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Patent # Description
2018/0172777 VEHICLE AND METHOD FOR MANAGING BATTERY THEREOF
A vehicle and method are provided in which deterioration of a battery is controlled. The method includes detecting deterioration severity of the battery and...
2018/0172776 POWER STORAGE SYSTEM
A power storage system includes a power storage device including cells connected in parallel with each other; a voltage sensor; a current sensor; a data...
2018/0172775 PITCH SYSTEM AND METHOD FOR TEST OF A POWER BANK AND USE OF THE PITCH SYSTEM FOR PERFORMING THE METHOD
Pitch system (1) comprising at least one pitch motor drive (3) connected an electrical network (5). Each pitch motor drive (3) is connected to a power bank,...
2018/0172774 APPARATUS FOR UPDATING CHARGHING/DISCHARGING EFFICIENCY FACTOR OF ENERGY STORAGE SYSTEM
Disclosed herein is an apparatus for updating charging/discharging efficiency factors of an energy storage system. The apparatus includes: a correlation...
2018/0172773 STORAGE BATTERY DEVICE, STORAGE BATTERY SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT
According to one embodiment, a storage battery device in which a plurality of battery boards are connected in parallel, each of the battery boards including a...
2018/0172772 ONLINE DETECTION METHOD FOR INTERNAL SHORT-CIRCUIT OF BATTERY
The present application relates to an online detection method for internal short-circuit of power battery, which comprises the following steps: in the process...
2018/0172771 SECONDARY BATTERY MONITORING DEVICE AND METHOD FOR DIAGNOSING FAILURE
A secondary battery monitoring device is equipped with a resistance circuit and a detection circuit detecting an abnormality of a secondary battery, a current...
2018/0172770 BATTERY MANAGEMENT SYSTEM AND METHOD THEREOF
A battery management system is provided, which may include a power supply module, a measurement module, a switch module and a processing module. The power...
2018/0172769 BATTERY PACK STATUS PARALLEL MONITORING DEVICE
The present invention provides a battery pack state parallel-monitoring device having a battery pack configured with a plurality of battery cells, a cell...
2018/0172768 SYSTEM AND METHOD FOR DETECTING STATOR FAULTS IN AC ELECTRICAL MACHINES
A system and method for detecting a phase-to-ground fault in an AC electrical machine operates to receive measurements of three-phase voltages and currents...
2018/0172767 SYSTEM AND METHOD FOR MONITORING CONTACT LIFE OF A CIRCUIT INTERRUPTER
An electronic trip unit for a circuit interrupter includes a line side voltage sensing module for measuring first voltages on a line side of separable...
2018/0172766 ELECTRONIC SWITCH
A device, including: a sensor circuit that senses the state of contact impedance of a mechanical electrical switch; and a switch-off circuit that represents a...
2018/0172765 LIGHTWEIGHT, LOW OVERHEAD DEBUG BUS
According to one general aspect, an apparatus may include an interconnect bus, an interconnect-to-debug bus interface, and a debug bus. The interconnect bus...
2018/0172764 METHOD, SYSTEM AND APPARATUS FOR TUNING AN INTEGRATED EMBEDDED SUBSYSTEM
A method, apparatus and system are provided for the tuning of embedded subsystems of a device under test (DUT) that have analog characteristics. In response to...
2018/0172763 REDUCED SIGNALING INTERFACE METHOD & APPARATUS
This disclosure describes a reduced pin bus that can be used on integrated circuits or embedded cores within integrated circuits. The bus may be used for...
2018/0172762 ABSORPTION TESTING APPARATUS
An absorption testing apparatus supports a carrier board and includes a supporting platform, an electrically conductive component, a sealing ring and an...
2018/0172761 INTEGRATED CIRCUIT ON CHIP INSTRUMENT CONTROLLER
An integrated circuit comprising: a plurality of on-chip-instrument-modules; a test-controller-module configured to communicate data with the plurality of...
2018/0172760 CONTACT DEVICE AND A METHOD OF TESTING A SINGULATED ELECTRONIC COMPONENT USING A CONTACT DEVICE
A contact device (200, 200') and a method for testing a singulated electronic component (101). The contact device (200, 200') comprises a plunger unit (202)...
2018/0172759 PLATFORM COMPONENT INTERCONNECT TESTING
A method and apparatus for platform component interconnect testing is disclosed. In one embodiment, an integrated circuit comprises: a plurality of interface...
2018/0172758 VOLTAGE MONITORING CIRCUIT AND SEMICONDUCTOR DEVICE
A voltage monitoring circuit and a semiconductor device that can reduce time required for self-diagnosis are provided. A selection circuit selects one of a...
2018/0172757 METHOD AND CIRCUIT FOR DETECTING AN OPEN RESOLVER EXCITER LINE
A method for detecting an open resolver exciter line (10) comprises the following steps:--measuring the signal voltages U.sub.s and U.sub.c of the sine coil...
2018/0172756 METHOD AND CIRCUIT FOR DETECTING A SHORT CIRCUIT OF A RESOLVER EXCITER LINE TO GROUND OR TO THE OPERATING VOLTAGE
A method for detecting a short circuit (10) of a resolver exciter line (11, 12) comprising the steps of: .cndot.measuring (31) the excitation voltage...
2018/0172755 DOORBELL CAMERA TEST TOOL
A test tool for a low voltage devices is described. The test tool comprises a voltage sensor, a current sensor, a diode sensor, a testing module, and an...
2018/0172754 ROTATING DIODE FAULT DETECTION
Systems and methods for detecting a diode fault are provided. In one example implementation, a method for determining a diode fault condition in a rotating...
2018/0172753 GATE OXIDE SOFT BREAKDOWN DETECTION CIRCUIT
Various embodiments of a gate oxide breakdown detection technique detect gate oxide degradation due to stress on a per part basis without destroying functional...
2018/0172752 SEMICONDUCTOR ELEMENT TEST APPARATUS AND SEMICONDUCTOR ELEMENT TEST METHOD
A semiconductor element test apparatus includes a first switch having a switching element, a coil, a second switch, a semiconductor element, a first rectifying...
2018/0172751 TEST DEVICE
A bypass diode with a disconnection fault is identified. A test device includes: a signal introduction circuit that applies a disconnection position...
2018/0172750 LINE FAULT SIGNATURE ANALYSIS
In described examples, a time-domain analyzer is arranged to generate an indication of a number of high-frequency events of an electrical monitor signal that...
2018/0172749 VOLTAGE ABNORMALITY DETECTION CIRCUIT AND SEMICONDUCTOR DEVICE
In order to provide a voltage abnormality detection circuit and a semiconductor device which are capable of detecting a voltage abnormality in an internal...
2018/0172748 ELECTROSTATIC DETECTING SYSTEM AND METHOD
An electrostatic detecting system and an electrostatic detecting method for detecting the static electricity generated at an active surface of a substrate are...
2018/0172747 SYSTEM FOR TESTING WIRELESS TERMINAL AND METHOD FOR CONTROLLING THE SAME
Disclosed are a system for testing a wireless terminal and a method for controlling the same. The system includes: a reflecting surface, configured to totally...
2018/0172746 MEASUREMENT SYSTEM
A measurement system including an anechoic chamber, a turntable, N measurement antennas, in which N is a natural number and N in which a spherical coordinate...
2018/0172744 CAPACITANCE SENSING CIRCUITS
A capacitance sensing circuit includes a buffer circuit, a modulation circuit, and an integral circuit. The buffer circuit is coupled to an external capacitor...
2018/0172743 METHOD FOR ANALYSING A SIGNAL AND APPARATUS FOR CARRYING OUT THE METHOD
A method and apparatus for analysing a signal, in which a spectrum of the signal is provided, which spectrum is the result of a multiplication of the signal by...
2018/0172742 LOCAL TRANSFORMER LEVEL GRID MANAGEMENT SYSTEMS AND METHODS
A metering apparatus enclosed within a first housing, the metering apparatus comprising a plurality of metering points, wherein the metering apparatus, via the...
2018/0172741 Electronic Meter Seal Arrangement and Method
A method is used in a utility meter having an arm bit and a seal bit. The method includes changing a state of the arm bit to a first state in response to a...
2018/0172740 Arrangement Having Two Redundant Modules
An arrangement having two redundant modules that monitor one another and that each contain a current or voltage source, which is connected to a first line...
2018/0172739 CURRENT SENSING
Methods and devices related to current sensing are provided. Magnetoresistive sensor elements are provided on opposite sides of a conductor.
2018/0172738 HEAT-RESISTANT DEVICE FOR CURRENT DETECTION
A heat-resistant device for current detection may include a heat-resistant substrate including a ceramic material; a group of power wirings embedded in the...
2018/0172737 SHUNT THERMOCOUPLE
A thermocouple device includes a shared conductor for a shunt measurement and a thermocouple measurement. For example, the thermocouple device may include a...
2018/0172736 MULTI-PIECE CURRENT SHUNT WITH CONDUCTIVE CHANNEL FOR UNIFORM CURRENT FLOW
A shunt is composed of multiple pieces with at least some of the pieces being connected by a conductive channel that provides uniform flow of current. The...
2018/0172735 CURRENT SENSING RESISTOR, CURRENT SENSING DEVICE, AND METHOD FOR PRODUCING THE SAME
Provided is a current sensing resistor made of electrically conductive metal, the resistor including a code display portion obtained by encoding characteristic...
2018/0172734 CURRENT SENSE OVERLOAD LIMITING CIRCUIT
A voltage limiting circuit for limiting the voltage developed across a current sensing circuit and a method are disclosed. The voltage limiting circuit...
2018/0172733 MAGNETIC ASSEMBLY AND MAGNETIC CORE SET THEREOF
A magnetic assembly includes a magnetic core, a magnetic core set, a circuit board and a positioning plate. The magnetic core set includes a first magnetic...
2018/0172732 SYSTEM, A TANGENT PROBE CARD AND A PROBE HEAD ASSEMBLY FOR TESTING SEMICONDUCTOR WAFTER
A system for semiconductor wafer testing, a tangent probe card and a probe head assembly thereof. The system has a tangent probe card and a tester. Testing...
2018/0172731 UNIVERSAL PROBING ASSEMBLY WITH FIVE DEGREES OF FREEDOM
A universal multi-pin, adjustable probing assembly or manipulator for use in parametric and reliability testing of devices on a semiconductor wafer. The...
2018/0172730 CONTACTOR WITH ANGLED DEPRESSIBLE PROBES
A spring probe contactor includes an angled spring probe configuration that causes the tips of the spring probes to "swipe" the contact pads/solder balls of an...
2018/0172729 MEASUREMENT ARRANGEMENT
The present disclosure relates to a measurement arrangement including a sensor, an electronics module, a signal cable having a cable circuit, and a...
2018/0172728 PHOTONIC PROBE FOR ATOMIC FORCE MICROSCOPY
A photonic probe for atomic force microscopy includes: a cantilever including: a tip; a wing in mechanical communication with the tip; an extension interposed...
2018/0172727 Method and Apparatus for carrier profiling of semiconductors utilizing simultaneous techniques utilizing a...
Numerous carrier profiling techniques may be combined for simultaneous operation of those techniques on a single material sample. A single apparatus utilizing...
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