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Patent # Description
2018/0329009 SELECTIVE SAMPLING FOR ASSESSING STRUCTURAL SPATIAL FREQUENCIES WITH SPECIFIC CONTRAST MECHANISMS
The disclosed embodiments provide a method for acquiring MR data at resolutions down to tens of microns for application in in vivo diagnosis and monitoring of...
2018/0329008 QUIET MR IMAGING
The invention relates to a method of MR imaging of an object (10) positioned in an examination volume of a MR device (1). It is an object of the invention to...
2018/0329007 PHASE CYCLED MAGNETIC RESONANCE SPECTROSCOPE IMAGING
Systems, methods, and other embodiments associated with phase cycled magnetic resonance spectroscopic imaging (PCSI). According to one embodiment, a method...
2018/0329006 DIFFUSION-RELAXATION CORRELATION SPECTROSCOPIC IMAGING
A method for identifying and spatially mapping microenvironments using coarse-resolution correlation spectroscopic imaging includes acquiring, using a magnetic...
2018/0329005 RECEIVE COIL ARRANGEMENT AND METHOD FOR USE THEREOF
An exemplary coil arrangement can be provided, which can include, for example, coil element(s) having a parallel resonant circuit at a port, where the coil...
2018/0329004 MAGNETIC RESONANCE IMAGING APPARATUS
A magnetic resonance imaging apparatus according to an embodiment includes a transmission coil and processing circuitry. The transmission coil is configured to...
2018/0329003 APPARATUS AND METHOD FOR DETECTING ANTENNA COILS
An apparatus and a method for detecting an antenna coil with a non-active detuning apparatus are provided. The apparatus has a transmitter, an antenna, an...
2018/0329002 Method and Apparatus for Integrating Current Sensors in a Power Semiconductor Module
An improved system for measuring current within a power semiconductor module is disclosed, where the system is integrated within the power module. The system...
2018/0329001 Magnetic Field Detection Sensor
Magnetic members of a high-sensitivity magnetoimpedance element and a low-sensitivity magnetoimpedance element are connected to each other in series, and the...
2018/0329000 BRIDGE SENSOR ERROR CHECK
A method for detecting an error in a bridge sensor which is adapted for measuring a physical parameter. The method comprises biasing a first contact pair of...
2018/0328999 POWER SUPPLY MONITORING DEVICE, STORAGE APPARATUS, AND POWER SUPPLY MONITORING METHOD
An apparatus receives an abnormality occurrence notification from an abnormality source power supply unit that is one of a plurality of power supply units each...
2018/0328998 SYSTEM AND APPARATUS FOR BATTERY INTERNAL SHORT CURRENT DETECTION UNDER ARBITRARY LOAD CONDITIONS
Disclosed examples include systems and methods for determining an internal short condition in a battery. The method includes computing an estimated current...
2018/0328997 METHOD FOR DETERMINING PARAMETERS OF AN ELECTROCHEMICAL ENERGY STORE IN A COMPUTER-AIDED MANNER
Provided is a method for determining parameters of an electrochemical energy store in a computer-aided manner, wherein a plurality of temporally successive...
2018/0328996 BATTERY SENSOR DEVICE
A battery sensor device includes; a bus bar having a resistor and disposed in a power supply path from a battery; a sensor substrate configured to detect...
2018/0328995 METHODS AND APPARATUS FOR MEASURING BATTERY CHARACTERISTICS
Various embodiments of the present technology comprise a method and apparatus for measuring battery characteristics. In various embodiments, the apparatus...
2018/0328994 BATTERY MONITORING APPARATUS WITH MONITORING INTEGRATED CIRCUIT SELECTIVELY POWERED BY A HIGH VOLTAGE BATTERY...
A battery monitoring apparatus capable of reducing power consumption. At least one monitoring integrated circuit (IC) is electrically connected to a...
2018/0328993 VOLTAGE MEASUREMENT DEVICE, VOLTAGE MEASUREMENT SYSTEM
A voltage measurement device includes a relay, a first voltage measurement unit, a second voltage measurement unit, a power supply circuit, and a control...
2018/0328992 BATTERY OPERATED RELAY TEST DEVICE 2
The aim of the invention is to improve the efficiency and handling of a test device (4) for testing a protection relay (2). This is achieved by a method and a...
2018/0328991 ACCUMULATOR OPERATED RELAY TEST DEVICE 1
A method and test device for testing protection relays, the test device having a signal generator. The signal generator supplies a signal as pulses having...
2018/0328990 METHOD AND SYSTEM FOR MEASURING A PROPAGATION DELAY AND TRANSMITTANCE OF A DEVICE UNDER TEST (DUT)
The invention provides a method and system for measuring a propagation delay of a device under test (DUT) using a first measurement unit and a second...
2018/0328989 INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES
The disclosure describes a process and apparatus for accessing devices on a substrate. The substrate may include only full pin JTAG devices (504), only reduced...
2018/0328988 CONTROLLING A TRANSITION BETWEEN A FUNCTIONAL MODE AND A TEST MODE
In some examples, a method of controlling a transition between a functional mode and a test mode of a logic chip includes enabling a clock input of a disable...
2018/0328987 INTERFACES FOR WIRELESS DEBUGGING
Existing multi-wire debugging protocols, such as 4-wire JTAG, 2-wire cJTAG, or ARM SWD, are run through a serial wireless link by providing the debugger and...
2018/0328986 DEBUGGING TRANSLATION BLOCK AND DEBUGGING ARCHITECTURE
An electronic device includes one or more integrated circuits, a debugging translation block, and a bus connected to the one or more integrated circuits and...
2018/0328985 SYSTEM AND METHOD FOR FAULT ISOLATION BY EMISSION SPECTRA ANALYSIS
An apparatus and method for optical probing of a DUT is disclosed. The system enables identifying, localizing and classifying faulty devices within the DUT. A...
2018/0328984 TEST CIRCUITS FOR INTEGRATED CIRCUIT COUNTERFEIT DETECTION
Described herein are various technologies pertaining to identifying counterfeit integrated circuits (ICs) by way of allowing the origin of fabrication to be...
2018/0328983 SYSTEM AND METHODS FOR ANALYZING AND ESTIMATING SUSCEPTIBILITY OF CIRCUITS TO RADIATION-INDUCED...
Systems and methods for semiconductor design evaluation. IC layout information of a circuit design is received, and the circuit design is decomposed into...
2018/0328982 REMOTE SENSING AND PROBING OF HIGH-SPEED ELECTRONIC DEVICES
Systems and methods for testing and/or operating remote devices are disclosed. The embodiments provide cost-effective, convenient, and flexible means for the...
2018/0328981 Semiconductor Probe Test Card with Integrated Hall Measurement Features
A probe test card for testing semiconductor devices includes a printed circuit board, a pair of electrically conductive probes extending towards one another...
2018/0328980 TESTING PRINTED CIRCUIT BOARD ASSEMBLY
Embodiments of the present invention provide systems and methods for destructive testing of a printed circuit board assembly (PCBA). The PCBA contains embedded...
2018/0328979 ACCELERATED WAFER TESTING USING NON-DESTRUCTIVE AND LOCALIZED STRESS
Embodiments of the invention are directed to a semiconductor wafer test system. A non-limiting example of the test system includes a controller, a sensing...
2018/0328978 Wafer Level Burn-In System
A system for simultaneously burning in, testing and curing all the die on an uncut semiconductor wafer; for establishing electrical connectivity in one-to-one...
2018/0328977 ACCELERATED WAFER TESTING USING NON-DESTRUCTIVE AND LOCALIZED STRESS
Embodiments of the invention are directed to a semiconductor wafer test system. A non-limiting example of the test system includes a controller, a sensing...
2018/0328976 MAPPING OF METALLIC CONDUCTORS BY APPLYING RADAR IMAGING TECHNIQUES TO SPREAD SPECTRUM TIME DOMAIN...
A method for locating an anomaly in a distribution circuit including utility power lines includes coupling a radio frequency energy source to the utility power...
2018/0328975 METHOD OF ANALYZING A CABLE, BASED ON AN AUTO-ADAPTIVE CORRELATION, FOR THE DETECTION OF SOFT DEFECTS
A method for analyzing a cable into which a reference signal s of time support limited to a duration T is injected comprises the following steps: calculating...
2018/0328974 Alternating Current Transducer
An alternating current transducer. The transducer may be placed onto a powerline to detect the presence of an electric current and electromagnetic field in the...
2018/0328973 WIRE BREAK DETECTION IN DIGITAL INPUT RECEIVERS
An optocoupler is placed in series between the field ground pin of digital input circuitry and the field ground of an industrial controller. A capacitor to...
2018/0328972 DEVICE AND METHOD FOR DETECTING AN ELECTRICAL LOAD
A device for detecting an electrical load connected to an electric power supply network. The device comprises means for injecting a test signal into the...
2018/0328971 SENSOR SELF-DIAGNOSTICS USING MULTIPLE SIGNAL PATHS
Embodiments relate to systems and methods for sensor self-diagnostics using multiple signal paths. In an embodiment, the sensors are magnetic field sensors,...
2018/0328970 Battery Disconnect For Electrical Drain Test System
An example electrical drain test device includes a battery interface system having electrical cables to connect in-line with a negative battery post of a...
2018/0328969 METHOD FOR IDENTIFYING THE ELECTRICAL RESISTANCE OF THE ROTOR OF AN ELECTRIC MOTOR
A method for identifying a resistance value (R.sub.r) of the rotor of an electric induction motor (M), including determining a reference voltage ...
2018/0328967 ELECTRICAL METER SYSTEM FOR ENGERY DESEGREGATION
An energy meter is configured to determine component waveforms that form a measured waveform. The meter inputs the waveform into one or more entries of a data...
2018/0328966 VOLTAGE MONITOR
A voltage monitor circuit comprises: a monitored voltage input (42); a reference capacitor (32) arranged to be able to store a value of the monitored voltage...
2018/0328965 INDUCTIVE VOLTAGE TESTER AND METHOD OF USING THE SAME
An inductive voltage tester comprises a voltage tester body (100), a display window (110) disposed on the voltage tester body (100), a signal acquisition...
2018/0328964 High Input Impedance Electro-Optic Sensor
The disclosure includes an electro-optical sensor. The electro-optical sensor includes a test signal input to receive a test signal from a device under test...
2018/0328963 COMPRESSIBLE LAYER WITH INTEGRATED BRIDGE IN IC TESTING APPARATUS
An electrical contact that employs a common compressible layer for all contacts, wherein the compressible layer is fashioned with ducts that contain bridges...
2018/0328962 Shielded Probe Tip Interface
Disclosed is a differential test probe tip. The probe tip comprises a socket of electrically conductive material at a proximate end of the probe tip. The...
2018/0328961 Wide Range Compensation of Low Frequency Response Passive Probe
Disclosed is a test and measurement probe. The test and measurement probe includes a probe tip to connect to a Device Under Test (DUT). The probe tip includes...
2018/0328960 Scanning Probe and Electron Microscope Probes and Their Manufacture
Methods are described for the economical manufacture of Scanning Probe and Electron Microscope (SPEM) probe tips. In this method, multiple wires are mounted on...
2018/0328959 MICROMECHANICAL STRUCTURE FOR AN ACCELERATION SENSOR
A micromechanical structure for an acceleration sensor includes a movable seismic mass including electrodes, the seismic mass being attached to a substrate...
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