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Patent # Description
US-9,435,872 Labeling area determining apparatus, magnetic resonance apparatus and method for determining tilt of labeling area
A labeling area determining apparatus is provided. The labeling area determining apparatus includes a detecting device configured to detect a tilt of a head...
US-9,435,871 Magnetic resonance imaging apparatus and fluid-enhanced image acquisition method
In order to acquire an image with enhanced contrast between a fluid portion and a stationary portion without extending the imaging time even when an IR pulse is...
US-9,435,870 Methods, systems and computer programs for assessing CHD risk using adjusted HDL particle number measurements
Methods, computer program products and apparatus determine a subject's risk of having or developing CHD using a calculated HDL particle risk number and/or a...
US-9,435,869 Magnetic resonance imaging system with satellite gradient coils
The present invention relates to a magnetic resonance imaging system comprising a main magnet (102), the main magnet (102) comprising a magnet bore, the bore...
US-9,435,868 Magneto-resistive effect device, magnetic head gimbal assembly, magnetic recording/reproduction device, strain...
According to one embodiment, a magneto-resistive effect device, includes a stacked body stacked on a substrate, a pair of first electrodes that feeds current to...
US-9,435,867 Multi-bit magnetic memory cell
Apparatus includes a first Hall sensor having a first terminal, a second terminal, a third terminal and a fourth terminal and a second Hall sensor having a...
US-9,435,866 Device and method for determining deterioration of secondary battery
A secondary battery is implemented as an assembly of a plurality of battery modules. An ECU calculates a deterioration indicator quantitatively indicating a...
US-9,435,865 Method for diagnosing fault of fuel cell stack
Disclosed herein is a method for diagnosing a fault of a fuel cell stack, including: applying a summed current obtained by summing currents of different...
US-9,435,864 Apparatus for measuring excitation parameters of induction motor and method thereof
The present invention relates to the technical field of motor control, and discloses an apparatus for measuring excitation parameters of an induction motor and...
US-9,435,863 Integrated circuit testing interface on automatic test equipment
An integrated circuit (IC) testing interface capable of upgrading an automatic test equipment (ATE) for testing a semiconductor device includes at least one pin...
US-9,435,862 Integrated circuit device and method therefor
An integrated circuit device comprising at least one self-test component arranged to execute self-testing within at least one self-test structure during a...
US-9,435,861 Efficient scan latch systems and methods
Systems and methods for latches are presented. In one embodiment a system includes scan in propagation component, data propagation component, and control...
US-9,435,860 Gated state machine circuitry having three clock 2 enable states
Testing of integrated circuits is achieved by a test architecture utilizing a scan frame input shift register, a scan frame output shift register, a test...
US-9,435,859 Interposer capture shift update cell between functional and test data
The disclosure describes a novel method and apparatus for improving interposers that connected stacked die assemblies to system substrates. The improvement...
US-9,435,858 Focusing optical systems and methods for testing semiconductors
Focusing optical systems and methods for testing semiconductors are disclosed herein. The methods include receiving an image of a probe through a single optical...
US-9,435,857 Integrated circuit for switching loads, circuit arrangement comprising an integrated circuit and a connected...
An integrated circuit has a controllable switching element, the load path of which is arranged between an output of the integrated circuit and a supply...
US-9,435,856 Position adjustable probing device and probe card assembly using the same
A position adjustable probing device adapted for being mounted to a circuit board includes a frame, a probe head, a space transformer module and an elevation...
US-9,435,855 Interconnect for transmitting signals between a device and a tester
A system includes: a circuit board including electrical elements arranged at a first pitch; a wafer including contacts arranged at a second pitch, where the...
US-9,435,854 Electrical contactor and contact method for the same
An electrical contactor has a contact portion that is pressed onto a terminal of an electronic device and is electrically connected. When the dimension of the...
US-9,435,853 Socket device for an IC test
Disclosed herein is a socket device for an integrated circuit (IC) test. The device includes: a socket which is provided with a pin guide plate that can guide...
US-9,435,852 Integrated circuit (IC) test structure with monitor chain and test wires
Aspects of the present disclosure provide an integrated circuit (IC) test structure. An IC structure according to the present disclosure can include: a monitor...
US-9,435,851 Semiconductor apparatus
A semiconductor apparatus includes a command decoding unit configured to decode an internal command, an internal clock and an internal clock enable signal, and...
US-9,435,850 Apparatus and method for power cycle test
Provided are a power cycle test apparatus and a power cycle test method that can efficiently reproduce nearly a level of stress that may occur in failure mode...
US-9,435,849 Method for testing semiconductor dies and a test apparatus
A method includes: providing a test apparatus; providing an electrically conductive carrier; providing a semiconductor substrate having a first main face, a...
US-9,435,848 Chucks for supporting solar cell in hot spot testing
In an embodiment, a chuck to support a solar cell in hot spot testing is provided. This embodiment of the chuck comprises a base portion and a support portion...
US-9,435,847 Method for testing special pattern and probe card defect in wafer testing
Methods for testing a special pattern and testing a probe card defect in wafer testing are provided. In the method for testing the special pattern, a wafer is...
US-9,435,846 Testing of thru-silicon vias
A system and a method for testing thru silicon vias (TSVs) in a silicon die. A silicon die containing multiple TSVs is mounted on a wafer tape. Two probe points...
US-9,435,845 Method and apparatus for detecting an arc in a DC circuit
The disclosure relates to a method for detecting an arc in a DC circuit. The method includes measuring and analyzing an AC component (I.sub.AC) of a current (I)...
US-9,435,844 Device and method for investigating a cable system
Devices (10) support a use of investigation signals for investigating cable systems comprising cables (101) and loads (111). The loads (111) comprise rectifier...
US-9,435,843 Wire harness continuity inspection device, wire harness continuity inspection program, and wire harness...
A wire harness continuity inspection method according to the invention includes: a referring step of referring to auxiliary device-based wiring information to...
US-9,435,842 Circuit and method for detection of IC connection failure
The invention provides a testing circuit for testing a connection between a chip and external circuitry. A current source is used to inject a DC current towards...
US-9,435,841 Integrated circuit protection during high-current ESD testing
A method of protecting devices within an integrated circuit during electro-static discharge (ESD) testing using an ESD test system is provided. The method...
US-9,435,840 Determining worst-case bit patterns based upon data-dependent jitter
The patent application discloses mechanisms that, for a given channel step or edge response, bit interval, and data dependent jitter table can directly...
US-9,435,839 Discrimination of low power RF signals using phase modulation with injection locked lasers
An apparatus is provided for RF signal discrimination. A master laser of the apparatus is connected to an optical input of an optical phase modulator. The...
US-9,435,838 Dynamic multi-mode radiometer system with quantized noise injection for automated calibration and method of...
Embodiments are directed to a dynamic multi-mode radiometer system and method for automated calibration of the system. In an embodiment, the system comprises a...
US-9,435,837 Sensor and method for detecting an object
The invention relates to a sensor for detecting an object. The sensor includes a probe electrode for forming a measuring capacitance with the object to be...
US-9,435,836 Power consumption detector and motherboard as well as fan board using the same
A power consumption detector includes a first resistor, an amplification unit, a voltage divider and a processing unit. A first end of the first resistor,...
US-9,435,835 Validation of electric power system monitoring systems
The present disclosure provides systems and methods for validating electric power delivery monitoring systems, including, but not limited to, current...
US-9,435,834 Voltage monitoring circuit
A voltage monitoring circuit includes a line monitoring circuit configured to receive an AC line voltage and generate an output voltage in response to the AC...
US-9,435,833 Resistance detection for integrated circuit driver based on parasitic inductance
An IC driver includes a resistor detector to detect whether at least a threshold resistance is present between a pin of the IC driver and the gate of an IGBT....
US-9,435,832 Electronic component, in particular current sensor
The invention relates to an electronic component (1), in particular a current sensor, having a resistance element (5) made of a resistance material, a first...
US-9,435,831 Current sensor
A current sensor includes a magnetic sensor module including a plurality of magnetic sensor units connected in series. The magnetic sensor units each include a...
US-9,435,830 Implantable medical device depth estimation
A method includes applying a signal to a primary coil of an external charging device. The signal causes the primary coil to inductively couple to a secondary...
US-9,435,829 Current sensor
A current sensor includes first and second current paths each including a first conductive portion and second and third conductive portions extending in the X...
US-9,435,828 Method of reconstructing electrical probes
A probe, comprising: a shank region having a top surface integrally connected to a bottom surface of a conical region; a pyramidal tip region having a base...
US-9,435,827 Probe-connection-type pogo pin and manufacturing method thereof
The present invention relates to a pogo pin including a probe part and an elastic part, and more particularly, to a probe-connection-type pogo pin including a...
US-9,435,826 Variable spacing four-point probe pin device and method
A continuous variable spacing probe pin device, including first and second probe pins. The first and second probe pins are configured to measure a property of a...
US-9,435,825 Multi-channel probe plate for semiconductor package test systems
A test apparatus includes a multi-channel probe plate having an electrically insulating body with opposing first and second main surfaces, and a plurality of...
US-9,435,824 Circuit to extend frequency response of accelerometer
A compensation circuit connected to an accelerometer's output extends the frequency response of the accelerometer, while reducing noise produced by the...
US-9,435,823 Physical quantity sensor, electronic device, and moving object
A physical quantity sensor includes: an element piece including a movable weight and movable electrode portions which are provided to extend from the movable...
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