Easy To Use Patents Search & Patent Lawyer Directory

At Patents you can conduct a Patent Search, File a Patent Application, find a Patent Attorney, or search available technology through our Patent Exchange. Patents are available using simple keyword or date criteria. If you are looking to hire a patent attorney, you've come to the right place. Protect your idea and hire a patent lawyer.

Searching:





Search by keyword, patent number, inventor, assignee, city or state:




Patent # Description
2018/0114724 METHOD FOR MANUFACTURING ETCH STOP AREAS FOR CONTACTING SEMICONDUCTOR DEVICES
A method for manufacturing includes providing a semiconductor substrate having a semiconductor device including at least two device layers to be contacted. A...
2018/0114723 STRUCTURE AND METHOD TO IMPROVE FAV RIE PROCESS MARGIN AND ELECTROMIGRATION
A method of forming fully aligned vias in a semiconductor device includes forming an Mx level interconnect line embedded in an Mx interlevel dielectric (ILD)....
2018/0114722 DEPOSITION APPARATUS INCLUDING UV ANNEALING UNIT AND METHOD FOR FABRICATING NON-VOLATILE MEMORY DEVICE BY USING...
A deposition apparatus includes a chamber, a plate in the chamber and configured support a substrate, a deposition unit configured to perform a deposition...
2018/0114721 Method of Reducing Overlay Error in Via to Grid Patterning
Techniques herein include a method of patterning a substrate that uses a self-alignment based process to align a via to odd and even trenches by using multiple...
2018/0114720 HIGH RESISTIVITY SILICON-ON-INSULATOR SUBSTRATE HAVING ENHANCED CHARGE TRAPPING EFFICIENCY
A multilayer semiconductor on insulator structure is provided in which the handle substrate and an epitaxial layer in interfacial contact with the handle...
2018/0114719 BARRIER PLANARIZATION FOR INTERCONNECT METALLIZATION
A method for forming interconnect structures includes forming a barrier material over a dielectric layer having a trench, the barrier layer being disposed on...
2018/0114718 BARRIER PLANARIZATION FOR INTERCONNECT METALLIZATION
A method for forming interconnect structures includes forming a barrier material over a dielectric layer having a trench, the barrier layer being disposed on...
2018/0114717 SEMICONDUCTOR MANUFACTURING DEVICE AND PROCESSING METHOD
A semiconductor manufacturing device includes a stage, a plurality of pins, and a driving unit. The stage includes a mounting surface. The mounting surface has...
2018/0114716 PIN LIFTER ASSEMBLY WITH SMALL GAP
A pin lifter assembly for a substrate support in a substrate processing system includes a lift pin having a shaft, an upper end, and a lower end, and an insert...
2018/0114715 VAPOR PHASE GROWTH APPARATUS, RING-SHAPED HOLDER, AND VAPOR PHASE GROWTH METHOD
A vapor phase growth apparatus according to an embodiment includes a reaction chamber, a ring-shaped holder provided in the reaction chamber, the ring-shaped...
2018/0114714 SUBSTRATE PROCESSING APPARATUS AND METHOD OF MANUFACTURE USING THE SAME
A substrate processing apparatus may include a substrate jig device and a transfer unit, which is configured to hold a substrate in a non-contact state and...
2018/0114713 DIRECT BOND METHOD PROVIDING THERMAL EXPANSION MATCHED DEVICES
A method of transferring an integrated circuit (IC) onto an alternative substrate is provided at a wafer level to enable coefficient of thermal expansion (CTE)...
2018/0114712 CONTROL WAFER MAKING DEVICE
A control wafer making device, a method of measuring an epitaxy thickness in a control wafer, and a method for monitoring a control wafer are provided. In...
2018/0114711 Monitoring System For Deposition And Method Of Operation Thereof
A monitoring and deposition control system and method of operation thereof including: a deposition chamber for depositing a material layer on a substrate; a...
2018/0114710 EQUIPMENT FRONT END MODULE AND SEMICONDUCTOR MANUFACTURING APPARATUS INCLUDING THE SAME
A semiconductor manufacturing apparatus includes an equipment front end module (EFEM) including a chamber having an inner space that accommodates a wafer...
2018/0114709 MOUNTING DEVICE AND MOUNTING METHOD
A mounting device in which a loading distance separating adjacent characteristic components are lined up side by side is shorter than separation distance...
2018/0114708 LOAD LOCK FAST PUMP VENT
A semiconductor processing tool is disclosed, the tool having a frame forming at least one chamber with an opening and having a sealing surface around a...
2018/0114706 WAFER BOAT ASSEMBLY AND SUBSTRATE PROCESSING APPARATUS INCLUDING THE SAME
A wafer boat assembly including a boat, a pedestal, and a base. The boat includes a slot to hold a wafer and a rod including a gas line. The pedestal includes...
2018/0114705 SEMICONDUCTOR STRUCTURE AND A MANUFACTURING METHOD THEREOF
A method of manufacturing a semiconductor structure includes providing a substrate and a chip disposed over the substrate; disposing the substrate over a first...
2018/0114704 MANUFACTURING METHOD OF PACKAGE-ON-PACKAGE STRUCTURE
A manufacturing method of a POP structure including at least the following steps is provided. A first package structure is formed and a second package...
2018/0114703 PRINTING OF MULTI-LAYER CIRCUITS
A sheet-fed system designed to print multilayer PCBs is introduced. The system consists of four main blocks; a drilling station, a patterning station, a...
2018/0114702 WIRING SUBSTRATE AND ELECTRONIC COMPONENT DEVICE
A wiring substrate includes a first insulation layer having a component mounting area and a mark formation area, an electrode pad arranged in the component...
2018/0114701 SYSTEM AND METHOD FOR REMOVING FOREIGN SUBSTANCES BY USING ELECTRIC FIELD ADSORPTION METHOD
The present invention relates to a system and a method of removing a foreign material by using an electric field adsorbing scheme, which are capable of easily...
2018/0114700 METHOD OF ATOMIC LAYER ETCHING AND METHOD OF FABRICATING SEMICONDUCTOR DEVICE USING THE SAME
A method of atomic layer etching and fabricating a semiconductor device using the same, the atomic layer etching including providing a layer including atomic...
2018/0114699 Method for Self-Aligned Cutting of Single Fins
Techniques herein use a self-alignment based process that enables single fin cutting (cutting a single fin among other fins) with overlay requirements relaxed...
2018/0114698 COMPOSITION FOR FILM FORMATION, FILM, PRODUCTION METHOD OF PATTERNED SUBSTRATE, AND COMPOUND
A composition comprises a compound comprising a partial structure represented by formula (1) and comprising an intermolecular bond-forming group; and a...
2018/0114697 WAFER PROCESSING METHOD AND CUTTING APPARATUS
A wafer processing method for processing a wafer having, on a face side, a device formed in each of areas demarcated by a plurality of crossing projected...
2018/0114696 WAFER DIVIDING METHOD
Disclosed herein is a wafer dividing method including a shield film forming step of applying a liquid resin to the back side of a wafer having a plurality of...
2018/0114695 DUAL HEIGHT GLASS FOR FINFET DOPING
Dual height glass is described for doping a fin of a field effect transistor structure in an integrated circuit. In one example, a method includes applying a...
2018/0114694 SYSTEMS AND METHODS FOR FORMING LOW RESISTIVITY METAL CONTACTS AND INTERCONNECTS BY REDUCING AND REMOVING...
A method for depositing a metal layer on a barrier layer includes a) arranging a substrate in a processing chamber. The substrate has been exposed to at least...
2018/0114693 METHOD AND SYSTEM FOR INTEGRATION OF ELEMENTAL AND COMPOUND SEMICONDUCTORS ON A CERAMIC SUBSTRATE
A method of fabricating a semiconductor structure includes providing an engineered substrate including a polycrystalline substrate, a barrier layer...
2018/0114692 METHOD FOR MANUFACTURING GROUP-III NITRIDE SUBSTRATE AND GROUP-III NITRIDE SUBSTRATE
There is provided a method for manufacturing a group-III nitride substrate, including: (a) preparing a substrate which is made of a group III-nitride crystal...
2018/0114691 METHODS FOR ETCHING AS-CUT SILICON WAFERS AND PRODUCING SOLAR CELLS
A method for producing a silicon solar cell, including inline etching of a saw damaged as-cut Si wafer, the inline etching including etching a first surface of...
2018/0114690 CLEANING METHOD, METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND PLASMA TREATMENT DEVICE
The present invention provides a cleaning method by which it is possible to prevent deformation of a film formation mask (31). While the film formation mask...
2018/0114689 HIGH-PRESSURE SODIUM LAMP LIGHTING DEVICE
The present technology provides a high-pressure sodium lamp lighting device that reduces occurrence of the acoustic resonance phenomenon. A high-pressure...
2018/0114688 High PAR Maintenance Rate Type High Pressure Sodium Lamp with Auxiliary Starting Switch
A high PAR maintenance rate type high pressure sodium lamp with an auxiliary starting switch is provided with an external glass tube and a discharge tube which...
2018/0114687 High Brightness Laser-Sustained Plasma Broadband Source
A high brightness laser-sustained broadband light source includes a gas containment structure and a pump laser configured to generate a pump beam including...
2018/0114686 ION TRAPS THAT APPLY AN INVERSE MATHIEU Q SCAN
The invention generally relates to ion traps that operate by applying an inverse Mathieu q scan. In certain embodiments, the invention provides systems that...
2018/0114685 Fourier Transform Mass Spectrometer
A quadrupole is filled with ions and the ions are cooled by applying a pressure and gas flow within the quadrupole. Ions are trapped in the quadrupole by...
2018/0114684 Ion Current On-Off Switching Method and Device
In one aspect, a mass spectrometer is disclosed, which comprises an ion source for generating ions, a chamber comprising a curtain plate providing an inlet...
2018/0114683 ION TRAPPING WITH INTEGRATED ELECTROMAGNETS
Devices, systems, and methods for ion trapping with integrated electromagnets are described herein. One device includes a plurality of electrodes configured to...
2018/0114682 SAMPLE FRAGMENTATION DEVICE
For increasing a speed of fragmentation of a sample, such as a protein and a peptide, to enhance introduction efficiency into a detector, such as a mass...
2018/0114681 PROCESS CONDITION SENSING DEVICE AND METHOD FOR PLASMA CHAMBER
A sensing device for measuring a plasma process parameter in a plasma chamber for processing workpieces may include a substrate with one or more sensor...
2018/0114680 METHODS FOR THERMALLY CALIBRATING REACTION CHAMBERS
Methods for thermally calibrating reaction chambers are provided. In some embodiments, methods may include calculating a first correction factor of a first...
2018/0114679 TECHNIQUE TO PREVENT ALUMINUM FLUORIDE BUILD UP ON THE HEATER
Implementations of the present disclosure provide methods for treating a processing chamber. In one implementation, the method includes purging a 300 mm...
2018/0114678 ELECTROMAGNET DEVICE, ELECTROMAGNET CONTROLLER, ELECTROMAGNET CONTROL METHOD, AND ELECTROMAGNET SYSTEM
The electromagnet device of the present invention comprises: a yoke having an annular groove in a front surface thereof; an annular coil provided in the...
2018/0114677 PLASMA PROCESSING APPARATUS
A plasma processing apparatus includes a chamber; a mounting table configured to mount thereon a target object in the chamber; a plasma source configured to...
2018/0114676 SURFACE TREATMENT APPARATUS USING PLASMA
The present invention relates to a surface treatment apparatus for cleaning or treating (micro etching, etc.) a surface of a TEM sample (substrate) by...
2018/0114675 Antennas, Circuits for Generating Plasma, Plasma Processing Apparatus, and Methods of Manufacturing...
Embodiments of the inventive concepts provide antennas, plasma generating circuits, plasma processing apparatus, and methods for manufacturing semiconductor...
2018/0114674 METHODS OF FORMING FEATURES
A method of forming a feature in a void, the method including filling the void having at least one sloped wall with a polymeric material; forming a layer of...
← Previous | 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100 101 102 103 104 105 106 107 108 109 110 111 112 113 114 115 116 117 | Next →

File A Patent Application

  • Protect your idea -- Don't let someone else file first. Learn more.

  • 3 Easy Steps -- Complete Form, application Review, and File. See our process.

  • Attorney Review -- Have your application reviewed by a Patent Attorney. See what's included.