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| United States Patent Application |
20070211308
|
| Kind Code
|
A1
|
|
Green; Lawrence R.
|
September 13, 2007
|
IMAGE SENSOR OPTIMIZATION
Abstract
A method and apparatus are described for image sensor optimization.
According to an embodiment of the invention, a method comprises capturing
an image with an image sensor, the image sensor comprising a plurality of
pixels; obtaining an output relating to the image from a first pixel of
the plurality of pixels; and normalizing the output from the first pixel
to correlate with photon flux striking the image sensor.
| Inventors: |
Green; Lawrence R.; (Tacoma, WA)
|
| Correspondence Address:
|
FAEGRE & BENSON LLP;PATENT DOCKETING
2200 WELLS FARGO CENTER
90 SOUTH SEVENTH STREET
MINNEAPOLIS
MN
55402-3901
US
|
| Serial No.:
|
373408 |
| Series Code:
|
10
|
| Filed:
|
February 24, 2003 |
| Current U.S. Class: |
358/474; 348/E9.01; 358/1.15; 358/302 |
| Class at Publication: |
358/474; 358/302; 358/001.15 |
| International Class: |
G06F 3/12 20060101 G06F003/12 |
Claims
1. A method comprising: (a) capturing an image with an image sensor, the
image sensor comprising a plurality of pixels; (b) obtaining an output
relating to the image from a first pixel of the plurality of pixels,
wherein the first pixel is included within a sector of the array, the
sector containing a plurality of pixels; and (c) normalizing the output
from the first pixel to correlate with photon flux striking the image
sensor, wherein normalizing the output from the first pixel comprises:
(i) obtaining an output from each pixel in the sector; (ii) determining
an average output value for each type of pixel in the sector; (iii)
determining which of the average output values for the pixels in the
sector is the highest; and (iv) assigning the highest average output
value to each of the pixels in the sector.
2. The method of claim 1, wherein normalizing the output from the first
pixel comprises: determining a normalization factor for the first pixel;
and converting the output of the first pixel to a p
hoton flux value for
the first pixel using the normalization factor.
3. The method of claim 2, wherein the normalization factor for the first
pixel is based at least in part on the wavelength of light striking the
first pixel.
4. The method of claim 3, wherein the image sensor includes a first
filter, the first pixel being associated with the first filter, and
wherein the normalization factor for the first pixel is based at least in
part on a color of the first filter.
5. The method of claim 4, further comprising calibrating the normalization
factor prior to capturing the image.
6. The method of claim 5, wherein calibration of the normalization factor
for the first pixel includes: directing a light on the first pixel, a
wavelength and an intensity of the light being known; capturing an image
of the light using the image sensor; obtaining data from the first pixel
relating to the image of the light; comparing the data from the image
sensor to an expected value for the light; and calculating the
normalization factors based at least in part on the comparison of the
data from the first pixel with the expected value for the light.
7. (canceled)
8. The method of claim 1, wherein the type of each pixel is based at least
in part on a color of a filter for each pixel.
9. The method of claim 1, wherein the image sensor is a complementary
metal oxide semiconductor (CMOS) image sensor.
10. The method of claim 9, wherein the image sensor is a color image
sensor.
11. The method of claim 10, further comprising producing an image based on
a normalized output for each pixel in the plurality of pixels.
12. The method of claim 11, wherein the image is a monochrome image.
13. The method of claim 1, wherein the image sensor comprises a lens to
increase light incident on the first pixel.
14. An imaging system comprising: (a) an image sensor, the image sensor
comprising an array, the array comprising a plurality of pixels, each
pixel in the array producing an output, wherein the array includes a
first sector comprising a portion of the array, the first sector
including two or more of the pixels in the plurality of pixels; and (b) a
processor to normalize the outputs of the plurality of pixels to
correlate with photon flux striking the image sensor, wherein normalizing
the outputs of the plurality of pixels comprises: (i) obtaining an output
from each pixel in the sector; (ii) determining the average value for
each type of pixel in the sector; and (iii) assigning the highest average
value to each of the pixels in the sector.
15. The imaging system of claim 14, further comprising a memory, the
memory including a plurality of normalization factors for the image
sensor, the processor using the normalization factors to normalize the
outputs of the plurality of pixels.
16. The imaging system of claim 15, wherein the plurality of normalization
factors are based at least in part on the wavelength of light striking
the image sensor.
17. (canceled)
18. The imaging system of claim 14, wherein the type of each pixel is
based at least in part on a color of a filter for each pixel.
19. The imaging system of claim 14, wherein the image sensor is
complementary metal oxide semiconductor (CMOS) image sensor.
20. The imaging system of claim 19, wherein the image sensor is a color
image sensor.
21. The imaging system of claim 14, wherein the image sensor comprises a
plurality of lenses to increase light incident on the plurality of
pixels.
22. A machine-readable medium having stored thereon data representing
sequences of instructions that, when executed by a processor, cause the
processor to perform operations comprising: (a) capturing an image with
an image sensor, the image sensor comprising a plurality of pixels; (b)
obtaining an output relating to the image from a first pixel of the
plurality of pixels wherein the first pixel is included within a sector
of the array, the sector containing a plurality of pixels; and (c)
normalizing the output from the first pixel to correlate with photon flux
striking the image sensor, herein normalizing the output from the first
pixel comprises: (i) obtaining an output from each pixel in the sector;
(ii) determining an average output value for each type of pixel in the
sector; (iii) determining which of the average output values for the
pixels in the sector is the highest; and (iv) assigning the highest
average output value to each of the pixels in the sector.
23. The medium of claim 22, wherein normalizing the output from the first
pixel comprises: determining a normalization factor for the first pixel;
and converting the output of the first pixel to a photon flux value for
the first pixel using the normalization factor.
24. The medium of claim 23, wherein the normalization factor for the first
pixel is based at least in part on the wavelength of light striking the
first pixel.
25. The medium of claim 24, wherein the image sensor includes a first
filter, the first pixel being associated with the first filter, and
wherein the normalization factor for the first pixel is based at least in
part on a color of the first filter.
26. The medium of claim 25, further comprising instructions that, when
executed by the processor, cause the processor to perform operations
comprising calibrating the normalization factor prior to capturing the
image.
27. The medium of claim 26, wherein calibration of the normalization
factor for the first pixel includes: directing a light on the first
pixel, a wavelength and an intensity of the light being known; capturing
an image of the light using the image sensor; obtaining data from the
first pixel relating to the image of the light; comparing the data from
the image sensor to an expected value for the light; and calculating the
normalization factors based at least in part on the comparison of the
data from the first pixel with the expected value for the light.
28. (canceled)
29. The medium of claim 22, wherein the type of each pixel is based at
least in part on a color of a filter for each pixel.
30. The medium of claim 22, wherein the image sensor is a complementary
metal oxide semiconductor (CMOS) image sensor.
31. The medium of claim 30, wherein the image sensor is a color image
sensor.
32. The medium of claim 31, further comprising instructions that, when
executed by the processor, cause the processor to perform operations
comprising producing an image based on a normalized output for each pixel
in the plurality of pixels.
33. The medium of claim 32, wherein the image is a monochrome image.
34. The medium of claim 22, wherein the image sensor comprises a lens to
increase light incident on the first pixel.
35. An imaging system comprising: (a) means for capturing an image with an
image sensor, the image sensor comprising a plurality of pixels; (b)
means for obtaining an output relating to the image from each of the
plurality of pixels; (c) means for normalizing the output from each pixel
in the plurality of pixels to correlate with photon flux incident on the
image sensor, wherein the means for normalizing the output from each
pixel in the plurality of pixels comprises: (i) means for determining an
output for each pixel in a sector of the image sensor the sector
including two or more of the plurality of pixels (ii) means for
determining an average output for each type of pixel in the sector; (iii)
means for comparing the average output for each type of pixel in the
sector and for determining which of the average outputs is highest; and
(iv) means for assigning the highest average output to each of the pixels
in the sector.
36. The imaging system of claim 35, wherein the means for normalizing the
output from each pixel in the plurality of pixels comprises: means for
determining a normalization factor for each pixel in the plurality of
pixels; and means for converting the output for each pixel using the
normalization factor for the pixel.
37. The imaging system of claim 36, further comprising means for
calibrating the normalization factors for the plurality of pixels.
38. (canceled)
Description
FIELD OF THE INVENTION
[0001] The invention relates generally to the field of imaging. More
particularly, the invention relates to image sensor optimization.
BACKGROUND
[0002] In addition to other uses, optical image sensors are used, like
traditional camera film, for analytical purposes. Among possible analytic
uses for image sensors is the evaluation and characterization of light
interactions between one or more substances on a surface or in a reaction
vessel. Light emitted by the object of interest or absorbed by the object
when a beam of light passes through it can be detected and quantified.
Subjects of analysis may include microarray analysis in which molecules
are attached to a matrix. Additional details regarding analysis using
microarrays are disclosed in U.S. patent application Ser. No. ______, by
Lawrence R. Green, entitled "Translucent Solid Matrix Assay Device For
Microarray Analysis" and filed on Feb. 24, 2003, the entire contents of
which are incorporated herein by reference.
[0003] Complementary metal oxide semiconductor (CMOS) image sensors are
used in digital cameras and are increasingly found in a variety of
analytic instruments. CMOS image sensors are improving in quality and are
challenging and replacing charge-coupled device (CCD) imagers for
detecting low level spectral images.
[0004] Most modern light detectors are designed to capture a spectral
signal by presenting a two-dimensional array of sensitive photodiodes
towards a target. The photodiodes are designed to produce current when
exposed to light, and the resulting current may be analyzed in various
ways. Modern sensors convert the analog photodiode signal to a digital
signal format that may then be stored and processed for later analysis.
[0005] Image sensors are often sensitive and responsive, acting to
minimize background noise and interference. Image sensors are capable of
accurately recording data regarding light striking the photodiode array
of the sensor. High-resolution digital pictures may be produced pixel by
pixel with an appropriate source of light, an optical system, an image
sensor, and a computer. Using such a system, photographic pictures may be
obtained in either monochromatic or color formats.
[0006] However, a photodiode will produce an analog output signal that
correlates with the energy striking the photodiode array only in special
circumstances, such as when the target is illuminated by monochromatic
light at a particular wavelength. Even though the output signal of a
photodiode is essentially linear with respect to the illumination applied
to the photodiode, the signal value for a pixel does not generally
correlate accurately with the photon flux. This is because the quantum
efficiency (QE) for converting the photon flux to a photodiode electrical
energy varies with certain factors. In addition, in most cases more than
a single wavelength of light will strike a photodiode.
[0007] Every photodiode has a certain QE factor that will vary with
factors such as wavelength and temperature. Photon flux represents the
electromagnetic energy striking the surface of a two-dimensional array,
and the QE represents the capability of the photodiode to convert that
energy into electrical energy. QE is usually expressed as a percentage of
the energy flux, equaling some percentage less than 100 percent. Because
QE varies greatly with the wavelength of light illuminating a photodiode,
comparisons of a signal at one wavelength to that at another are
difficult to interpret unless the QE factors are known for all
wavelengths that apply.
[0008] Further, most image sensors are designed by manufacturers to
produce images that approximate the equivalent of what would be seen on a
film or by the human eye. Manufacturers are interested in reproducing
"life-like" pictures and colors. Manufacturers may provide access to the
raw digital information for every pixel, but image sensors generally
process that information before it is available for analysis to better
render the "life-like" colors and intensities that represent human visual
expectations.
[0009] For these reasons, the data produced by an image sensor generally
does not directly relate to the photon flux that impinges upon the
photodiode array of the sensor. This factor limits the usefulness of
image sensors for analytic purposes.
BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWINGS
[0010] The present invention is illustrated by way of example, and not by
way of limitation, in the figures of the accompanying drawings in which
like reference numerals refer to similar elements, and in which:
[0011] FIG. 1 is an illustration of a CMOS image sensor;
[0012] FIG. 2 is an illustration of a Bayer color filter mosaic array;
[0013] FIG. 3 is an illustration of possible filter arrangements for an
image sensor;
[0014] FIG. 4 is an illustration of microlens operation in an image
sensor;
[0015] FIG. 5 is a graph of quantum efficiency of an exemplary image
sensor;
[0016] FIG. 6 is a flow chart illustrating an embodiment of correction of
QE factors;
[0017] FIG. 7 is a flow chart illustrating an embodiment of calibration
for image sensor optimization;
[0018] FIG. 8 is a flow chart illustrating an embodiment of image sensor
optimization;
[0019] FIG. 9 is a block diagram illustrating an exemplary computer that
may be utilized in connection with an embodiment of the invention; and
[0020] FIG. 10 is an illustration of light scattering detection.
DESCRIPTION OF ILLUSTRATIVE EMBODIMENTS
Definitions
[0021] Before describing an exemplary environment in which various
embodiments of the present invention may be implemented, some terms that
will be used throughout this application will briefly be defined. Terms
that are not otherwise defined herein are used in accordance with their
plain and ordinary meaning.
[0022] As used herein, "a" or "an" may mean one or more than one of an
item.
[0023] As used herein, "quantum efficiency" means the fraction of light or
photon flux that is utilized or contributes to current or signal output
for an imaging device.
[0024] As used herein, "image sensor", "imaging device", or "imager" means
a device for capturing an image. The term includes, but is not limited
to, a CMOS (complementary metal oxide semiconductor) image sensor and a
CCD (charge-coupled device) imager.
[0025] As used herein, "photon flux" means the energy of photons striking
a surface, including the surface of an image sensor. The energy striking
a surface may be measured in watts per cm.sup.2 and correlates with the
number of photons striking a unit area over a given period of time.
Analysis Using Image Sensors
[0026] When used for analytic purposes, the accuracy of an image sensor in
accurately detecting and recording the photon flux striking the image
sensor is of extreme importance. The use of the image sensor to produce
visually pleasing results is not important for analysis, but this is a
design factor of modern image sensors that may be used for analytic
purpose. Under an embodiment of the invention, signals generated by an
image sensor as a result of light striking the image sensor are optimized
to produce data that more closely represents the actual p
hoton flux. The
outputs of pixels of the image sensor are normalized to correlate with
photon flux.
Image Sensor Operation
[0027] Investigators using a photodiode detector may incorrectly assume
that the digital data acquired from the detector correlates with the
photon flux striking the detector because increases in the intensity of
the signal out will generally directly correlate with increases in signal
input in a particular wavelength or band-width. Because photodiodes are
very linear in output, increases in the photon flux at different
wavelengths over the photodiode surface will, over the photodiode's
dynamic range, produce a linear output signal. However, the output data
will not correlate with the photon flux if the QE is variable over the
range of wavelengths that are striking the photodiode. For a particular
number of photons striking a photodiode over a time period, a larger
current will be produced by the photodiode at a first wavelength than a
second wavelength if the QE for the photodiode is higher for the first
wavelength than the second wavelength.
[0028] Restricting a light source for analysis to a narrow band by
filtering or by using a laser light source generally will not resolve
accuracy issues. Emission spectra that are evaluated using image sensors
may be very broad even if the excitation source has a narrow wavelength
range. For this reason, the shape of the QE curve for a photodiode should
be carefully considered in evaluating output data from an image sensor.
[0029] With regard to the choice of image sensors, CMOS imager sensors are
fundamentally different from charge-coupled devices and are increasingly
used in microscopy and diagnostic instruments because they are cheaper to
build and require considerably less power to operate. CCD cameras are no
longer clearly superior in low intensity light situations, which had been
true in the past.
[0030] CMOS images now rival traditional color imaging methods on film and
are easily manipulated. The images may be transferred from one processor
to another as a digital file in a variety of formats preserving the
arrayed data pixel address. Manufacturers have devoted considerable
energy reproducing "life-like" color image sensors using various color
filters and interpolation methods to enhance a digital image rendering
colors very close to the human eye experience. However, the pleasing
"life-like" color pictures obtained with a color CMOS image sensor are
not as useful for analytic procedures. Similar issues exist with
monochromatic images unless the image is produced by light at single
wavelength, which is rarely true.
[0031] FIG. 1 is a simplified illustration of an example of a color CMOS
image sensor that may be utilized in connection with an embodiment of the
invention. Not all components and features of CMOS imagers are
illustrated. FIG. 1 and the remaining figures below are for illustration
and are not necessarily drawn to scale. In FIG. 1, an image sensor 100
includes an imaging array 110. The imaging array is comprised of a large
number of pixels arranged in a two-dimensional array. As shown in the
magnified pixel array 120 of a particular area of the array 120, there is
a filter associated with each of the pixels in the imaging array 110. The
image sensor 100 will also generally contain electronics relating to the
processing and transmission of signals generated by the imaging array
110, including analog signal processing 140, analog to digital conversion
150, and digital logic 160.
[0032] The photodiode array in a CMOS color image sensor is blanketed by
an ordered thin layer of polymeric filters, such as in a conventional
Bayer RGB (red-green-blue) two-dimensional array. Each filter is sized to
fit over an individual photodiode in a sequential (Bayer) pattern to
capture color information from a broad bandwidth of incident
illumination. In an RGB array, a heavy emphasis is placed on the green
filters to address the human visual maximal response at 550 nm. There are
2 green filters for every red and for every blue filter. However, even
though the human eye is more attuned to the green 550 nm region, yellow
is generally a better choice with regards to QE factor.
[0033] CMOS image sensors and the integrated circuits that define the
active pixel array are inherently monochromatic (black and white) devices
that respond only to the total number of electrons striking the
photodiodes, not to the color of light. Color is detected either by
passing the light through a sequential series of filters (such as red,
green, and blue filters), or with miniature transparent polymeric
thin-film filters that are deposited over the pixel array.
[0034] Active pixel sensor (APS) technology is the most popular design for
CMOS image detectors. In addition to a photodiode, each pixel (or imaging
element) includes a triad of transistors on its surface that convert
accumulated electron charge to a measurable voltage, reset the
photodiode, and transfer voltage to a vertical column bus. The photodiode
thus occupies only a fraction of the pixel area. The photodiode area
encompasses an area equal to 30 to 80 percent of the total pixel area for
most CMOS sensors. This area occupied by the photodiode is the area that
absorbs photons, while the other parts of the pixel are relatively
opaque, blocking, reflecting, or absorbing light. The photodiode area or
window is referred to as the "aperture" or "fill factor" of the pixel or
image sensor. A small aperture or fill factor results in a significant
loss of sensitivity and a corresponding reduction in the signal to noise
ratio and leads to a reduction in the dynamic range of the sensor.
[0035] CMOS image sensors can be utilized to produce pictures based upon
the signals produced when photons strike the photodiode surface
associated with each pixel in an active pixel sensor array. The pixel
signals are processed to form the total picture either in monochrome
(black and white) or color.
[0036] Monochrome CMOS imager sensors do not have color filters over the
photodiode portion of the pixel. However, color CMOS imagers, even with
standard Bayer pattern filters, generally are more sensitive than
monochromatic CMOS imagers. While it may appear that inherently
monochromatic CMOS photodiode without filters would be more sensitive
because some light passing through a filter is absorbed and never reaches
the photodiode in a color filtered photodiode, this is not generally
true. This assumption does not fully take into account the effect a
filter has on the QE for a photodiode, which might enhance certain
signals, and ignores the advantages provided by microlenses in color
photodiode architecture, which are described below. Monochromatic CMOS
image sensors do not have a color filter and they do not normally have a
microlenses over each pixel. These are important factors that make
monochromatic imagers less attractive than color CMOS image sensors with
regard to imager sensitivity.
[0037] FIG. 2 illustrates a small section of an imaging array of a color
image sensor that may be utilized in connection with an embodiment of the
invention. The illustrated section repeats throughout the imaging array.
The section 200 is comprised of four pixels, each having a filter. The
filters 220-250 have colors based on the choices made for the array.
Below the filters 210 illustrates the structure of the individual pixels.
For each pixel, such as pixel 260, there is a portion that comprises the
photodiode 270, the area of the photodiode being only a fraction of the
total area. The image sensor will detect only the portion of the light
falling on the photodiode area.
[0038] In color imagers used in analysis, one possible approach would be
to construct imagers by carefully selecting filters and photodiodes to
produce QE factors for a given bandwidth that is approximately constant.
By combining an appropriate number of photodiodes in an array with chosen
filters, the measurement of light energy would be more accurate. The
filters chosen could assist in leveling and improving upon the QE
factors. However, in practice the filters and photodiodes are chosen for
other purposes, with a goal of producing the most visually pleasing
images. In order to improve upon the quantum efficiency and spectral
response, several CMOS manufacturers use color filter arrays based on the
primary subtractive colors, cyan, magenta, and yellow (CMY), instead of
the standard additive primaries red, green, and blue (RGB). CMOS image
manufacturers generally use either Bayer RGB or Bayer CMY patterns that
have been selected for photographic imaging.
[0039] FIG. 3 is an illustration of RGB and CMY filters. For these
filters, an imaging array is divided into small arrays of filters, with
each such array of filters having the same filter pattern. An RBG filter
array 300 contains two-by-two arrays of filters, with each array
containing a red filter and a blue filter for two diagonal pixels and two
green filters for the remaining two diagonal pixels. A CMY filter array
300 also contains two-by-two arrays of filters, with each array
containing a cyan filter and a magenta filter for two diagonal pixels and
two yellow filters for the remaining two diagonal pixels. While the
illustrated filters are the most common filter arrangements, many other
filter colors and patterns are possible, and any filter pattern may be
used in conjunction with an embodiment of the invention. Certain other
alternative filter patterns that provide benefits in certain wavelength
ranges are shown in Table 1.
TABLE-US-00001
TABLE 1
Alterative Color Filters for a CMOS Color Imager
Wavelength Range (nm) Filter Type Modified Bayer Pattern
510-810 Yellow Y, Y, Y, Y
610-810 Magenta M, M, M, M
490-550 Cyan C, C, C, C
490-810 Yellow, Cyan Y, Y, Y, C
350-550 None Monochrome pattern
[0040] In contrast to monochrome image sensors, color CMOS image sensors
also contain microlenses that effectively direct photons to the
photodiode aperture. The bubble lens, generally including an
anti-reflective coating, can effectively increase the surface area of a
photodiode by a significant amount, approximately 60 percent in certain
applications. The microlenses substantially increase the effective fill
factor and may more than compensate for filters that cut down on the
total light that can reach the photodiode.
[0041] FIG. 4 is a simplified illustration of microlenses in an image
sensor. Within the image sensor, there are multiple pixels 405. Each
pixel contains an active portion 410, with the active portion including
only a portion of the pixel area. In order to compensate in part for the
light energy that would not normally strike any of the active portions
410, each of the pixels 405 has an associated microlens 420. The function
of each microlens 420 is to focus more light energy on the active portion
410 and thus to allow measurement of a larger percentage of the incident
photon flux. For example, light 430 strikes a microlens 420 and is
focused on the active portion 405 of the pixel 410.
Image Sensor Optimization
[0042] Three primary mechanisms that reduce or hamper p
hoton collection by
the photosensitive area of an image sensor are absorption, reflection,
and transmission. These factors are wavelength-dependent in nature, and
define in part the quantum efficiency (QE) of the image sensor. For
example, reflection and transmission of incident light occurs as a
function of wavelength, with a high percentage of shorter wavelengths
below 400 nm being reflected. Shorter wavelengths are absorbed in the
first few microns of the photosensitive region but the longest
wavelengths exceeding 650 nm often pass through the photosensitive
region.
[0043] FIG. 5 illustrates a typical quantum efficiency spectral response
for an image sensor. For FIG. 5, a Bayer CMY filter is evaluated. The
spectral response 500 illustrates the quantum efficiency of the image
sensor for various wavelengths of light incident on the image sensor.
There is an individual response curve for a pixel with a magenta filter
510, a pixel with a cyan filter 520, and a pixel with a yellow filter
530. Each curve has peaks and valleys at different wavelengths of
incident light.
[0044] By examining the QE wavelength dependence curves for each filter
type used in an image sensor, the output signal proportional to the
photon flux can be determined for any wavelength or interval of interest,
including those pixels for a monochromatic image sensor.
[0045] In many cases every pixel in an array is essentially identical to
its neighbor except for the kind of filter (CMY, RGB, other pattern, or
no filter). The effect of a filter is either to increase or to reduce the
photodiode energy output for a given photon flux. The effect on the
signal is wavelength dependent. The QE is the variable in the output
signal that should be factored out of the equation if fair comparisons
are to be made across the imaging array for each and every pixel.
[0046] In a CMOS imager, the pixel signal is obtained for each pixel as
raw data after the analog to digital converter transforms the value for a
set time interval. If QE is expressed as a fraction, the pixel signal is
directly proportional to the product of the QE and Photon Flux: Pixel
Signal=Constant.times.QE.times.Photon Flux
[0047] Under an embodiment of the invention, if raw data can be normalized
according to the appropriate QE, digital values can be created that may
be used in subsequent analysis. The pixel value for a color CMOS image
sensor is obtained before on chip conversion occurs and the value is
normalized by multiplying each signal value for a particular color filter
by the inverse QE.
[0048] For a relatively narrow bandwidth, the QE may be treated as a
constant depending upon the wavelength and filter type used. In one
example, the Bayer CMY pattern over the range 550 to 650 nm for a Kodak
1310 color CMOS image sensor provides a QE of approximately 46 percent,
and then drops linearly from 650 nm to 5 percent at 990 nm, approximately
0.6 percent every 5 nm. In addition, the Magenta and Yellow filters are
very similar over the range from 630 nm to 990 nm.
[0049] For a particular example with a CMY pattern Kodak 1310 color image
sensor at 670 nm, the QE values are as shown in Table 2. A pixel with a
yellow filter would have its digital raw data multiplied by 2.38, a
magenta filter pixel by 2.27, and a cyan filter pixel by 7.69. In this
embodiment, the signal for every pixel is effectively transformed to a
numeric value that is directly proportional to the actual photon flux. It
is noted that Table 2 only contains the QE for the image sensor when
light of a particular wavelength (670 nm) strikes the image sensor. The
QE for any other wavelength of light will vary, as shown in FIG. 5.
TABLE-US-00002
TABLE 2
Quantum Efficiency and Normalization Factors
for Kodak 1310 Image Sensor at 670 nm
Filter Type Quantum Efficiency (%) Normalization Factor
Yellow 43 2.38
Magenta 44 2.27
Cyan 13 7.69
Monochrome 28 3.57
(no filter)
Red 35 2.86
Green 5 20.0
Blue 3 33.3
QE Factor Correction
[0050] Corrections to account for differences in QE may be made based upon
known QE factors for a particular filter type and wavelength. (For
example, see the data contained in Table 1 and Table 2.) However, an
image sensor may also be utilized to automatically correct for
differences in pixel QE. Under an embodiment of the invention, each area
of a sensor array, such as each filter quadrant, is normalized to render
every pixel in the quadrant optimally tuned for photon flux in real time.
[0051] According to an embodiment, no corrections are made if the pixels
and filters are all of the same type, as, for example, the YYYY, MMMM,
and CCCC filter patterns shown in Table 1. A correction is made if there
are two or more filter types in the array (e.g. filter patterns such as
YYYC, RGB Bayer, or modified CMY Bayer). A method of auto correcting for
QE can be used for any combination of two or more filter and photodiode
types and such method corrects to normalize the 4 pixels in a quadrant so
that each pixel produces an equivalent output signal.
[0052] If the pixels are tightly packed in a quadrant relative to the
change in p
hoton flux over a given region of the array, then it can be
assumed that the same number of photons are striking each pixel in the
quadrant at any given moment. With the currently available
high-resolution sensors, and with anticipated future improvements in
resolution, the assumption that neighboring pixels in any given quadrant
experience identical photon flux is appropriate. Using this assumption,
each of the pixels in the quadrant should produce the same output.
According to an embodiment, auto correction causes adjacent neighbors in
each filter quadrant identical. The most sensitive pixel type in a
quadrant is used to factor out QE and wavelength differences, which
simplifies the problem of correcting for wavelength and bandwidth
dependence. Auto correction also reduces or eliminates problems related
to temperature variations for different filter and photodiode types.
[0053] In one example, an array of an image sensor comprises multiple
filter quadrants. Two or more filters are used in each quadrant of 4
pixels. In each quadrant of 4 pixels, the average analog to digital
converted signal output for each filter and photodiode type is
determined. If, for example, there are 3 yellow filtered pixels and 1
cyan filtered pixel in the quadrant, the average for the 3 yellow pixels
is determined first. The output value for the yellow pixels is then
compared to the value for the cyan pixel to determine which output is
numerically greater. Under the embodiment, there is an assumption that
all 4 pixels receive equivalent photon flux. The highest output value is
assigned to all four pixels in the quadrant. The next quadrant in the
array may then be corrected in the same manner, with the process
continuing until the entire array has been assigned corrected output
values to correlate with photon flux.
[0054] The process of auto correction is repeated over time as an image
sensor is used to record images. In an example, the wavelength of light
received by an image sensor may change from a first wavelength to a
second wavelength. A first type of filter may provide the highest QE for
the first wavelength, while a second type of filter provides the highest
QE for the second wavelength. The change in wavelength is included in the
calculation process and therefore auto correction for changing light can
be made in real time.
[0055] Under an embodiment of the invention, it is not necessary to know
in advance the QE for each filter type to auto correct for QE
differences. Auto correcting the sensor based on the photon flux at the
time an image is obtained optimizes the p
hoto image to correlate with
photon flux. This method of correcting the signal removes temperature and
wavelength dependence differences for different filter types and can be
implemented using software. Such method thus automatically corrects for a
broad band signal impinging upon an image sensor.
[0056] Under an embodiment of the invention, the digital signals produced
by an image sensor auto corrected for photon flux may be rendered to a
gray scale image for subsequent visualization in a monochromatic
representation.
Image Sensor Calibration
[0057] Under an embodiment of the invention, the optimization of an image
sensor can first be calibrated. The calibration can be accomplished by
illuminating the color filters and photodiodes with light of known
wavelength and intensity. For a color CMOS imager, the raw data for each
filter is obtained and compared to expected values. From the resulting
comparison, the QE and the multiplier (normalization factor) that is
required to obtain the equivalent output signal for each color filter
used for each and every pixel in the array may be obtained.
[0058] Optimized signals obtained using QE factor conversions can more
accurately relate the signal to the photon flux, and therefore more
precisely characterize events, such as the optical events related to
excitation-emission spectra or absorption phenomena in a chemical
reaction. Both sensitivity and accuracy are enhanced by properly
converting the signal to account for QE factors.
[0059] Using a standard CMOS imager (such as a Kodak 1310 color CMOS image
sensor,) in an embodiment of the invention, raw data produced may be
processed for signal optimization. The signal is converted to a numeric
value that correlates with the photon flux incident upon the imager. This
process can be applied to either a color or monochromatic CMOS imager
sensor to render the signal proportional to photon flux.
[0060] Data processed according to this embodiment may be rendered for
visualization, such as via a gray scale standard (0 to 255 monochromatic)
to producing a black and white image that correlates with the actual
photon flux. The visual image of the data is superficially equivalent to
a gray scale monochromatic image sensor, but for an equivalent luminance
will be more intense than a image produced by a monochromatic
non-transformed CMOS counterpart because color CMOS chips are generally
more sensitive than monochrome chips. A color image sensor generally
provides a better signal and is more sensitive than a monochromatic
imager because the pixel photodiode filters improve upon the QE for the
photodiode. The filtering of light by a color image sensor may be
corrected using the QE factors to convert the signal to a number that is
directly proportional to the photon flux. Further, advantage then is
taken of the color filter's microlens for every pixel effectively
amplifying the aperture for the p
hotodiode.
Illustrations of Processes
[0061] FIG. 6 is an illustration of an embodiment of correction of QE
factors for an image sensor. In the correction process 600, an image of
an event is captured with an image sensor. In this illustration, the
image sensor is a color sensor containing an array of pixels, with each
pixel having a filter. In this case, the filters are arranged in
quadrants, with each quadrant having a particular filter pattern.
However, embodiments of the invention are not limited to any particular
type of image sensor or filter arrangement.
[0062] In FIG. 6, the outputs of each of the pixels within a first
quadrant of the array are obtained 610. The average output of for each
filter type in the quadrant is then determined. In one example, if a
filter quadrant is CMY pattern containing a cyan filter, a magenta
filter, and two yellow filters, the cyan output, the magenta output, and
the average of the two yellow outputs are determined. The outputs are
then compared and which output is highest is determined 620. The highest
output is then assigned to each pixel in the quadrant 625. For example,
if the average yellow output is the highest output for the CMY quadrant,
indicating that, under the particular conditions, the yellow filter has
the highest QE factor, then the average yellow output is assigned to each
of the pixels in the quadrant. If there are more quadrants in the array
630, the output of the next quadrant is obtained 635 and the process
continues. Once the final quadrant has been corrected the process is
completed 640 and the corrected output for the array is available. The
process can then be repeated over time to allow real time QE factor
correction for the image sensor.
[0063] FIG. 7 is an illustration of an embodiment of a process for
calibration for optimization of an image sensor under an embodiment of
the invention. In the calibration process 700, a light of a known
wavelength and intensity is produced 705. With a known intensity, the
photon flux on each pixel is known, which would be the output if the QE
of a pixel were 100 percent. The known light is directed on an image
sensor 710. The output of each pixel of the image sensor is obtained 715.
The output of the image sensor then can be compared with the actual
photon flux 720. Using the comparison, the quantum efficiency of the
pixel can be calculated 725, and then a normalization factor is
calculated based upon the quantum efficiency 730. For a color CMOS image
sensor, the comparison and calculation can be done for each filter color,
resulting in a normalization factor for each filter color. In other
embodiments, the comparison and calculation can be made for each pixel of
an image sensor or for sectors of pixels of an image sensor, resulting in
normalization factors that apply for certain portions of the image
sensor. As the normalization factor varies for each wavelength of light
that strikes the image sensor, the wavelength of the known light is
varied. 735 and the process repeats for each needed wavelength.
[0064] FIG. 8 is a flowchart illustrating an embodiment of the
optimization of an image sensor under an embodiment of the invention. In
the optimization process 800, an image of an event is captured with an
image sensor 805. Under one embodiment of the invention, the image sensor
is a color CMOS image sensor utilizing a filter pattern such as a Bayer
RGB or CMY pattern. The raw data for the image of the event is obtained
from the image sensor 810. The raw data is non-optimized data that, due
to the nature of the image sensor, will generally vary greatly from the
actual photon flux that struck the image sensor. As the normalization
factor depends on the wavelength of light, the wavelength is determined
820. The appropriate normalization factor is determined for each pixel
based upon the wavelength of light. For one embodiment utilizing a color
CMOS image sensor, a normalization factor for each lens color is used in
normalization. Under other embodiments, the normalization factors may
vary based on other factors. The raw data is then converted using the
appropriate normalization factors for the pixels of the image sensor 825,
thus producing an optimized data set that approximates the actual photon
flux for the captured image of the event. Under an embodiment of the
invention, an image may be produced using the converted data 830.
Computer Operation
[0065] FIG. 9 is block diagram of an exemplary computer that can be used
in conjunction with an image sensor in an embodiment of the invention.
While FIG. 9 illustrates a computer that may be connected to the image
sensor, in other embodiments the function of the components shown may be
structured in varying manner or may be performed by different systems. In
some embodiments some signal processing functions may be performed by the
image sensor or by components coupled with the image sensor. In some
embodiments an imaging system may include most or all functions in a
single unit. Not all computers are structured as shown in FIG. 9. In
addition, certain computers may utilize elements shown in FIG. 9 as
auxiliary devices that are external from the computer.
[0066] Under an embodiment of the invention, a computer 900 comprises a
bus 905 or other communication means for communicating information, and a
processing means such as a processor 910 coupled with the bus 905 for
processing information. The computer 900 further comprises a random
access memory (RAM) or other dynamic storage device as a main memory 915
for storing information and instructions to be executed by the processor
910. Main memory 915 also may be used for storing temporary variables or
other intermediate information during execution of instructions by the
processor 910. The computer 900 also may comprise a read only memory
(ROM) 920 and/or other static storage device for storing static
information and instructions for the processor 910.
[0067] A data storage device 925 may also be coupled to the bus 905 of the
computer 900 for storing information and instructions. The data storage
device 925 may include a magnetic disk or optical disc and its
corresponding drive, flash memory or other nonvolatile memory, or other
memory device. The computer 900 may also be coupled via the bus 905 to a
display device 930, such as a liquid crystal display (LCD) or other
display technology, for displaying information to an end user. In some
environments, the display device may be a touch-screen that is also
utilized as at least a part of an input device. In some environments,
display device 930 may be or may include an auditory device, such as a
speaker for providing auditory information. An input device 940 may be
coupled to the bus 905 for communicating information and/or command
selections to the processor 910. In various implementations, input device
940 may be a keyboard, a keypad, a touch-screen and stylus, a
voice-activated system, or other input device, or combinations of such
devices. Another type of user input device that may be included is a
cursor control device 945, such as a mouse, a trackball, or cursor
direction keys for communicating direction information and command
selections to processor 910 and for controlling cursor movement on
display device 930.
[0068] A communication device 950 may also be coupled to the bus 905.
Depending upon the particular implementation, the communication device
950 may include a transceiver, a wireless modem, a network interface
card, or other interface device. The computer 900 may be linked to a
network or to other devices using the communication device 950, which may
include links to the Internet, a local area network, or another
environment.
Fluorescence Detection
[0069] Fluorophores are frequently used to detect the presence or absence
of a coupled reaction on a glass surface. Fluorescence detectors measure
the intensity of the evanescent wave produced when a fluorophore is
excited with a laser or other light source. Typically the laser is used
to excite the fluorophore at its absorption peak and the detector is
tuned to read the emission signal at a longer emission wavelength, which
is characteristic of that particular fluorophore. The shift in wavelength
between absorption and emission is referred to as the Stokes shift. Most
fluorescence detection methods use fluorophores with a large Stokes shift
so that the emission and absorption curves are well separated. With
fluorophores that have a small Stokes shift, it is necessary to excite at
a shorter wavelength than the optimal peak absorption maximum because of
overlap between the emission and absorption curves. The signal emission
intensity is reduced and the sensitivity for detecting target molecules
is decreased. The need for a large Stokes shift also limits the choices
of fluorophores that can be used.
[0070] Because the curves for absorption and emission are frequently very
near to one another, accurate reading of the emission signal may be
complicated. If the distance between the emission and absorption curves
is small, it is difficult to separate the light from an emission spectrum
from that of the absorption signal. Lasers with a narrow band at the
absorption peak are frequently used with filters to cut out all light up
to a certain critical point just below the emission spectral curve. By
selecting an appropriate long pass filter, band pass filter, or
combination of long pass and band pass filters, the emission signal can
be observed in a narrow window, eliminating much of the interference from
the excitatory light source. Interference from the excitatory light
source is also avoided by aligning the detector and apparatus so that the
emission signal can be read at a large incident angle to the excitation
beam. Although filters eliminate most of the signal from the excitatory
light source, they also cut out a significant portion of the evanescent
(emitted) signal. Most band pass filters cut out as much as 40 to 50% of
the emission signal. Long pass filters may cut an additional 10% of the
emission signal.
[0071] Fluorescent detection is used in a number of common test methods.
DNA hybridization is commonly analyzed in this manner, using an
appropriate fluorophore coupled to a set of known oligonucleotides that
hybridize to capture oligonucleotides affixed to a slide. Sandwich
immunoassays also employ this method of analysis, either using a tagged
secondary antibody that binds to a primary antibody, or using a secondary
biotinylated antibody and an avidin-fluorophore as the tag. Many
variations on this method are well known.
[0072] Various other types of light interference may occur in fluorescent
detection. Light scatter occurs by reflection of the excitation beam,
while light dispersion occurs by reflection and bending of the excitation
beam. Scatter and dispersion may represent a large part of the light
striking a detector. In general, when a substance (such as a protein,
nucleic acid or other biomolecule) is affixed to the surface of a glass
slide, it acts as a mirror to reflect and scatter light in a variety of
directions. The amount of surface covered and the mass or density of the
attached material may greatly affect the amount of scattered light. The
chemical composition of proteins, oligonucleotides or polymers attached
to the glass surface may also affect the scattered light, as seen in FIG.
10 described below. In addition, the material attached to the glass
surface material may itself fluoresce. The glass used may also have
surface irregularities that can affect the signals received by the
detector. The energy absorbed across the glass may vary from one spot to
another, making signal analysis very problematic. Such problems require
the use of novel methods of fluorescent detection and/or data analysis.
Evanescent Emission and Scattered Light
[0073] Evanescent signals are generally very weak and light scatter is
intense, making accurate quantitative detection of analytes problematic.
Light scatter is frequently assumed to be eliminated by filters. However,
scattered light is almost always present and can be a significant part of
the total signal reaching a detector. Filters used to remove light
scatter also remove much of the target emission signal, thereby
decreasing detector sensitivity. Filters may also transmit a small amount
of scattered light. If the scattered light is relatively large compared
to the evanescent emitted light, the detected signal will be a
combination from several sources, only one of which represents target
molecule binding.
[0074] The components of light scattering are illustrated in FIG. 10. Two
spots (e.g., different antibodies) are deposited on a glass surface.
During a method to detect a target, one of the spots remains totally
non-reactive. The other spot reacts with a target, such as a bacterial
pathogen and/or other reagents. Target binding to the reactive antibody
increases the mass attached to the spot and results in a larger surface
area and a change in molecular structure at the spot. A mass effect has
occurred. The light scatter from the reactive spot will be different from
the light scatter before target molecule binding. A sensitive
photon-counting detector could detect this difference in scatter. A
variety of instruments, such as certain flow cytometers and turbidity
meters take advantage of scatter to quantify the amount of material in a
solution. Those instruments measure the angle of scatter for a beam of
light impinging on a target material. The change in signal is the
difference between the reference signal (S.sub.ref) and signal 2
(S.sub.2). In FIG. 1, the S.sub.2 signal is shown as having two
components, a modified scatter signal plus a mass effect signal of the
coupled pathogen. The signal from the reactive spot changes while the
signal from the non-reactive spot signal is constant.
.DELTA.S(non-reactive spot)=0 .DELTA.S(reactive spot)=Modified
(S.sub.p)+M.sub.1-S.sub.ref
[0075] If the mass effect is sufficient to cause a large scatter effect,
the fluorophore used for target detection could be eliminated. For
example in DNA hybridization experiments, the mass attached to a surface
using standard oligonucleotide probes (about 24 nucleotides in length)
may be increased by a factor of 2 or more upon binding of target nucleic
acids. Such a large change in mass may be detectable by monitoring light
scatter instead of evanescent waves. In the case of a sandwich
immunoassay with a biotinylated secondary antibody, another mass effect
occurs when the biotinylated antibody binds to the pathogen. A third mass
effect occurs when avidin-conjugated fluorophore binds to biotin.
[0076] The most sensitive signal may be obtained by subtracting the
initial reference signal from the final captured signal, obtained after
the fluorophore has been attached and excited. That signal represents the
modified accumulated mass effects and the emission signal for the
reactive spot. .DELTA.S(reactive spot)=Modified accumulated mass
effects+Emission-S.sub.ref
[0077] This method of analysis can be used with a CMOS imager or any known
digital imaging method that allows storage of pixel images for subsequent
processing. The signal obtained from each spot will contain more useful
information and will show a more intense change upon target binding if a
proper subtraction method is used. The scatter effect may be turned to an
advantage in detecting target binding. Moreover, it is unnecessary to
have fluorophore emission and absorption curves well separated, since
spurious signals are subtracted out of the image. The full intensity of
an emission signal may be measured without reducing emitted light by with
filters.
[0078] A subtraction method also eliminates artifacts and defects that may
derive, for example, from inhomogeneity (chips, flaws) in the glass slide
surface. The non-reactive spots completely blank out and do not appear as
a signal.
[0079] Because CMOS imagers and pixel capturing devices in general exhibit
a random, very low level noise there are limits as to what kinds of
signals can be detected. At any given point in time, the baseline
reference may exhibit a random number of spikes. A weak signal falling
between two spikes would not normally be detected against this background
noise.
[0080] The signal-to-noise problem may be improved if numerous images are
captured and added one upon the other. Because the random spikes inherent
in a detector such as a CMOS imager are constantly shifting about,
accumulating the frame images will tend to average out the random noise.
However a weak signal from the emission of an excited fluorophore does
not change its pixel location. Therefore, an accumulated signal caused by
target binding will increase with time. This method is similar to taking
a photoimage of a distant star or galaxy, by tracking the object as it
moves across the sky. The object of interest appears brighter against the
background with time because the signal has accumulated at the same spot
on the detector, while the background light averages out.
Method of Analysis
[0081] In an exemplary embodiment of the invention, a glass slide or other
matrix array is secured on a stage. A fluidic cube is attached to the
surface of the glass and used to deliver samples, second antibodies and
other reagents. Before target molecule binding, an excitatory laser is
focused on one end of the glass slide at an inclined angle about 30 to 40
degrees. The glass slide acts as a waveguide to conduct the excitatory
light to spots, containing bound primary antibody, on the glass surface.
A CMOS imager is used to capture the light signals. The CMOS chip is
located beneath the glass slide and is aligned so that spots on the slide
are directly above the imager and are sharply focused on the imager
surface with optical lenses and apertures. Exemplary microarrays that are
of potential use in analysis are disclosed in U.S. patent application
Ser. No. 10/035,367, entitled "Method for Luminescent Identification and
Calibration" and filed Dec. 28, 2001, the entire contents of which are
incorporated herein by reference. A non-limiting example of a fluidics
cube type biosensor is disclosed in U.S. patent application Ser. No.
09/974,089, entitled "Portable Biosensor Apparatus with Controlled Flow"
and filed Oct. 10, 2001, the entire contents of which are incorporated
herein by reference.
[0082] A number of pictures are taken. Each picture represents a single
frame. For example 10 frames are taken using a 50 millisecond exposure.
The exposure is selected so that the amount of light captured in a single
frame is within the sensitive range for the camera. The 10 digital frames
are then added to provide a reference set that is used for subtraction of
unwanted (background) signals. The accumulated image is referred to as
the calibration slide.
[0083] The fluidic cube is used to expose primary antibody to a sample,
bind any target molecules to the first antibody, and bind second antibody
to the target. The process ends with binding of avidin-fluorophore to the
biotinylated second antibody and a final set of washes. The same number
of frames used to obtain the reference slide image are taken of the
sample slide, using the same exposures. The cumulative set of frames is
referred to as the sample slide image. The luminescent signal for each
spot is determined by subtracting the reference slide image from the
sample slide image. This process essentially eliminates background noise
and matrix array artifacts, resulting in very sensitive detection of
target molecules.
[0084] In alternative embodiments of the invention, pictures may be
obtained in either still frame or video mode. A typical video frame runs
at 2000 ms and captures 100 frames each for the reference and sample
analysis. This method removes artifacts and non-reactive spots, leaving
only those signals that represent target molecule binding to the array.
General Matters
[0085] In the description above, for the purposes of explanation, numerous
specific details are set forth in order to provide a thorough
understanding of the present invention. It will be apparent, however, to
one skilled in the art that the present invention may be practiced
without some of these specific details. In other instances, well-known
structures and devices are shown in block diagram form.
[0086] The present invention includes various steps. The steps of the
present invention may be performed by hardware components or may be
embodied in machine-executable instructions, which may be used to cause a
general-purpose or special-purpose processor or logic circuits programmed
with the instructions to perform the steps. Alternatively, the steps may
be performed by a combination of hardware and software.
[0087] The present invention may be provided as a computer program
product, which may include a machine-readable medium having stored
thereon instructions, which may be used to program a computer (or other
electronic devices) to perform a process according to the present
invention. The machine-readable medium may include, but is not limited
to, floppy diskettes, optical disks, CD-ROMs, and magneto-optical disks,
ROMs, RAMs, EPROMs, EEPROMs, magnet or optical cards, flash memory, or
other type of media/machine-readable medium suitable for storing
electronic instructions. Moreover, the present invention may also be
downloaded as a computer program product, wherein the program may be
transferred from a remote computer to a requesting computer by way of
data signals embodied in a carrier wave or other propagation medium via a
communication link (e.g., a modem or network connection).
[0088] Many of the methods are described in their most basic form, but
steps can be added to or deleted from any of the methods and information
can be added or subtracted from any of the described messages without
departing from the basic scope of the present invention. It will be
apparent to those skilled in the art that many further modifications and
adaptations can be made. The particular embodiments are not provided to
limit the invention but to illustrate it. The scope of the present
invention is not to be determined by the specific examples provided above
but only by the claims below.
[0089] It should also be appreciated that reference throughout this
specification to "one embodiment" or "an embodiment" means that a
particular feature may be included in the practice of the invention.
Similarly, it should be appreciated that in the foregoing description of
exemplary embodiments of the invention, various features of the invention
are sometimes grouped together in a single embodiment, figure, or
description thereof for the purpose of streamlining the disclosure and
aiding in the understanding of one or more of the various inventive
aspects. This method of disclosure, however, is not to be interpreted as
reflecting an intention that the claimed invention requires more features
than are expressly recited in each claim. Rather, as the following claims
reflect, inventive aspects lie in less than all features of a single
foregoing disclosed embodiment. Thus, the claims are hereby expressly
incorporated into this description, with each claim standing on its own
as a separate embodiment of this invention.
* * * * *