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Patent # Description
2017/0363703 CONSTRUCTION OF DIAGNOSTIC IMAGES FROM MRI DATA ACQUIRED IN AN INHOMOGENEOUS POLARIZING MAGNETIC FIELD
According to one aspect of the invention, there is provided a method of constructing a diagnostic image of a sample from MRI data acquired while subjecting the...
2017/0363702 METHOD AND APPARATUS FOR DENOISING MAGNETIC RESONANCE DIFFUSION TENSOR, AND COMPUTER PROGRAM PRODUCT
The application provides a method, apparatus and computer program product for denoising a magnetic resonance diffusion tensor, wherein the method comprises:...
2017/0363701 METHOD AND MAGNETIC RESONANCE APPARATUS FOR RECORDING MAGNETIC RESONANCE DATA USING A bSSFP SEQUENCE
In a method and magnetic resonance apparatus for recording magnetic resonance data using a bSSFP sequence, a k-space line to be scanned in k-space is divided...
2017/0363700 METHOD FOR PROVIDING A SELECTION OF AT LEAST ONE PROTOCOL PARAMETER FROM A PLURALITY OF PROTOCOL PARAMETERS AND...
In a method for providing a selection of at least one protocol parameter from a plurality of protocol parameters for a user-defined protocol parameter setting...
2017/0363699 MRI APPARATUS AND IMAGE PROCESSING APPARATUS
In one embodiment, an MRI apparatus includes: a scanner equipped with at least a static magnetic field magnet, a gradient coil, and an RF coil configured to...
2017/0363698 A POWER DEVICE AND METHOD FOR DRIVING A LOAD
Embodiments of the invention provide a power device. The power device comprises a switch mode power conversion circuit with power semiconductors for driving a...
2017/0363697 SYSTEM AND METHOD FOR MAINTAINING VACUUM IN SUPERCONDUCTING MAGNET SYSTEM IN EVENT OF LOSS OF COOLING
An apparatus includes: a getter material (310) disposed within a vacuum chamber (210) to absorb stray molecules within the vacuum chamber; a thermal mass (340)...
2017/0363696 MAGNETO-OPTICAL DEFECT CENTER MAGNETOMETER
A magneto-optical defect center magnetometer, such as a diamond nitrogen vacancy (DNV) magnetometer, can include an excitation source, a magneto-optical defect...
2017/0363695 MAGNETIC FIELD MEASURING DEVICE AND METHOD FOR MANUFACTURING MAGNETIC FIELD MEASURING DEVICE
A magnetic field measuring device includes: a first cell and a second cell in which alkali metal atoms are entrapped and which are disposed in this order in a...
2017/0363694 3D MEMS MAGNETOMETER AND ASSOCIATED METHODS
A micro-electro-mechanical system (MEMS) magnetometer is provided for measuring magnetic field components along three orthogonal axes. The MEMS magnetometer...
2017/0363693 HIGH BANDWIDTH HALL SENSOR
A high bandwidth Hall sensor includes a high bandwidth path and a low bandwidth path. The relatively high offset (from sensor offset) of the high bandwidth...
2017/0363692 DIAGNOSTIC SYSTEM FOR A DC-DC VOLTAGE CONVERTER
A diagnostic system for a DC-DC voltage converter is provided. The diagnostic system includes a first temperature sensor generating a first output voltage...
2017/0363691 DIAGNOSTIC SYSTEM FOR A DC-DC VOLTAGE CONVERTER
A diagnostic system for a DC-DC voltage converter is provided. The DC-DC voltage converter has a high voltage bi-directional MOSFET switch. The high voltage...
2017/0363690 DEVICE AND METHOD FOR ESTIMATING BATTERY STATE
A battery-state estimating device for accurately estimating a battery state of a battery includes: an OCV calculating unit calculating an OCV from the detected...
2017/0363689 Accelerated Testing Protocols For Solid Oxide Fuel Cell Cathode Materials
Accelerated testing protocols that can be utilized for determining and projecting the durability of SOFC cathodes are described. The accelerated testing...
2017/0363688 SYSTEM AND METHOD FOR INSPECTION OF A GENERATOR STATOR CORE STEP IRON REGION WITH THE ROTOR IN-SITU
Eddy current inspection of the step iron region of a generator stator core lamina insulation is performed while the rotor is in situ, with inspection system...
2017/0363687 ZONE SELECTIVE INTERLOCKING TEST APPARATUS
A ZSI testing apparatus includes a fault generation circuit, a plurality of cable assemblies coupled to the fault generation circuit, wherein the cable...
2017/0363686 SYNCHRONIZING A DEVICE THAT HAS BEEN POWER CYCLED TO AN ALREADY OPERATIONAL SYSTEM
A method comprises a system comprising a host device coupled to a first remote device actively operating according to a state diagram that the host device and...
2017/0363685 IMPLEMENTING PRIORITIZED COMPRESSED FAILURE DEFECTS FOR EFFICIENT SCAN DIAGNOSTICS
A method and circuits are provided for implementing enhanced scan data testing using an XOR network to prioritize faults to be simulated during diagnostic...
2017/0363684 BITWISE ROTATING SCAN SECTION FOR MICROELECTRONIC CHIP TESTING AND DIAGNOSTICS
According to an embodiment of the present invention, a computer-implemented method for testing a microelectronic chip is described. The method may include...
2017/0363683 PORTION ISOLATION ARCHITECTURE FOR CHIP ISOLATION TEST
Embodiments include methods, and processing system, and computer program products providing portion isolation design to a chip design to facilitate...
2017/0363682 TESTING SYSTEM, METHOD FOR TESTING AN INTEGRATED CIRCUIT AND A CIRCUIT BOARD INCLUDING THE SAME
A testing system includes a subtractor and a divider. The subtractor is configured to receive a first voltage of a circuit being tested and a second voltage of...
2017/0363681 PROBE HEAD ASSEMBLIES AND PROBE SYSTEMS FOR TESTING INTEGRATED CIRCUIT DEVICES
Probe head assemblies and probe systems for testing integrated circuit devices are disclosed herein. In one embodiment, the probe head assemblies include a...
2017/0363680 PROBE CARD WITH TEMPERATURE CONTROL FUNCTION, INSPECTION DEVICE USING THE SAME, AND INSPECTION METHOD
A probe card having uniform temperature distribution under control to a desired temperature is provided, so as to provide an inspection apparatus and an...
2017/0363679 SYSTEM AND METHODS FOR ANALYZING AND ESTIMATING SUSCEPTIBILITY OF CIRCUITS TO RADIATION-INDUCED...
Systems and methods for semiconductor design evaluation. IC layout information of a circuit design is received, and the circuit design is decomposed into...
2017/0363678 SELF-CONTAINED RECONFIGURABLE PERSONAL LABORATORY
A personal laboratory includes a self-contained, miniaturized, portable kit that provides for design, testing, and automated assembling, dissembling, and...
2017/0363677 SYSTEM AND METHOD FOR ELECTRICAL SPARK DETECTION
A spark detector indicates the presence of a spark by analyzing sound waves generated when an electrical spark is produced from an electrical spark generator...
2017/0363676 Design for Test of Stacked Transistors
A stack of series coupled transistors comprising, at least two sub-portions of the stack of series coupled transistors, and at least one logic decoder coupled...
2017/0363675 PARTIAL DISCHARGE DETERMINATION METHOD, PARTIAL DISCHARGE DETERMINATION APPARATUS, AND PARTIAL DISCHARGE...
A partial discharge determination method and apparatus, and a partial discharge determination system capable of indicating how much margin is left before...
2017/0363674 MONITORING SYSTEMS AND METHODS FOR DETECTING THERMAL-MECHANICAL STRAIN FATIGUE IN AN ELECTRICAL FUSE
Systems and methods for detecting thermal-mechanical strain fatigue in an electrical fuse fatigue include a controller configured to monitor at least one fuse...
2017/0363673 Wireless Mechanism For Detecting an Open or Closed Container, and Methods of Making and Using the Same
An electronic device including a continuity sensor and electrical circuitry configured to detect and report the continuity state of an article, container or...
2017/0363672 METHOD FOR DETECTING LEAKAGE CURRENT AND ELECTRONIC DEVICE SUPPORTING THE SAME
An electronic device according to various exemplary embodiments of the present invention may include one or more switches, one of more sub-systems, and an...
2017/0363671 NOISE SPECTRUM ANALYSIS FOR ELECTRONIC DEVICE
A method for analyzing noise spectrum of an electronic device includes storing a waveform data including a plurality of data points, the waveform data is...
2017/0363670 NOISE SPECTRUM ANALYSIS FOR ELECTRONIC DEVICE
A method for analyzing noise spectrum of an electronic device includes storing a waveform data including a plurality of data points, the waveform data is...
2017/0363669 TRACKING QUALITY CONTROL FOR ELECTROMAGNETIC GUIDANCE
An electromagnetic field quality assurance system employing an electromagnetic field generator (10) for emitting an electromagnetic field (12), and one or more...
2017/0363668 SENSOR AND METHOD OF SENSING A VALUE OF A PARAMETER
A sensor for sensing a parameter includes a control circuit that outputs a clock signal, a converter that receives the clock signal, generates a ...
2017/0363666 METHOD AND APPARATUS FOR ENERGY FLOW VISUALIZATION
A method and apparatus for visualizing energy flows. In one embodiment, the method comprises (I) obtaining a plurality of measured energy flow values for a...
2017/0363665 Method And System For A Wideband CMOS RMS Power Detection Scheme
A system includes a first circuit and a second circuit. The first circuit includes a first MOS transistor having a gate and a drain. The first circuit is...
2017/0363664 APPARATUS FOR AND METHOD OF PROVIDING MEASUREMENTS OF UNCERTAINTY IN RESPECT OF A TRANSFER FUNCTION
An apparatus is provided that can estimate a transfer function, for example of current measurement systems, voltage measurement systems and power measurement...
2017/0363663 POWER CONVERTER FOR A THERMAL SYSTEM
The present disclosure generally describes a system that includes a heater, a power converter including a power switch, and a controller. The power converter...
2017/0363662 METHOD AND CIRCUITRY FOR MEASURING CURRENT
Transistor arrays are disclosed herein. An example transistor array includes a first node for coupling the transistor array to a circuit. A first transistor...
2017/0363661 HOLDER WITH SELF-ALIGNING FEATURE FOR HOLDING CURRENT SENSOR AROUND LINE CONDUCTOR
A holder for a current sensor having separable portions with inner surfaces forming an opening and opposing outer surfaces having a groove to accommodate a...
2017/0363660 ELECTRODE FOIL
Electrode foil (6) comprising a) an electrode layer (60) comprising--a sensing electrode portion (100), operable as an electrode of a sensing capacitor for...
2017/0363659 INTEGRATED SELF-COINING PROBE
A probe head that contains a coining surface and a plurality of probe tips integrated on a same side of the probe head is provided. The probe head has a first...
2017/0363658 Probe Card Structure
A probe head and methods of testing a device using a probe head are provided. The probe head includes a first end connected to a first substrate. The first...
2017/0363657 DETECTION DEVICE HAVING ATTACHED PROBE
A detection device having an attached probe, the detection device including a base body (100) and a probe (200). The base body (100) is provided with a stage...
2017/0363656 Z-AXIS STRUCTURE IN ACCELEROMETER
A Z-axis structure in an accelerometer comprises a mass block (1) moving relative to a substrate (4) in a Z-axis direction in a reciprocating manner. A first...
2017/0363655 INERTIA MEASUREMENT MODULE AND TRIAXIAL ACCELEROMETER
An inertia measurement module and three-axis accelerometer, comprising a first pole piece (4) located on a substrate and a mass block (1) suspendingly...
2017/0363654 ACCELERATION DETECTION DEVICE AND MANUFACTURING METHOD THEREOF
An acceleration detection device includes a piezoelectric element including a top surface and a bottom surface, a sheet-shaped adhesive provided on the bottom...
2017/0363653 CAPPING SYSTEM FOR BIOLOGICAL THERMAL REACTION AND METHOD OF USING THE SAME
The present invention provides a capping system for biological thermal reaction, which comprises at least one reaction tube, at least one suction unit, and at...
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