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Patent # Description
US-7,989,804 Test pattern structure
A test pattern structure including a first conductive layer and a second conductive layer is provided. The second conductive layer is directly disposed on the...
US-7,989,803 Manufacturing method for semiconductor chips and semiconductor wafer
In a semiconductor wafer that has semiconductor devices arranged in a plurality of device-formation-regions and a TEG placed in dividing regions that define the...
US-7,989,802 Light emitting device material and light emitting device
A light emitting device material comprises a pyrene compound represented by formula (1) below. Also disclosed is a light emitting device using such a material....
US-7,989,801 Organic light emitting display device and method of driving the same
Provided are an organic light emitting display device coupled to a photoelectric transistor. The organic light emitting display device includes an anode and a...
US-7,989,800 Nanowire field effect junction diode
A nanowire field effect junction diode constructed on an insulating transparent substrate that allows form(s) of radiation such as visual light, ultraviolet...
US-7,989,799 Surface light emitting element
Provided is a surface light emitting element having a high productivity, a high light emission output and good response characteristics, as well as capable of...
US-7,989,798 Fabricating arrays of metallic nanostructures
A patterned array of metallic nanostructures and fabrication thereof is described. A device comprises a patterned array of metallic columns vertically extending...
US-7,989,797 Connectible nanotube circuit
Carbon nanotube template arrays may be edited to form connections between proximate nanotubes and/or to delete undesired nanotubes or nanotube junctions.
US-7,989,796 Nonvolatile memory cell with concentric phase change material formed around a pillar arrangement
A memory cell comprises a first feature and a second feature. The second feature comprises a dielectric material and defines an opening at least partially...
US-7,989,795 Phase change memory device and method for fabricating the same
A phase change memory device is provided. The phase change memory device comprises a substrate. An electrode layer is on the substrate. A phase change memory...
US-7,989,794 Resistance change memory device for storing information in a non-volatile manner by changing resistance of...
A resistance change memory device including a substrate, first and second wiring lines formed above the substrate to be insulated from each other, and memory...
US-7,989,793 Electrical device using phase change material, phase change memory device using solid state reaction and method...
Provided are a nonvolatile memory device and a method of fabricating the same, in which a phase-change layer is formed using a solid-state reaction to reduce a...
US-7,989,792 Abrupt metal-insulator transition device with parallel MIT material layers
An abrupt MIT (metal-insulator transition) device with parallel MIT material layers is provided. The abrupt MIT device includes a first electrode disposed on a...
US-7,989,791 Diode structure and memory device including the same
Provided are a diode structure and a memory device including the same. The diode structure includes: a first electrode; a p-type Cu oxide layer formed on the...
US-7,989,790 Resistance random access memory
A memory comprises a number of word lines in a first direction, a number of bit lines in a second direction, each coupled to at least one of the word lines, and...
US-7,989,789 Phase-change memory device that stores information in a non-volatile manner by changing states of a memory material
A phase-change memory device has a plurality of first wiring lines WL extending in parallel to each other, a plurality of second wiring lines BL which are...
US-7,989,788 Determining position of a media page using a slot in the imaging drum
A method for determining a position of a mechanical edge of a reference edge of a sheet of recording media relative to a first edge of a drum slot in a...
US-7,989,787 Structure element, in particular for radiation shielding constructions
There is a structure element, in particular for radiation shielding constructions, having at least one floor plate and at least one wall section and/or at least...
US-7,989,786 Laser-driven light source
An apparatus for producing light includes a chamber and an ignition source that ionizes a gas within the chamber. The apparatus also includes at least one laser...
US-7,989,785 Gantry, particle therapy system, and method for operating a gantry
The present embodiments relate to a gantry for the beam guidance of a particle beam with at least one beam guidance element. A carrier device is rotatably...
US-7,989,784 Ion implantation apparatus and a method
A hydrogen ion implanter for the exfoliation of silicon from silicon wafers uses a large scan wheel carrying 50+ wafers around its periphery and rotating about...
US-7,989,783 Nanolithography system
A nanolithography system comprising a novel optical printing head suitable for high throughput nanolithography. This optical head enables a super-resolution...
US-7,989,782 Apparatus and method for specimen fabrication
A specimen fabricating apparatus comprises: a specimen stage, on which a specimen is placed; a charged particle beam optical system to irradiate a charged...
US-7,989,781 Detector for a UV false positive of radiation sensitive devices
Disclosed is a detector for monitoring a UV false positive from genuine X-ray positive of color developing radiation sensitive devices. A layer which can be...
US-7,989,780 UV fluorometric sensor and method for using the same
An ultraviolet (UV) fluorometric sensor measures a chemical concentration in a sample based on the measured fluorescence of the sample. The sensor includes a...
US-7,989,779 Universal door handle sanitizer device
A universal ultraviolet light sanitation device that can be mounted to existing doors and the like wherein the UV light sources are positioned for treatment of...
US-7,989,778 Charged-particle optical system with dual loading options
A charged-particle optical system (100) such as an electron microscope has a vacuum chamber (102) with a space (104) for accommodating a specific one (114) of...
US-7,989,777 Method for inspecting settling time of deflection amplifier, and method for judging failure of deflection amplifier
A method for inspecting a settling time of a deflection amplifier includes setting a settling time, performing shooting a plurality of times alternately to...
US-7,989,776 Corrective for eliminating the third-order aperture aberration and the first-order, first-degree axial,...
A corrective for eliminating the third-order aperture aberration and the first-order, first-degree axial chromatic aberration includes two correction pieces,...
US-7,989,775 Sensor systems and methods using entangled quanta
A sensor system comprises an entangled quantum generator operable to generate an entangled quanta signal including a plurality of entangled quanta. A carrier...
US-7,989,774 Radiation detector
A radiation detector includes a semiconductor element capable of detecting a radiation, a substrate on which the semiconductor element is mounted, and a...
US-7,989,773 Compact and durable encasement for a digital radiography detector
A digital radiography detector includes a housing and a radiographic image detector assembly. The housing has a first and second spaced planar members and four...
US-7,989,772 Radiation imaging apparatus, its control method, and recording medium storing program for executing the control...
To provide a radiation imaging apparatus capable of restraining the change of image qualities due to the change of sensitivities of an MIS-type photoelectric...
US-7,989,771 Pinhole SPECT camera with plural detector heads
An imaging system (10) includes at least one radiation detector unit (16) disposed adjacent a field of view (20) to detect and measure radiation from the field...
US-7,989,770 Control unit and control method for radiation source and radiation inspection system and method thereof
A radiation inspection system is disclosed. The radiation inspection system comprises: an inspection passage through which a moving object under inspection can...
US-7,989,769 In-cabinet thermal monitoring method and system
Thermographic imaging equipment is incorporated directly into cabinets housing electrical switchgear to provide for dedicated, nearly continuous monitoring of...
US-7,989,768 Scanning electron microscope
A scanning electron microscope having a charged particle beam that when in a state being irradiated toward a sample, a voltage is applied to the sample so that...
US-7,989,766 Sample inspection apparatus
A sample inspection apparatus in which a fault in a semiconductor sample can be measured and analyzed efficiently. A plurality of probes are brought into...
US-7,989,765 Method and apparatus for trapping ions
An ion trap comprising elongate rods, electrodes, a first circuit, and a second circuit. The rods are for defining the radial extent of a trapping volume. The...
US-7,989,764 Ion trap mass spectrometry method
According to an aspect of the present invention, there are provided an ion trap mass spectrometry method and an ion trap mass spectrometry device using a mass...
US-7,989,763 Electrospray systems and methods
Electrospray systems, electrospray structures, removable electrospray structures, methods of operating electrospray systems, and methods of fabricating...
US-7,989,762 Automatic cleaning of MALDI ion sources
In an ion source that generates ions by matrix-assisted laser desorption (MALDI), ion acceleration diaphragms having apertures though which ions are accelerated...
US-7,989,761 Gas analyzing method and gas analyzing apparatus
Ions obtained through EI process from a first gas are subjected to mass analysis to obtain ion intensities which are stored in a first file, and ions obtained...
US-7,989,760 Extraction detection system and method
An apparatus, system and method for the continuous flow extraction, collection and analysis of small amounts of energetic substance/s and their...
US-7,989,759 Cleaned daughter ion spectra from maldi ionization
In a mass spectrometer having an ion source in which analyte substances are ionized by matrix assisted laser desorption and form an ion beam that travels to a...
US-7,989,758 Fragmentation of ions in Kingdon ion traps
Fragment ion spectra are acquired in Kingdon ion traps that have a potential well for harmonic oscillations of the ions in the longitudinal direction and in...
US-7,989,757 Apparatus and method for wound diagnosis
A configurable scanner (1), for contactless measurement of the depth and perimeter of a wound on a target body part (9), has a scan head (4), and is configured...
US-7,989,756 Active-isolation mounts for optical elements
Disclosed are, inter alia, optical components that include an optical element (e.g., mirror) and at least three active-isolation mounts mounting the optical...
US-7,989,755 Apparatus for photon detection including a sample cell with an outer surface with a curved bottom, and a...
The object of the present invention is to acquire the brightness of NA>1 while alleviating the requirement for the precision of positioning for the...
US-7,989,754 Optical circuit and method for measuring monitor characteristic
An optical circuit includes a selector that supplies an output current from a first photodetector to a converter provided for a second photodetector, and a...
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