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United States Patent D775,984
Teranishi ,   et al. January 10, 2017

Probe pin

Claims


CLAIM The ornamental design for a probe pin, as shown and described.
Inventors: Teranishi; Hirotada (Osaka, JP), Sakai; Takahiro (Moriyama, JP)
Applicant:
Name City State Country Type

OMRON Corporation

Kyoto-shi, Kyoto

N/A

JP
Assignee: OMRON Corporation (Kyoto, JP)
Appl. No.: D/536,599
Filed: August 18, 2015

Foreign Application Priority Data

Mar 4, 2015 [JP] 2015-004749
Mar 4, 2015 [JP] 2015-004750

Current U.S. Class: D10/80
Current International Class: 1004
Field of Search: ;D10/78,80 ;D13/133,154

References Cited [Referenced By]

U.S. Patent Documents
3555497 January 1971 Watanabe
D229184 November 1973 Brown et al.
D507197 July 2005 Sun
D662895 July 2012 Kimura
D665744 August 2012 Yamauchi
D665745 August 2012 Yamauchi
8366496 February 2013 Hsu
8460010 June 2013 Kimura
8669774 March 2014 Kato
8808038 August 2014 Hwang
9130290 September 2015 Sakai
9207260 December 2015 Ogasawara
D749968 February 2016 Huang
D750987 March 2016 Huang
9322846 April 2016 Sakai
Primary Examiner: Davis; Antoine D
Attorney, Agent or Firm: Sterne, Kessler, Goldstein & Fox P.L.L.C.

Description



FIG. 1 is a perspective view of a probe pin;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a top plan view thereof;

FIG. 7 is a bottom plan view thereof;

FIG. 8 is a perspective view of another probe pin;

FIG. 9 is a front elevational view thereof;

FIG. 10 is a rear elevational view thereof;

FIG. 11 is a left side view thereof;

FIG. 12 is a right side view thereof;

FIG. 13 is a top plan view thereof; and,

FIG. 14 is a bottom plan view thereof.

The dashed broken lines in the figures show portions of the probe pin that form no part of the claimed design.

The dot-dash broken lines in the figures show boundaries of the claimed design.

The shade lines in the figures show contour and not surface ornamentation.

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