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United States Patent D777,631
Webb ,   et al. January 31, 2017

Instrument cluster

Claims


CLAIM The ornamental design for an instrument cluster, as shown and described.
Inventors: Webb; Gareth (Farmington, MI), Arceo; Marc (Livonia, MI), Horvath; Cary (Dearborn, MI)
Applicant:
Name City State Country Type

DENSO International America, Inc.
DENSO CORPORATION

Southfield
Kariya, Aichi-pref.

MI
N/A

US
JP
Assignee: DENSO International America, Inc. (Sout, MI)
DENSO CORPORATION (Kariya, JP)
Appl. No.: D/537,206
Filed: August 24, 2015

Current U.S. Class: D12/192
Current International Class: 1216
Field of Search: ;D12/192,195,415,114 ;D10/102 ;D15/17,28

References Cited [Referenced By]

U.S. Patent Documents
D467845 December 2002 Pfeiffer
D516482 March 2006 Pfeiffer
D557646 December 2007 Portelance
D581302 November 2008 Wyszogrod
D598832 August 2009 Sauter
D611861 March 2010 Wiedeman
D631808 February 2011 Yamazaki
D635073 March 2011 Nield
D705146 May 2014 Takagi
D705147 May 2014 Kinoshita
D727814 April 2015 Paulke
9358888 June 2016 Schwantner
2004/0056502 March 2004 Jennings
Primary Examiner: Hyder; Phillip S

Description



FIG. 1 is an perspective view illustrating the instrument cluster;

FIG. 2 is front view of the instrument cluster;

FIG. 3 is a rear view of the instrument cluster;

FIG. 4 is a right view of the instrument cluster;

FIG. 5 is a left view of the instrument cluster;

FIG. 6 is a top view of the instrument cluster; and,

FIG. 7 is a bottom view of the instrument cluster.

The rear edge of the instrument cluster is depicted by a broken line since it forms no part of the claimed design. The portions of the gauges depicted by broken lines form no part of the claimed design.

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