 EXCHANGE OPERATING MECHANISM
The present invention discloses a changeable mechanism, the changeable mechanism comprises a support contact, a connecting rod, a connecting shaft, a...
2016/0268087 DOUBLE MAKE DOUBLE BREAK INTERRUPTER MODULE WITH INDEPENDENT BLADES
An interrupter module (10) of a molded case circuit breaker (2) includes two stationary electrical contacts (20), and a blade carrier assembly (100) with a...
2016/0268086 OFFSET BUS CONNECTION WITH FIELD SHAPING AND HEAT SINK
Method and apparatus for reducing the minimum clearance needed between an electrical conductor and ground in switchgear and similar electrical isolation...
2016/0268085 MOLDED CASE CIRCUIT BREAKER
Disclosed is a molded case circuit breaker including a case configured to accommodate an element for trip, an upper cover detachable attached to the case, a...
← Previous | 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100 101 102 103 104 105 106 107 108 109 110 111 112 113 114 115 116 117 118 119 120 121 122 123 124 125 126 127 128 129 130 131 132 133 134 135 136 137 138 139 140 141 142 143 144 145 146 147 148 149 150 151 152 153 154 155 156 157 158 159 160 | Next →

File A Patent Application

  • Protect your idea -- Don't let someone else file first. Learn more.

  • 3 Easy Steps -- Complete Form, application Review, and File. See our process.

  • Attorney Review -- Have your application reviewed by a Patent Attorney. See what's included.