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Patent # Description
US-1,014,1189 Methods for forming semiconductors by diffusion
In some embodiments, a compound semiconductor is formed by diffusion of semiconductor species from a source semiconductor layer into semiconductor material in a...
US-1,014,1188 Resist having tuned interface hardmask layer for EUV exposure
A method is disclosed to prepare a substrate for photolithography. The method includes forming an underlayer over a surface of the substrate; depositing an...
US-1,014,1187 Mask pattern forming method, fine pattern forming method, and film deposition apparatus
In a mask pattern forming method, a resist film is formed over a thin film, the resist film is processed into resist patterns having a predetermined pitch by...
US-1,014,1186 Target image-capture device, extreme-ultraviolet-light generation device, and extreme-ultraviolet-light...
A target image-capture device may be configured to capture an image of a target that is made into plasma when irradiated with laser light and generates...
US-1,014,1185 Oxide semiconductor, coating liquid, method of forming oxide semiconductor film, semiconductor element, display...
An oxide semiconductor includes an oxide having a layered structure expressed by an expression of a product of [(AO)(ZO).sub.mi(BO)(ZO).sub.ni].sub.i from i=1...
US-1,014,1184 Method of producing self-supporting nitride semiconductor substrate
Crystal growth of GaN is performed on a growth layer (103a) in a state in which the main surface is set to an N-polarity, thereby forming a boule (104) made of...
US-1,014,1183 Methods of spin-on deposition of metal oxides
Techniques herein provide methods for depositing spin-on metal materials for creating metal hard mask (MHM) structures without voids in the deposition. This...
US-1,014,1182 Microelectronic systems containing embedded heat dissipation structures and methods for the fabrication thereof
Microelectronic systems having embedded heat dissipation structures are disclosed, as are methods for fabricating such microelectronic systems. In various...
US-1,014,1181 TiN pull-back and cleaning composition
The present invention relates to a novel composition that may be used to control the etching rate of TIN with respect to W, and remove any residues from the...
US-1,014,1180 Silicon wafer and method for manufacturing the same
A silicon wafer is manufactured by subjecting a silicon wafer sliced from a silicon single-crystal ingot grown by the Czochralski process to a rapid thermal...
US-1,014,1179 Fast start RF induction lamp with metallic structure
An induction RF fluorescent lamp having a bulbous vitreous portion of the induction RF fluorescent light bulb including a lamp envelope filled with a working...
US-1,014,1178 Miniature charged particle trap with elongated trapping region for mass spectrometry
A miniature electrode apparatus is disclosed for trapping charged particles, the apparatus including, along a longitudinal direction: a first end cap electrode;...
US-1,014,1177 Mass spectrometer using gastight radio frequency ion guide
The disclosure relates to a mass spectrometer, comprising (a) a vacuum recipient containing ion handling elements of the mass spectrometer, the vacuum recipient...
US-1,014,1176 Multi-reflection mass spectrometer with deceleration stage
Disclosed herein is a multi-reflection mass spectrometer comprising two ion mirrors spaced apart and opposing each other in an X direction, each mirror...
US-1,014,1175 Quasi-planar multi-reflecting time-of-flight mass spectrometer
A multi-reflecting, time-of-flight (MR-TOF) mass spectrometer including two quasi-planar electrostatic ion mirrors extended along drill direction (Z) and formed...
US-1,014,1174 Method for examining a gas by mass spectrometry and mass spectrometer
A method for examining a gas by mass spectrometry includes: ionizing the gas for producing ions; and storing, exciting and detecting at least some of the...
US-1,014,1173 Systems for separating ions and neutrals and methods of operating the same
A mass spectrometer system includes a sample injection device defining a sample injection aperture. The system also includes an ion trap defining an ion outlet...
US-1,014,1172 Synchronised variation of source conditions of an atmospheric pressure chemical ionisation mass spectrometer...
A mass spectrometer is disclosed comprising a gas chromatography separation device, an atmospheric pressure ionization ion source and a control system arranged...
US-1,014,1171 Method and kit for determining metabolites on dried blood spot samples
A method for individuating with high sensitivity and specificity ADA metabolites from dried blood spot. The method described herein can be used to extract...
US-1,014,1170 Device for mass spectrometry
A device for mass spectrometry comprises an ionization source, a mass analyzer fluidly coupled to the ionization source and an electronic data acquisition...
US-1,014,1169 Systems and methods for identifying compounds from MS/MS data without precursor ion information
Systems and methods are provided for identifying a precursor ion without using any a priori precursor ion information. In one method, a sample is analyzed using...
US-1,014,1168 Method for characterising a sample by mass spectrometry imaging
Disclosed is a method for characterizing a sample by mass spectrometry imaging (MSI) according to which a spatial arrangement of at least one ion in the sample...
US-1,014,1167 Ion sensor
An ion sensor comprises an electron repelling electrode to be placed at a negative electric potential, and an ion repelling electrode to be placed at a variable...
US-1,014,1166 Method of real time in-situ chamber condition monitoring using sensors and RF communication
Plural sensors on an interior surface of a reactor chamber are linked by respective RF communication channels to a hub inside the reactor chamber, which in turn...
US-1,014,1165 Plasma processing apparatus and sample stage thereof
There is disclosed a plasma processing apparatus for processing a wafer put on a sample stage disposed in a processing chamber within a vacuum vessel by the use...
US-1,014,1164 Plasma processing apparatus and plasma processing method
A plasma processing apparatus and a plasma processing method are provided which can sufficiently suppress an abnormal discharge in a gas space. A plasma...
US-1,014,1163 Controlling ion energy within a plasma chamber
Systems and methods controlling ion energy within a plasma chamber are described. One of the systems includes an upper electrode coupled to a sinusoidal RF...
US-1,014,1162 Plasma processing apparatus, plasma processing method, and method for manufacturing electronic device
Linear coils, a first ceramic block, and a second ceramic block are arranged in an inductively-coupled plasma torch. A chamber has an annular shape. Plasma...
US-1,014,1161 Angle control for radicals and reactive neutral ion beams
A workpiece processing apparatus allowing independent control of the extraction angles of charged ions and reactive neutrals is disclosed. The apparatus...
US-1,014,1160 Apparatus of plural charged-particle beams
A secondary projection imaging system in a multi-beam apparatus is proposed, which makes the secondary electron detection with high collection efficiency and...
US-1,014,1159 Sample observation device having a selectable acceleration voltage
A sample observation device of the invention includes: a charged particle optical column for irradiating a sample with charged particle beams at a first...
US-1,014,1157 Method for adjusting height of sample and observation system
In a device for performing observation with a charged particle microscope at an atmospheric pressure using a diaphragm, while there was a demand that a distance...
US-1,014,1156 Measurement of overlay and edge placement errors with an electron beam column array
Methods and systems for performing measurements of multiple die with an array of electron beam columns are presented herein. The wafer is scanned in a direction...
US-1,014,1155 Electron beam emitters with ruthenium coating
An emitter with a protective cap layer on an exterior surface of the emitter is disclosed. The emitter can have a diameter of 100 nm or less. The protective cap...
US-1,014,1154 Array substrate, display panel and display apparatus having the same, and fabricating method thereof
The present application discloses an array substrate comprising a first substrate, a first electrode on the first substrate, a passivation layer on a side of...
US-1,014,1153 Magnetron having enhanced cooling characteristics
Embodiments of the present disclosure generally provide magnetron configurations that provide more efficient and/or more uniform cooling characteristics and...
US-1,014,1152 Drift chamber connection methods and apparatus
Chamber connection methods and apparatus are provided. In some embodiments, a signal wire is attached to a drift chamber by feeding a signal wire through an end...
US-1,014,1151 Fuse with separating element
The invention relates to a safety device (1), comprising: a fusible member (2) having a first segment (3), a second segment (4), and a connecting segment (5),...
US-1,014,1150 High current one-piece fuse element and split body
A compact, high breaking capacity fuse that includes a top and bottom insulative layer and a single piece fusible element disposed between the top and bottom...
US-1,014,1149 Thin film fuse
A thin film fuse is formed by two substantially planar conductors, separated from each other by a thin gap. The conductors and gap are over-coated with a thin,...
US-1,014,1148 Affixed object, fusible link, and affixing structure for fusible link
A connection portion of a locking member is bent such that the connection portion is made apart from a second upper surface portion as the connection portion is...
US-1,014,1147 Touch safe panel board system
A touch safe electrical panel (100) includes a bus (110) having a branch connector (130) with a vertical stab (132) and a touch safe connection assembly (150)....
US-1,014,1146 Force-distance controlled mechanical switch
A switch comprises a first elastic element, an actuator-element mechanically coupled to a first side of the first elastic element, and a first switching...
US-1,014,1145 Relay apparatus having plurality of relays and relay system incorporating the relay apparatus
A relay apparatus incorporates at least first and second relays having respective first and second electromagnetic coils, with a single yoke partially...
US-1,014,1144 Self-powered switches and related methods
Self-powered switches include an externally accessible user input member, a switch housing attached to the user input member, a permanent magnet held in the...
US-1,014,1143 Wear-balanced electromagnetic motor control switching
One embodiment describes a method that includes in a first switching operation of an electrical power switching system including three separately controllable...
US-1,014,1142 Multiple frequency tone monitor
An apparatus for monitoring ground current includes a signal generation module that generates a plurality of AC components of different frequencies. An...
US-1,014,1141 Magnetically actuated switch
A magnetically activated switch comprises an arm member, an actuating member, and a switch. The arm member has a first magnet and the actuating member has a...
US-1,014,1140 Air circuit breaker
The present invention relates to an air circuit breaker, in which a recess is formed on one side or each of both sides of each contact plate provided in an...
US-1,014,1139 Multiple position electrical switch
An electrical switch includes a fixed upper contact, a fixed lower contact, and a mobile contact blade. A fixed support bears the mobile contact blade, and the...
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