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| United States Patent Application |
20020155265
|
| Kind Code
|
A1
|
|
CHOI, HYUNG-CHUL
;   et al.
|
October 24, 2002
|
ANTIREFLECTION FILM
Abstract
An antireflection coating comprises one or more inorganic antireflection
layers (typically metal oxide or silica layers) and a polymer layer cured
in situ, the polymer layer having a refractive index not greater than
about 1.53 over the wavelength range of 400 to 700 nm and a thickness of
from about 20 to about 200 nm. The polymer layer provides good scratch
and fingerprint protection, and also enables the thicknesses of the
inorganic antireflection layers to be reduced, thereby reducing the cost
of the coating.
| Inventors: |
CHOI, HYUNG-CHUL; (LEXINGTON, MA)
; JONES, ROBERT L.; (ANDOVER, MA)
; NAGARKAR, PRADNYA V; (NEWTON, MA)
; SMYTH, WILLIAM K; (SUDBURY, MA)
; WANG, XIAOJIA Z; (ACTON, MA)
; CHIA, YEE HO; (TROY, MI)
|
| Correspondence Address:
|
KIRKPATRICK & LOCKHART LLP
75 STATE STREET
BOSTON
MA
02109-1808
US
|
| Serial No.:
|
026271 |
| Series Code:
|
09
|
| Filed:
|
February 19, 1998 |
| Current U.S. Class: |
428/212 |
| Class at Publication: |
428/212 |
| International Class: |
B32B 031/26 |
Claims
1. An article having an antireflection film, the article comprising a
substrate carrying an inorganic antireflection layer and, in contact with
the inorganic antireflection layer and forming the outer surface of the
antireflection film, a polymer layer formed by curing a curable
composition in situ on the inorganic antireflection layer, the polymer
layer having a refractive index not greater than about 1.53 over the
wavelength range of 400 to 700 nm and a thickness of from about 20 to
about 200 nm.
2. An article according to claim 1 wherein the inorganic antireflection
layer is formed from a metal oxide.
3. An article according to claim 2 wherein the metal oxide layer comprises
at least one of indium oxide, titanium dioxide, cadmium oxide, gallium
indium oxide, niobium pentoxide, indium tin oxide and tin dioxide.
4. An article according to claim 3 wherein a single layer of metal oxide,
having a thickness of from about 10 to about 30 nm is carried by the
substrate and the polymer layer, having a thickness of from about 80 to
about 150 nm is carried by the single metal oxide layer.
5. An article according to claim 4 wherein the metal oxide layer has a
thickness of from about 17 to about 23 nm and the polymer layer has a
thickness of from about 110 to about 130 nm.
6. An article according to claim 2 comprising a first metal oxide layer
carried by the substrate; a silica layer superposed on the first metal
oxide layer; and a second metal oxide layer superposed on the silica
layer, the polymer layer being superposed on the second metal oxide
layer.
7. An article according to claim 6 wherein the first metal oxide layer has
a thickness of from about 20 to about 35 nm, the silica layer has a
thickness of from about 10 to about 25 nm, the second metal oxide layer
has a thickness of from about 50 to about 100 nm and the polymer layer
has a thickness of from about 70 to about 120 nm.
8. An article according to claim 7 wherein the first metal oxide layer has
a thickness of from about 25 to about 30 nm, the silica layer has a
thickness of from about 15 to about 20 nm, the second metal oxide layer
has a thickness of from about 65 to about 80 nm and the polymer layer has
a thickness of from about 85 to about 100 nm.
9. An article according to claim 1 wherein the inorganic antireflection
layer is formed from silica.
10. An article according to claim 9 comprising a metal oxide layer carried
by the substrate; and a silica layer superposed on the metal oxide layer,
the polymer layer being superposed on the silica layer.
11. An article according to claim 10 wherein the metal oxide layer has a
thickness of from about 10 to about 30 nm, the silica layer has a
thickness of from about 10 to about 120 nm, and the polymer layer has a
thickness of from about 50 to about 130 nm.
12. An article according to claim 11 wherein the metal oxide layer has a
thickness of from about 10 to about 20 nm, the silica layer has a
thickness of from about 10 to about 50 nm, and the polymer layer has a
thickness of from about 60 to about 100 nm.
13. An article according to claim 1 wherein the polymer layer has a
refractive index not greater than about 1.50 over the wavelength range of
400 to 700 nm.
14. An article according to claim 1 wherein the polymer layer comprises
repeating units derived from a fluoroalkene.
15. An article according to claim 1 wherein the polymer layer comprises
repeating units derived from an alkyl acrylate or methacrylate.
16. An article according to claim 1 wherein the polymer layer comprises
repeating units derived from a polyfunctional acrylate monomer.
17. An article according to claim 14 wherein the polymer layer comprises
repeating units derived from a fluoroalkene and repeating units derived
from an alkyl acrylate or methacrylate, the polymer layer having an outer
portion enriched in the alkyl acrylate or methacrylate and an inner
portion enriched in the fluoroalkene.
18. An article according to claim 1 further comprising a hard coat
disposed between the substrate and the inorganic antireflection layer.
19. A process for providing an antireflection film on a substrate, the
process comprising: depositing an inorganic antireflection layer on the
substrate; depositing a layer of a curable composition on the inorganic
antireflection layer; and effecting free radical curing of the deposited
curable composition to form a polymer layer having a thickness of from
about 20 to about 200 nm and a refractive index not greater than about
1.53 over the wavelength range of 400 to 700 nm.
20. A process according to claim 19 wherein the inorganic antireflection
layer is formed from a metal oxide.
21. A process according to claim 20 wherein the metal oxide comprises at
least one of indium oxide, titanium dioxide, cadmium oxide, gallium
indium oxide, niobium pentoxide, indium tin oxide and tin dioxide.
22. A process according to claim 20 wherein a single layer of the metal
oxide having a thickness of from about 10 to about 30 nm is deposited on
the substrate and a polymer layer having a thickness of from about 80 to
about 150 nm is formed on this single metal oxide layer.
23. A process according to claim 22 wherein the metal oxide layer has a
thickness in the range of from about 17 to about 23 nm and the polymer
layer has a thickness of from about 110 to about 130 nm.
24. A process according to claim 20 wherein a first metal oxide is
deposited on the substrate; a silica layer is deposited on the first
metal oxide layer; a second metal oxide layer is deposited on the silica
layer, and the polymer layer is formed on the second metal oxide layer.
25. A process according to claim 24 wherein the first metal oxide layer
has a thickness of from about 20 to about 35 nm, the silica layer has a
thickness of from about 10 to about 25 nm, the second metal oxide layer
has a thickness of from about 50 to about 100 nm and the polymer layer
has a thickness of from about 70 to about 120 nm.
26. A process according to claim 25 wherein the first metal oxide layer
has a thickness of from about 25 to about 30 nm, the silica layer has a
thickness of from about 15 to about 20 nm, the second metal oxide layer
has a thickness of from about 65 to about 80 nm and the polymer layer has
a thickness of from about 85 to about 100 nm.
27. A process according to claim 19 wherein the inorganic antireflection
layer is formed from silica.
28. A process according to claim 27 wherein a metal oxide layer is
deposited upon the substrate, a silica layer is deposited on the metal
oxide layer and the polymer layer is formed on the silica layer.
29. A process according to claim 28 wherein the metal oxide layer has a
thickness of from about 10 to about 30 nm, the silica layer has a
thickness of from about 10 to about 120 nm and the polymer layer has a
thickness of from about 50 to about 130 nm.
30. A process according to claim 29 wherein the metal oxide layer has a
thickness of from about 10 to about 20 nm, the silica layer has a
thickness of from about 10 to about 50 nm and the polymer layer has a
thickness of from about 60 to about 100 nm.
31. A process according to claim 19 wherein the polymer layer has a
refractive index not greater than about 1.50 over the wavelength range of
400 to 700 nm.
32. A process according to claim 19 wherein the curable composition
comprises a polymer of a fluoroalkene.
33. A process according to claim 19 wherein the curable composition
comprises a polymer of an alkyl acrylate or methacrylate.
34. A process according to claim 19 wherein the curable composition
comprises a polyfunctional acrylate monomer.
35. A process according to claim 32 wherein the curable composition
comprises both a polymer of a fluoroalkene and a polymer of an alkyl
acrylate or methacrylate, and wherein the curing causes segregation of
material within the polymer layer, thereby producing a polymer layer
having an outer portion enriched in the alkyl acrylate or methacrylate
and an inner portion enriched in the fluoroalkene.
36. A process according to claim 19 further comprising depositing a hard
coat on the substrate before the inorganic antireflection layer is
deposited thereon.
37. A process according to claim 19 wherein the curing of the curable
composition is conducted in air.
Description
BACKGROUND OF THE INVENTION
[0001] This invention relates to a process for providing an antireflection
film on a substrate, and to the article formed by this process.
[0002] It has long been known that it is advantageous to provide various
articles, for example lenses, cathode ray tubes, flat panel displays,
window films and windshields, with antireflection films which reduce the
amount of light reflected from the surface of the article and thus reduce
or eliminate "ghost" images formed by such reflected light. For example,
U.S. Pat. Nos. 5,106,671; 5,171,414 and 5,234,748 describe antireflection
films which are placed on the inside surface of automobile windshields to
reduce the intensity of the image of the instrument panel caused by light
reflected from the inside surface of the windshield.
[0003] Antireflection coatings on a substrate typically comprise a
plurality of inorganic layers, for example a metal or metal oxide layer
and a silica layer. (The term "silica" is used herein in accordance with
its normal meaning in the antireflection art to mean a material of the
formula SiO.sub.x where x is not necessarily equal to two. As those
skilled in the art are aware, such silica layers are often deposited by
chemical vacuum deposition or sputtering of silicon in an oxygen
atmosphere, so that the material deposited does not precisely conform to
the stoichiometric formula SiO.sub.2 of pure silica.) Typically, one
surface of a silica layer is exposed, and this exposed surface, which has
a high surface energy, as shown by its low contact angle with water, is
highly susceptible to fingerprints and other marks. Such marks are
extremely difficult to clean, often requiring the use of chemical
cleaners.
[0004] U.S. Pat. No. 4,765,729 (Taniguchi) describes an anti-reflection
optical article, which comprises a substrate bearing a single-layer or
multi-layer anti-reflection film having a surface film composed of an
inorganic substance, and a coating of an organic substance containing a
curing material formed on the surface of the anti-reflection film,
wherein the surface reflectance of the optical article is lower than 3%
and the stationary contact angle to water is at least 60.degree.. The
inorganic substance is preferably silica and the preferred curing
material is a silanol-terminated polysiloxane. According to this patent,
the thickness of the organic substance should be in the range of 0.0005
to 0.5 .mu.m (0.5 to 500 nm), especially 0.001 to 0.3 .mu.m (1 to 300
nm). The provision of the layer of organic substance is stated to
increase the scratch and stain resistance of the optical article.
[0005] However, this patent gives no directions for controlling the
thickness of the organic substance within the very broad range which it
suggests for such thickness, and all of the worked examples use a dip
coating technique which would lead to very thin coatings the thickness of
which would be expected to vary significantly over the surface of the
coated substrate, since the coating solution will accumulate at the
lowest point on the substrate. Furthermore, in these worked examples, a
substrate such as a lens is first provided with antireflection layers of
metal oxide and silica to a total thickness of .lambda./4 and then the
organic substance is applied by dip coating. In these circumstances,
proper antireflection properties will be obtained only if the organic
substance is very thin, less than 10 nm, so that it has essentially no
effect on the optical properties of the antireflection coating, and as
already indicated, it is difficult to achieve uniformity in such very
thin coatings.
[0006] Perhaps the most effective antireflection film available
commercially is that sold by Southwall Technologies, 1029 Corporation
Way, Palo Alto, Calif. 94303. This material comprises a 180 .mu.m
poly(ethylene terephthalate) substrate provided with an
abrasion-resistant hard coat, and then successively with a 17 nm indium
tin oxide (ITO) layer, a 23 nm silica layer, a 95 nm ITO layer, an 84 nm
silica layer and finally a thin "lubrication" layer, which is formed from
a fluoropolymer and is stated to improve the scratch resistance and the
susceptibility of the surface to marking.
[0007] This complex film possesses excellent antireflection
characteristics, but is so expensive (approximately US$10 per square
foot, US$100 m.sup.-2) as to preclude its use in many applications where
antireflection films are desirable. Much of the high cost of this film
can be attributed to the 95 nm ITO layer and 84 nm silica layer; since
these layers are typically formed by sputtering, and the cost of a
sputtered layer is directly proportional to its thickness. Furthermore,
if it is desired to produce large quantities of such a complex film on a
production line basis, the need for four separate sputtering stations,
all of which must be maintained under high vacuum, results in a complex
and costly apparatus.
[0008] It has now been found that providing a "thick" (i.e., optically
active) polymer layer of carefully controlled refractive index above an
inorganic antireflection layer or layers, the thickness(es) of the
inorganic layer(s) can be greatly reduced, thereby reducing the overall
cost of the antireflection coating, especially when the inorganic
layer(s) is/are applied by a process such as sputtering or chemical vapor
deposition in which the residence time of the substrate within the
coating apparatus is directly proportional to the thickness of the
required layer. Also, an antireflection coating using such a thick
polymer layer, which can readily be applied with good uniformity by
solution or other coating techniques, has good scratch and stain
resistance.
SUMMARY OF THE INVENTION
[0009] Accordingly, this invention provides an article having an
antireflection film. This article comprises a substrate carrying an
inorganic antireflection layer, and in contact with the antireflection
film and forming the outer surface of the antireflection film, a polymer
layer formed by curing a curable composition in situ on the inorganic
antireflection layer, the polymer layer having a refractive index not
greater than about 1.53 over the wavelength range of 400 to 700 nm and a
thickness of from about 20 to about 200 nm.
[0010] This invention also provides a process for providing an
antireflection film on a substrate. This process comprises depositing an
inorganic antireflection layer on the substrate; depositing a layer of a
curable composition on the inorganic antireflection layer; and effecting
free radical curing of the deposited curable composition to form a
polymer layer having a thickness of from about 20 to about 200 nm and a
refractive index not greater than about 1.53 over the wavelength range of
400 to 700 nm.
[0011] In the present process, the curing of the curable composition may
be effected by cross-linking of one or more polymers or oligomers, or by
polymerization of one or more monomers or oligomers, or by a combination
of both cross-linking and polymerization. Such curing techniques are
familiar to those skilled in polymer technology.
BRIEF DESCRIPTION OF THE DRAWING
[0012] The accompanying drawing shows reflectance curves for two preferred
antireflection films of the present invention prepared in the Example
below.
DETAILED DESCRIPTION OF THE INVENTION
[0013] As already indicated, the article of the present invention is
provided with an antireflection film comprising one or more inorganic
antireflection layers and an outer polymer layer. The polymer layer has a
thickness of from about 20 to about 200 nm and a refractive index not
greater than about 1.53 over the visible wavelength range of 400 to 700
nm, and is formed on the inorganic antireflection layer(s) by depositing
a layer of a curable composition and then curing this layer in situ. The
relatively thick layer of curable composition required can be applied
with good uniformity by solution coating or other conventional coating
techniques. Also, the provision of the thick polymer layer enables the
thickness, and thus the cost, of the inorganic antireflection layers to
be reduced. For example, one embodiment of the invention described below
comprises a 19 nm indium tin oxide layer, a 20 nm silica layer and an 85
nm polymer layer; as compared to the Southwall Technology antireflection
film described above, this embodiment of the invention reduces the amount
of material which needs to be sputtered per unit area of the film by
about 80 percent, thus reducing the cost of the film by more than 50
percent.
[0014] The substrate of the present article can be any material on which
an antireflection coating is desired, provided of course that the
substrate can withstand the (relatively mild) conditions needed for
deposition of the various layers and the curing of the curable
composition. The substrate may be a finished optical article, for example
a lens, the display surface of a cathode ray tube, or an automobile
windshield. However, in most cases it is preferred that the substrate be
a plastic film, typically a polyester film; the plastic film has the
antireflection coating formed thereon, and the resultant antireflection
film may be applied to, for example, a cathode ray tube, a flat panel
display, window glass or a windshield, which it is desired to provide
with antireflection characteristics. Suitable polyester films are readily
available commercially, for example the 4 to 7 mil (101 to 177 .mu.m)
poly(ethylene terephthalate) films sold under the trademark "MELINEX" by
ICI Americas Inc., Wilmington, Del.
[0015] Especially when the substrate is a plastic film, it may be provided
with coatings on one or both surfaces to improve its hardness and scratch
resistance, to improve the adhesion of the inorganic antireflection layer
to the substrate, or to provide any other desired properties, for example
filtration of ultra-violet radiation or provision of a gas and/or
moisture barrier. A hard coating on the substrate will typically have a
thickness of about 1 to about 15 .mu.m, preferably from about 2 to about
3 .mu.m, and such a hard coating may be provided by free radical
polymerization (initiated either thermally or by ultra-violet radiation)
of an appropriate polymerizable material. An especially preferred hard
coat for use in the present invention is the acrylic polymer coating sold
under the trademark "TERRAPIN" by Tekra Corporation, 6700 West Lincoln
Avenue, New Berlin, Wis. 53151.
[0016] As already indicated, the article of the present invention may
include one or more than one inorganic antireflection layers. These
layers may be formed from any of the inorganic materials hitherto used in
antireflection coatings. The preferred materials for forming the
inorganic antireflection layer on which the curable composition is
deposited are metal oxides and silica layer. Preferred metal oxides are
indium oxide, titanium dioxide, cadmium oxide, gallium indium oxide,
niobium pentoxide, indium tin oxide and tin dioxide, with indium tin
oxide being especially preferred.
[0017] As will be apparent to those skilled in thin film optics and the
design of antireflection coatings, the thicknesses of the inorganic
antireflection layer(s) and the polymer layer in the present article
should be correlated so that the total thickness of these layers is
approximately .lambda./4 of the center of the wavelength range for which
antireflection characteristics are desired, e.g., the total thickness
should be approximately 135-145 nm when antireflection characteristics
are desired over the entire visible range of 400 to 700 nm. Also, the
thicknesses of the inorganic antireflection layer(s) and the polymer
layer can be adjusted relative to one another to produce minimum
reflectivity from the composite film.
[0018] In one preferred article of the present invention having a metal
oxide layer in contact with the polymer layer, this metal oxide layer is
the sole inorganic antireflection layer and has a thickness of about 10
to about 30 nm, desirably about 17 to about 23 nm, while the accompanying
polymer layer has a thickness of about 80 to about 150 nm, desirably
about 110 to about 130 nm. This preferred article combines low production
cost with good antireflection properties.
[0019] A second preferred article of the present invention having a metal
oxide layer in contact with the polymer layer comprises a first metal
oxide layer, a silica layer superposed over the first metal oxide layer,
and a second metal oxide layer superposed on the silica layer, the
polymer layer being superposed on the second metal oxide layer. In this
structure, the first metal oxide layer desirably has a thickness of from
about 20 to about 35 nm, preferably about 25 to 30 nm, the silica layer
desirably has a thickness of from about 10 to about 25 nm, preferably
about 15 to about 20 nm, the second metal oxide layer desirably has a
thickness of from about 50 to about 100 nm, preferably about 65 to about
80 nm, and the polymer layer desirably has a thickness of from about 70
to about 120 nm, preferably about 85 to about 100 nm. This preferred
three inorganic layer structure provides antireflection performance
substantially equal to that of the Southwall Technology four inorganic
layer structure discussed above, while still providing a substantial
reduction in production costs, since the thick silica layer and the thin
lubrication layer of the four inorganic layer structure are eliminated.
[0020] When the inorganic layer in contact with the polymer layer is a
silica layer, a preferred article of the invention comprises a metal
oxide layer on the substrate and a silica layer superposed on the metal
oxide layer, the polymer layer being superposed on the silica layer. In
such a two inorganic layer structure, desirably the metal oxide layer has
a thickness of from about 10 to about 30 nm, preferably about 10 to about
20 nm, the silica layer desirably has a thickness of from about 10 to
about 120 nm, preferably about 10 to about 50 nm, and the polymer layer
desirably has a thickness of from about 50 to about 130 nm, preferably
about 60 to about 100 nm.
[0021] Although other techniques, for example e-beam and thermal
evaporation may be employed to deposit the inorganic layers of the
present article, these layers are preferably deposited by sputtering or
by chemical vapor deposition, with dc sputtering being especially
preferred, although RF, magnetron and reactive sputtering and
low-pressure, plasma-enhanced and laser-enhanced chemical vapor
deposition may also be used. When the preferred plastic film substrates
are used, the deposition of each of these layers should of course be
effected at a temperature which does not cause damage to the plastic
substrate; this temperature limit of course varies with the exact plastic
substrate employed.
[0022] As already indicated, the polymer layer of the present
antireflection coating has a refractive index not greater than about 1.53
over the wavelength range of 400 to 700 nm and a thickness of from about
20 to about 200 nm. The preferred thickness range for this layer is about
50 to about 130 nm, preferably about 60 to about 100 nm. Polymer layers
having thicknesses within these ranges are readily prepared by depositing
a solution of an appropriate curable material in an organic solvent using
conventional solution coating techniques, for example slot coating,
removing the solvent and curing the resultant layer of curable material.
[0023] It is desirable to keep the refractive index of the polymer layer
as low as possible consistent with other acceptable properties for this
layer, especially hardness and scratch and stain resistance. The polymer
should also be resistant to cleaning solvents which may be used on the
film, for example ethyl alcohol, aqueous ammonia, acetone, gasoline and
isopropanol, and food and cosmetic items, for example peanut butter and
lipstick with which it may come into contact. Finally, the polymer should
also have good durability, as measured, for example by its ability to
withstand rubbing with steel wool. Desirably, the polymer layer has a
refractive index below about 1.50 over the entire visible range of 400 to
700 nm. To provide a suitably low refractive index, the curable
composition used to form the polymer layers desirably comprises a polymer
of a fluoroalkene, for example poly(vinylidene fluoride) or a vinylidene
fluoride/tetrafluoroethylene copolymer, such as the material sold under
the trademark "KYNAR" by San Diego Plastics, Inc., 2220 McKinley Avenue,
National City, Calif. 91950. However, since a polymer layer consisting
only of a fluoroalkene polymer will typically be too soft to give good
scratch protection, it is also desirable that the curable composition
include an alkyl acrylate or methacrylate polymer, such as the material
sold under the trademark "ELVACITE 2041" by ICI Acrylics, Inc., 3411
Silverside Road-McKean 2nd, Wilmington, Del. 19850-5391, or that sold
under the trademark "ACRYLOID A21" by Rohm and Haas, 100 Independence
Mall West, Philadelphia, Pa. 19106-2399. To promote cross-linking within
the polymer layer, and thus increase the hardness of this layer, it is
advantageous to include a polyfunctional acrylate monomer
("polyfunctional" being used herein in its conventional sense to denote a
material having a functionality of 3 or higher) in the curable
composition; a specific preferred polyfunctional acrylate monomer is that
sold under the trademark "SR 399" by Sartomer, Inc., 502 Thomas Jones
Way, Exton, Pa. 19341; this material is stated by the manufacturer to be
dipentaerythritol pentaacrylate.
[0024] It is well known to those skilled in polymer science that most
polymers have a negative dispersion with the visible range, i.e., their
refractive index at 700 nm is smaller than their refractive index at 400
nm. Calculations show that such negative dispersion adversely affects the
antireflection properties of the film and hence it is desirable to reduce
such negative dispersion as far as possible. The aforementioned KYNAR
polymer has a low refractive index and small negative dispersion, which
render it very suitable for use in the present curable composition. While
the desirability of a fluoroalkene polymer to provide low refractive
index in the polymer layer and for an acrylate or methacrylate
cross-linker to provide hardness in the same layer might suggest that the
properties of the polymer layer must inevitably involve a compromise
between the two properties, it has been found that, if the formulation of
the curable composition is carefully chosen, segregation of material
occurs spontaneously during curing, resulting in a polymer layer having
an outer portion enriched in the acrylate or methacrylate polymer (and
thus of enhanced hardness) and an inner portion enriched in the
fluoroalkene polymer (and thus of reduced refractive index). An
additional benefit of such segregation of acrylate or methacrylate
polymer material during curing is that it enables the cross-linking to
occur in an oxygen-containing atmosphere, such as air, thereby avoiding
the need for a nitrogen blanket as is customary during thin film
ultra-violet curing, and thus reducing the cost of manufacture of the
antireflection film.
[0025] The curable composition may be cured by any conventional method,
but is desirably cured by a free radical curing, which may be initiated
either thermally or by ultra-violet radiation, although the latter is
generally preferred. Persons skilled in polymer technology will be
familiar with appropriate initiators, oxygen scavengers and other
components useful in such free radical curing. However, it should be
noted that, because of the extreme thinness of the polymer layer desired
in the present process, the type and proportion of initiator(s) required
may differ from typical formulations intended for production of thicker
polymer layers.
[0026] Preferred embodiments of the present invention will now be
described, though by way of illustration only, to show preferred
reagents, conditions and techniques used in the present process.
EXAMPLE 1
[0027] In the preferred process, a 4 mil (101 .mu.m) poly(ethylene
terephthalate) film was solvent coated on one surface with the
aforementioned TERRAPIN acrylic polymer coating, the solvent was allowed
to evaporate and the film was placed under an ultra-violet lamp to cure
the polymer. The coated surface of the film was then coated by direct
current sputtering (chemical vapor deposition may alternatively be used)
with a 19 nm layer of indium tin oxide and then with a 20 nm layer of
silica.
[0028] A liquid curable composition was then prepared having the following
composition (the proportions are by dry weight of the solution):
1
% by weight
Poly(vinylidene
fluoride) (KYNAR) 46.8
Methyl methacrylate (ACRYLOID A21) 6.9
Dipentaerythritol pentaacrylate (Sartomer SR 399) 30.7
Multifunctional acrylate monomer (Sartomer CD9051) 3.0
Coating
additive (COATOSIL 3503.sup.1) 4.0
Adhesion promoter (SILANE
A174.sup.1) 1.0
Curing initiator (DARACURE 1173.sup.2) 2.0
Curing initiator (QUANTACURE BMS.sup.3) 4.0
Oxygen scavenger
(DIDMA.sup.4) 1.6
Notes:
.sup.1Both available from
OSi Specialties, 39 Old Ridgebury Road, Danbury, Connecticut 06810-5121.
.sup.2Available from Ciba-Geigy Corporation, 540 White Plains
Road, P.O. Box 2005, Tarrytown, New York 10591-9005.
.sup.3Manufactured by Great Lakes Chemical Corporation, and available
from Biddle Sawyer Corporation, 2 Penn Plaza, New York, New York 10121.
.sup.4Available from Aldrich Chemical Company, 1001 West St. Paul.
Milwaukee, Wisconsin 53233.
[0029] The various components were prepared as stock solutions in methyl
ethyl ketone (MEK), at 20 percent w/w, except that the ACRYLOID A21 and
QUANTACURE BMS were prepared at 10 percent w/w, and the DARACURE and
DIDMA were prepared at 5 percent w/w. The requisite quantities of the
various stock solutions were then mixed, together with sufficient
additional MEK to give 2000 g of a coating solution containing 2.75
percent solids w/w. This coating solution was then coated via a slot
coater on to the film bearing the metal oxide and silica layers, the
solvent allowed to evaporate and the film placed under an ultra-violet
lamp to produce a polymer coating approximately 85 nm thick.
[0030] The resultant antireflection article of the present invention had a
low surface reflection, and exhibited good resistance to scratching with
steel wool or fingerprinting. The article had a contact angle with water
of approximately 89.degree., in contrast to the contact angle of
14-26.degree. for a bare silica surface with no polymer coating.
EXAMPLE 2
[0031] Example 1 was repeated, except that only a 20 nm layer of indium
tin oxide was deposited on the substrate (provided with the hard coat)
and that the thickness of the polymer layer formed was 120 nm.
EXAMPLE 3
[0032] Example 1 was repeated, except that there were deposited
successively on the substrate (provided with the hard coat) a 27.5 nm
layer of indium tin oxide, a 17.5 nm layer of silica, a 73 nm layer of
indium tin oxide, and a 94 nm layer of the same polymer as in Example 1.
[0033] The accompanying drawing shows reflectance curves for two preferred
films of the invention:
[0034] Curve A: A two inorganic layer structure prepared in the same
manner as in Example 1 but having a 19 nm indium tin oxide layer, a 40 nm
silica layer and an 82.5 nm polymer layer.
[0035] Curve B: The film prepared in Example 3 above.
[0036] From these Curves, it will be seen that both films displayed very
good antireflection characteristics, with the more expensive three
inorganic layer film of Example 3 displaying a reflectance below 1.5
percent over the range of 450-700 nm. (Later experiments with similar
films have produced reflectance as low as 0.8 percent over this
wavelength range.) The p
hotopic reflectance value for Curve A (measured
according to CIE 1931, which specifies a weighted average of the
reflectance over the spectral range of 450 to 650 nm centered at 550 nm
and weighted mostly highly at this wavelength) was 0.609 percent, while
the corresponding value for Curve B was 0.085 percent. (The 40 nm silica
layer used in the film which produced Curve A minimized the p
hotopic
reflectance value of the film. However, decreasing the thickness of the
silica layer to 20 nm only increases this value only to 0.610 percent,
and the cost reduction associated with the reduced silica thickness is
such that in practice the 20 nm thickness used in Example 1 is
preferred.)
[0037] It will be apparent to those skilled in the relevant art that
numerous changes and modifications can be made in the preferred
embodiment of the invention described above without departing from the
scope of the invention. For example, the metal oxide layer might be
replaced by a layer of a different material which can bond to and form an
antireflection coating with silica. The polymer layer described above
could then be formed on the silica surface in the manner already
described.
* * * * *